Semiconductor - Ect

Transcription

Semiconductor - Ect

Semiconductor Probe
Semiconductor Probe
ECT has a long history on supplying double ended fine pitch probes.
Thanks to our large market exposure on these products at most major semiconductor producers, we are able
to gain a lot of expertise from our worldwide customer base. This expertise is reflected in each new probe
series to stay a head of the very technical demanding and challenging Semiconductor market.
Please feel free to contact us for further requirements or more information, as we offer some special requirements like ultra-high temperature applications or none magnetic probes for the MEMS market.
The ZIP® Advantage
ECT ZIP® series probes feature a number of innovative designs that provide for superior contact capable of
fitting your application needs. Utilizing ECT’s patented flat technology, ZIP semiconductor spring probes
present a new level of accuracy, scalability, and performance. While conventional round technology
restricts longer travel and can have its reliability undermined by its small contact area, ZIP possesses a
large internal contact area, resulting in low C-Res, superior bandwidth, and excellent high current behavior.
The performance, economy, and application versatility provided by ZIP probes are further enhanced by
the use of an external spring. Conventional spring probes rely on contact between the barrel and plunger,
which allows for conductivity interference through contamination build up in dirty test environments. By
having an external spring and no barrel, ZIP greatly reduces the threat of contamination, thereby reducing
cost-of-test and increasing efficiency. ECT has produced flat compliant contacts since 1995. The ZIP series
is the culmination of years of experience and development, and reflects the industry’s finest semiconductor
contacts. With its broad scope of application solutions and special options, the ZIP family of products can
satisfy all of your semiconductor test needs. If your spring probes are leaving your tough, high volume
challenges unmet, then you don’t know ZIP.
Bantam® Series
The Bantam® probe is a high performance spring loaded compliant contact for applications requiring
robust, short contact to support fine pitch and high bandwidth production needs. Unlike conventional spring
probes, the Bantam has only one internal sliding / wiping contact surface, which provides consistent low
resistance levels while maintaining a high level of Z-Axis compliance.
CSP and SPLJ Series
These probes are traditional but state of the art double ended probes ranging from 0.4mm to 1.27mm pitch.
On the CSP Series probes we are able to offer a selection of different plating options to optimize contact
challenges and maximize probe life. Various length options also provide drop-in replacement capability for
most competitor probes.
Mini-Mite™ Series
The SCP or also called Mini-Mite™ probe features a unique single ended design, providing very low,
consistent DC resistance. The uniform design allows all three product pitches to be used on the same test
height. The single sliding contact cuts the failure mode in half and insures very repeatable results.
ECT-CPG.com
shop.ECT-CPG.com
107
Semiconductor Probe
Ultra High Bandwith
Z0
0.40 mm, 0.50 mm
Z0-040
Z0-050
.018 (0.46)
.018 (0.46)
.010 (0.27)
.008 (0.19)
Ultra HIGH Bandwidth
The Z0 Ultra High Bandwidth Series takes advantage of the ZIP® scalable architecture to arrive at
an ultra-compact design with 0.50 nH and 0.60 nH
inductance tailor made for high frequency testing.
.078 (1.98)
.076 (1.94)
.016 (0.41)
.013 (0.33)
Thickness .0027 (0.07)
Thickness .0034 (0.09)
.010 (0.25)
.011 (0.28)
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Operating Temperature:
.016 (0.40)
.018 (0.46)
.020 (0.50)
.059 (1.51)
200,000 cycles
-55°C to +155°C
Spring Force in oz. (grams)
Order Code
Test Height
-1
108
Standard
0.96 (27)
High
2.5 amps
<90 mOhms
0.50 nH
0.030 pF
>30.0 GHz
Tip Style - DUT
Tip Style
050
RHJ
Z0
040
BHJ
ECT-CPG.com
shop.ECT-CPG.com
Spring Force
Size
Z0 –
1
L
Order Code
0.66 (19)
Materials and Finishes
Plunger DUT: HyperCore™
Plunger HIB:
BeCu with proprietary plating
Spring:
Stainless Steel, Gold plated
Series
* Life specifications are based on lab results but are dependent on cleaning frequency and
the specific customer application, including DUT materials, handler kit, maintenance, etc.
** Contact resistance will increase over time due to solder build-up and wear
Electrical (Static Conditions)
Current Rating DC:
Average DC Probe Resistance**:
Self Inductance (Ls):
Capacitance (Cc):
Bandwidth @ -1dB:
B
.020 (0.50)
.019 (0.48)
.022 (0.56)
.059 (1.51)
500,000 cycles
-55°C to +155°C
Spring Force in oz. (grams)
Standard
High
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Test Height
0.65 (18)
-1
1.11 (31)
Current Rating DC:
Average DC Probe Resistance** :
Capacitance (Cc):
Bandwidth @ -1dB:
2.88 amps
<90 mOhms
0.60 nH
0.03 pF
>40.0 GHz
Plunger HIB:
Spring:
Tip Style - DUT
D
R
Y
B
L
Tip Style - HIB
Tip Style - HIB
J
J
D
R
Y
–
Dimensions in inches (millimeters). Specifications subject to change without notice.
Consult factory for other temperature requirements, and applications below -40°C.
Stocking Disclaimer: Stocking levels for part numbers listed in this catalog are subject to change.
Availability is based on current levels of usage and demand.
Semiconductor Probe
High Bandwith
Z-040
0.40 mm
Z-040
.007
[ 0.18 ]
.003
[ 0.07 ]
.026
[ 0.67 ]
.130
[ 3.31]
Thickness
.0028 [ 0.07 ]
.013
[ 0.32]
HIGH Bandwidth
The ZIP® Z High Bandwidth Series yields the highest and most stable bandwidth for its package size.
The high performance provided by these contacts
makes the Z series a perfect choice for the most
demanding test applications. High Bandwidth
probes are available in .4mm and .5mm pitches.
The Z series is offered in two DUT-side plunger
material choices: HyperCore for high volume production applications and BeCu for burn-in or low
volume applications.
.014
[ 0.35 ]
Current Rating DC:
Capacitance (Cc):
Bandwidth @ -1dB:
.016 (0.40)
.025 (0.64)
.028 (0.71)
.105 (2.67)
500,000 cycles
50,000 cycles
-55°C to +155°C
1.20 (34)
Tip Style - DUT HyperCore
2.0 amps
<85 mOhms
1.07 nH
0.21 pF
30.0 GHz
Plunger DUT: HyperCore™, BeCu Gold plated
Plunger HIB:
Spring:
B
J
L
D
R
Y
Tip Style - DUT BeCu
B
J
L
Tip Style - HIB
–
040
Y
H
ECT-CPG.com
shop.ECT-CPG.com
HIB Tip Style
Material
Z
DUT Tip Style
Size
Series
J
–
J
–
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
HyperCore DUT plunger:
BeCu DUT plunger:
Spring Force in oz. (grams):
109
Semiconductor Probe
High Bandwith
Z-050
0.50 mm
Z-050
HIGH Bandwidth
The ZIP® Z High Bandwidth Series yields the highest and most stable bandwidth for its package size.
The high performance provided by these contacts
makes the Z series a perfect choice for the most
demanding test applications. High Bandwidth
probes are available in .4mm and .5mm pitches.
The Z series is offered in two DUT-side plunger
material choices: HyperCore for high volume production applications and BeCu for burn-in or low
volume applications.
.010
[0.27 ]
.026
[0.66 ]
.135
[3.44]
Thickness
.0034 [0.09]
.014
[0.36 ]
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
HyperCore DUT plunger:
BeCu DUT plunger:
Tip Style - DUT HyperCore
B
J
L
D
R
Y
Tip Style - DUT BeCu
110
J
L
Current Rating DC:
Capacitance (Cc):
Bandwidth @ -1dB:
.016
[0.41]
.020 (0.50)
.025 (0.64)
.030 (0.76)
.110 (2.79)
500,000 cycles
50,000 cycles
-55°C to +155°C
1.40 (40)
2.8 amps
<65 mOhms
1.01 nH
0.20 pF
25.0 GHz
Plunger DUT: HyperCore™, BeCu Gold plated
Plunger HIB:
Spring:
Tip Style - HIB
–
050
R
ECT-CPG.com
shop.ECT-CPG.com
HIB Tip Style
Material
Z
DUT Tip Style
Size
J
Series
B
.003
[0.09]
–
J
–
Semiconductor Probe
Kelvin
Z - Kelvin
Typ??
?? mil 0.40
(?? mm)
mm
Z-040KHJ
.0262 (0.665)
Z-KELVIN
ECT’s ZIP® Kelvin .4mm is ideal for voltage sensitive tests on array or peripheral devices requiring
milliohm resistance measurements as well as
high-power test applications.
.0028 (0.071)
.0055 (0.140)
.130 (3.30)
.013 (0.33)
.0074 (0.19)
Peripheral
.014 (0.35)
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Current Rating DC:
Capacitance (Cc):
Bandwidth @ -1dB:
.016 (0.40)
.025 (0.64)
.028 (0.71)
.105 (2.67)
500,000 cycles
-55°C to +155°C
1.20 (34)
2.2 amps
<70 mOhms
0.90 nH
0.03 pF
9.1 GHz
Plunger HIB:
Spring:
Tip Style - DUT
Array
K
Tip Style - HIB
J
ECT-CPG.com
shop.ECT-CPG.com
111
Semiconductor Probe
Single Ended
BTM
0.50 mm, 0.75 mm, 1.00 mm
BTM-050
.020 (0.508)
0.009 (0.23)
DUT End
BTM-075
DUT End
BTM-100
DUT End
.032 (0.81)
.040 (1.02)
0.015 (0.38)
.115 (2.93)
0.020 (0.508)
.118 (3.00)
.073 (1.85)
.066 (1.68)
.163 (4.14)
.099 (2.51)
0.015 (0.38)
0.022 (0.56)
0.009 (0.23)
.020 (0.508)
0.0125 (0.318)
HIB End
.020 (0.51)
HIB End
0.030 (0.762)
0.015 (0.381)
.025 (0.64)
HIB End
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Current Rating:
Capacitance (Cc):
Bandwidth @ -1dB:
.019 (0.50)
.015 (0.38)
.020 (0.51)
.098 (2.49)
500,000 cycles
-55°C to +155°C
1.10 (31)
2.4 amps
<50 mOhms
0.95 nH
0.28 pF
12.87 GHz
Plunger:BeCu,
Gold plated over hard Nickel or
Primeguard 1 for NiPd solder or
Primeguard 2 for Lead free solder
Barrel:
BeCu, Gold plated over hard Nickel
Spring:
Steel alloy,
Gold plated over hard Nickel
Tip Style - DUT
B
112
L
U
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Current Rating:
Capacitance (Cc):
Bandwidth @ -1dB:
.030 (0.75)
.015 (0.38)
.020 (0.51)
.103 (2.62)
500,000 cycles
-55°C to +155°C
1.00 (28)
2.9 amps
<50 mOhms
0.77 nH
0.25 pF
15.65 GHz
Plunger:BeCu,
Barrel:
Brass, Gold plated over hard Nickel
Spring:
Music Wire,
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Current Rating:
Capacitance (Cc):
Bandwidth @ -1dB:
Tip Style - DUT
B
B
J
Tip Style - HIB
Tip Style - HIB
Tip Style - HIB
B
B
B
J
ECT-CPG.com
shop.ECT-CPG.com
J
3.2 amps
<50 mOhms
1.30 nH
0.34 pF
9.73 GHz
Plunger:BeCu,
Barrel:
Brass, Gold plated over hard Nickel
Spring:
Steel alloy,
Tip Style - DUT
L
.040 (1.00)
.028 (0.71)
.030 (0.76)
.136 (3.45)
500,000 cycles
-55°C to +155°C
1.40 (39)
J
L
L
Semiconductor Probe
®
Double
ZIP
- Flat
Ended
Technologie Probe
Typ??
CSP4
?? mil 0.40
(?? mm)
mm
CSP4-17
DUT End
.035 (0.89)
Socket Design Considerations
•CSP series is captured between the socket
body and retainer plate, with the barrel fixed
in place.
•Mini-Mite series is captured between the
socket body and retainer plate, with the barrel
sliding freely counter bore.
•Counter bore should not be too deep, and
enable a minimum amount of preload against
interface board.
•Body height and device cavity should be
designed to prevent probe from being
compressed shorter than test height.
0.005 (0.13)
0.0102 (0.26)
.237 (6.02)
0.005 (0.13)
.025 (0.64)
HIB End
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Socket Body
Retainer
CSP Socket
Mini-Mite Socket
.016 (0.40)
.020 (0.51)
.025 (0.64)
.217 (5.51)
250.000 cycles
-55°C to +105°C
0.85 (24)
Current Rating:
Capacitance (Cc):
Bandwidth @ -1dB:
2.0 amps
<100 mOhms
1.71 nH
0.58 pF
6.8 GHz
Plunger DUT: Steel or BeCu,
Plunger HIB:
Steel or BeCu,
Barrel:
Phosphorous Bronze,
Spring:
Music Wire, Gold plated
Tip Style - DUT / HIB
B
J
L
ECT-CPG.com
shop.ECT-CPG.com
.177 (4.50)
113
Semiconductor Probe
ZIP® - Flat Technologie
Double Ended
Probe
Typ??
CSP5
?? milmm
0.50
(?? mm)
CSP5-18
DUT End
0.009 (0.23)
.029 (0.74)
CSP5-20
0.0138 (0.35)
.180 (4.57)
DUT End
0.009 (0.23)
.029 (0.74)
CSP5-22
.029 (0.74)
0.0138 (0.35)
0.0138 (0.35)
.220 (5.59)
.200 (5.08)
.234 (5.94)
.254 (6.45)
.274 (6.96)
0.0065 (0.17)
.025 (0.64)
HIB End
.025 (0.64)
0.0065 (0.17)
HIB End
.025 (0.64)
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Current Rating:
Capacitance (Cc):
Bandwidth @ -1dB:
114
.019 (0.50)
.020 (0.51)
.025 (0.64)
.214 (5.44)
500,000 cycles
-55°C to +155°C
.7 (19.8)
2 amps
<100 mOhms
1.5 nH
0.63 pF
8.13 GHz
Plunger DUT: BeCu or Steel,
Plunger HIB:
BeCu or Steel,
Hard Gold over Nickel
Barrel:
Phosphor Bronze,
Spring:
Steel alloy, Gold plated
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Current Rating:
Capacitance (Cc):
Bandwidth @ -1dB:
.019 (0.50)
.020 (0.51)
.025 (0.64)
.234 (5.94)
500,000 cycles
-55°C to +155°C
.7 (19.8)
2 amps
<100 mOhms
1.65 nH
0.69 pF
7.4 GHz
Plunger HIB:
BeCu or Steel,
Barrel:
Phosphor Bronze,
Spring:
0.0065 (0.17)
HIB End
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Current Rating:
Capacitance (Cc):
Bandwidth @ -1dB:
B
B
B
ECT-CPG.com
shop.ECT-CPG.com
L
J
L
.019 (0.50)
.020 (0.51)
.035 (0.89)
.254 (6.45)
500,000 cycles
-55°C to +155°C
1.0 (28.4)
2 amps
<100 mOhms
1.79 nH
0.75 pF
6.8 GHz
Plunger HIB:
BeCu or Steel,
Barrel:
Phosphor Bronze,
Spring:
J
DUT End
0.009 (0.23)
J
L
Semiconductor Probe
®
Double
ZIP
- Flat
Ended
Technologie Probe
Typ??
CSP8
?? mil 0.80
(?? mm)
mm
DUT End
CSP8-15
.060 (1.52)
DUT End
CSP8-20
0.014 (0.36)
DUT End
CSP8-25
0.014 (0.36)
.060 (1.52)
0.023 (0.58)
0.023 (0.58)
0.014 (0.36)
.060 (1.52)
0.023 (0.58)
.150 (3.81)
.242 (6.15)
.292 (7.42)
.200 (5.08)
.342 (8.69)
.250 (6.35)
0.012 (0.30)
HIB End
.032 (0.81)
0.012 (0.30)
HIB End
0.012 (0.30)
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Current Rating:
Capacitance (Cc):
Bandwidth @ -1dB:
.032 (0.80)
.030 (0.76)
.040 (1.02)
.212 (5.38)
500,000 cycles
-55°C to +155°C
1.1 (31.2)
3 amps
<100 mOhms
1.23 nH
0.65 pF
9.23 GHz
Plunger HIB:
BeCu or Steel,
Barrel:
Phosphor Bronze,
Spring:
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Current Rating:
Capacitance (Cc):
Bandwidth @ -1dB:
.032 (0.80)
.030 (0.76)
.040 (1.02)
.262 (6.65)
500,000 cycles
-55°C to +155°C
1.1 (31.2)
3 amps
<100 mOhms
1.52 nH
0.81 pF
7.45 GHz
Plunger HIB:
BeCu or Steel,
Barrel:
Phosphor Bronze,
Spring:
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
B
B
B
3 amps
<100 mOhms
1.81 nH
0.96 pF
5.25 GHz
Plunger HIB:
BeCu or Steel,
Barrel:
Phosphor Bronze,
Spring:
L
HIB End
.032 (0.80)
.030 (0.76)
.040 (1.02)
.312 (7.92)
500,000 cycles
-55°C to +155°C
1.1 (31.2)
Current Rating:
Capacitance (Cc):
Bandwidth @ -1dB:
L
.032 (0.81)
L
ECT-CPG.com
shop.ECT-CPG.com
.032 (0.81)
115
Semiconductor Probe
ZIP® - Flat Technologie
Double Ended
Probe
Typ??
CSP1
?? mil
1.0
mm(?? mm)
.035 (0.89)
CSP1-28
DUT End
0.021 (0.53)
0.030 (0.76)
.350 (8.89)
0.021 (0.53)
.280 (7.11)
.035 (0.89)
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Current Rating:
Capacitance (Cc):
Bandwidth @ -1dB:
116
HIB End
.039 (1.0)
.030 (0.76)
.040 (1.02)
.312 (7.92)
500,000 cycles
-55°C to +155°C
2.0 (57)
3 amps
<100 mOhms
1.81 nH
0.96 pF
5.25 GHz
Plunger HIB:
BeCu or Steel,
Barrel:
Phosphor Bronze,
Spring:
B
L
ECT-CPG.com
shop.ECT-CPG.com
Semiconductor Probe
®
Single
ZIP
- Flat
Ended
Technologie Probe
Typ??
SCP
0.80 mm, 1.00??mm,
mil 1.27
(?? mm)
mm
DUT End
0.0205 (0.52)
SCP-100
DUT End
0.0275 (0.70)
.118 (3.00)
.230 (5.84)
.230 (5.84)
5 amps
<50 mOhms
1.27 nH
0.12 pF
6.0 GHz
Plunger:
BeCu, Hard Gold over Nickel
Barrel:
Spring:
Tip Style - DUT
HIB End
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Current Rating:
Capacitance (Cc):
Bandwidth @ -1dB:
.039 (1.00)
.030 (0.76)
.035 (0.89)
.200 (5.08)
1,000,000 cycles
-55°C to +155°C
1.50 (42.5)
7 amps
<50 mOhms
1.40 nH
0.66 pF
6.78 GHz
Plunger:
Barrel:
Spring:
Tip Style - DUT
Z
0.015 (0.38)
0.015 (0.38)
HIB End
Current Rating:
Capacitance (Cc):
Bandwidth @ -1dB:
0.0425 (1.08)
0.0315 (0.80)
.032 (0.80)
.030 (0.76)
.035 (0.89)
.200 (5.08)
1,000,000 cycles
-55°C to +155°C
1.50 (42.5)
B
L
HIB End
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
Tip Style - DUT
Z
Z
Tip Style - HIB
B
B
B
9 amps
<50 mOhms
1.40 nH
0.79 pF
7.63 GHz
Plunger:
Barrel:
Spring:
Tip Style - HIB
J
.050 (1.27)
.030 (0.76)
.035 (0.89)
.200 (5.08)
1,000,000 cycles
-55°C to +155°C
1.50 (42.5)
Current Rating:
Capacitance (Cc):
Bandwidth @ -1dB:
Tip Style - HIB
J
.118 (3.00)
.153
(3.89)
.230 (5.84)
0.010 (0.25)
U
0.0375 (0.95)
.118 (3.00)
0.0245 (0.62)
Mechanical
Pitch:
Recommended Travel:
Full Travel:
Test Height:
Mechanical Life*:
DUT End
.153
(3.89)
.153
(3.89)
B
SCP-127
J
ECT-CPG.com
shop.ECT-CPG.com
SCP-080
117

Semiconductor - Ect

Transcription

Similar documents

business services

Manual - The Unofficial P

Probe Year in Review

MEXICO

CRYOGEN-FREE Models

TOGETHER. MAKING A DIFFERENCE.

Saf-T-Log ® Thermomètre enregistreur HACCP

Technical data sheet Electro ejaculator

electric drive chemical injectors

test - TU Ilmenau

View T3 Single Shot Gas Tool And Fasteners Catalog

Losing Yourself Identity Theft