AccoTest STS 8000 Series Feature

北 京 华 峰 测 控 技 术 有 限 公 司
NEW VALUED MULTI-SITE
ANALOG/MIXED SIGNAL TEST SYSTEM
AccoTest STS 8000 Series Feature:
◆
Proven Design to provide more accuracy source
with higher reliability.
◆
Provide different DC source with multi-channels
Low power V/I until single channel High power Floating V/I to cover all DC test required.
◆
Each DC source is four quadrant Kelvin voltage/current
source/sink to the DUT
◆
Static and Dynamic Digital Channels to cover
mixed signal device test required.
◆
FLEX PIN links all DC source/measure and AC
source/measure channels together with multi-site
hardware scan function on STS8200 FLEX
◆
FLEX CONFIG is a flexible interface with Standard
Test Box and MOSFET Test Box, even can be upgraded
to interface Test head on STS8200 FLEX.
◆
Provide type of Test Box to easy interface with han-
dler and prober on STS8200
◆
Calibration data traceable on board, without recali-
bration when replacing board on STS8200.
◆
High compatible with previous AST1K/2K.
北京：北京丰台区科学城海鹰路1号海鹰产业大楼7层
电话: 86-10-6372 5652
传真：86-10-6372 5505
上海：上海浦东碧波路117号华虹科技园A座201&202室
电话: 86-21-5027 5951
传真：86-21-5027 5950
NEW VALUED MULTI-SITE
ANALOG/MIXED SIGNAL TEST SYSTEM
北 京 华 峰 测 控 技 术 有 限 公 司
ACCOTEST STS8107
Target Device
- Linear, Op-amplifiers
- LDO, Regulator up to 10A, Battery Protected
- DC/DC, AC/DC, PWM
DC Source
AC Source
Time Measure Unit
Digital Channels
Multi-Site #
- Audio Device, Motor Driver
- OVI40, DVI400, PVI10 with 12 bits Force/16 bits measures resolution
- Up to -90dB THD
- +/-10V peak to peak
- Up to 4 channels Time Measure Unit
- Up to 125pS resolutions
- Up to 5MHz Test Rate (End of output cable) with 8 channels per board
- 4 Sites
ACCOTEST STS8102
Target Device
DC Source
- MOSFET, Multi-Die MOSFET
- MOSFET Wafer Test (True Multi-site)
- Up to 40A Floating Test for Final
- Up to 10A Test for multi-site wafer test
Multi-Site #
Test Box
- Up to 1000V both final and wafer test
- 4 Sites
- MTBX(40A, 1000V), MTBW(10A,1000V)
ACCOTEST STS8200 FLEX
Target Device
- Linear, High speed, High accuracy Amplifier
- LDO, High Power Regulator, Battery Protected
- DC/DC, AC/DC, PWM
- Audio Device, Motor Driver
DC Source
- Mixed-signal devices , Analog Switch
- 12/16 bits Force/measures at <1A source
- Up to 10A or 40A Floating by channel
- Up to 1000V voltage Test
AC Source
Time Measure Unit
Digital Channels
Multi-Site #
Test Box
- FLEX PIN Function
- Up to -90dB THD
- +/-10V peak to peak
- Up to 4 channels Time Measure Unit
- Up to 65pS resolutions
- Up to 5MHz Test Rate (End of Test Box) with 8 channels per board
- 128 Channels Static Digital Function
- 4/8/16
- Standard Test Box for IC
- MTBX(40A, 1000V), MTBW(10A, 1000V), MTBXL(40V/10A)
北京：北京丰台区科学城海鹰路1号海鹰产业大楼7层
电话: 86-10-6372 5652
传真：86-10-6372 5505
上海：上海浦东碧波路117号华虹科技园A座201&202室
电话: 86-21-5027 5951
传真：86-21-5027 5950