Heavy Ion Effects in PWM`s of the types UCC1806 and UC1825A

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Heavy Ion Effects in PWM`s of the types UCC1806 and UC1825A
Document No
D-P-REP-01388-SE
Date
2005-02-10
Issue
Page
1
1/20
PROJECT
ESA_QCA0417S_C
TITLE
Heavy Ion Effects in PWM’s of the types
UCC1806 and UC1825A
EUROPEAN SPACE AGENCY
CONTRACT REPORT
The work described in this report was done under ESA
contract. Responsibility for the contents resides in the
author or organisation that prepared it.
Name
Function
Prepared :
S. Larsson
S. Mattsson
Approved :
Reno Harboe Sorensen
Date
Signature
Distribution
Complete :
Summary :
Reg. Office:
Saab Ericsson Space AB
S-405 15 Göteborg
Sweden
Reg. No: 556134-2204
Telephone:
Linköping Office:
Telephone:
+46 31 735 00 00
Saab Ericsson Space AB
S-581 88 Linköping
Sweden
Telefax:
Telefax:
+46 31 735 40 00
+46 13 18 64 00
+46 13 13 16 28
Document No D-P-REP-01388-SE
Class :
Contract No :
Date : 2005-02-10
Host System :
Host File :
Issue : 1
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SUMMARY
This report presents the results from heavy ion irradiation on PWM’s UCC1806 and
UC1825A from Texas Instrument. The dice have been manufactured at the Unitrode
facility at Merrimac.
No Single Event Latch-up (SEL) or hard errors were observed for UCC1806 and
UC1825A up to an LET value of 64.8 MeV/mg/cm2.
Both device types are very sensitive for soft errors with LET threshold around 20
MeV/mg/cm2 for UCC1806, 10 MeV/mg/cm2 for UC1825 and both have cross
sections about 1E-3 cm2.
Depending on test configuration, the soft errors are more or less frequent.
Results from the present tests and recent experiments on the same devices indicate a
wide spread in results. No soft error was observed which caused more than two PWM
output drop-out. The long inhibit observed in some of the presented pictures for
UC1825A in the present report are solely due to extra capacitance in test cables.
DOCUMENT CHANGE RECORD
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1
Date
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2005-02-10
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Document No D-P-REP-01388-SE
TABLE OF CONTENTS
Date : 2005-02-10
Page : 3
Issue : 1
PAGE
1.
ABSTRACT ................................................................................................ 4
2.
2.1
INTRODUCTION ....................................................................................... 4
References ................................................................................................. 4
3.
3.1
3.2
TEST SAMPLES......................................................................................... 5
UCC1806................................................................................................... 5
UC1825A .................................................................................................. 5
4.
4.1
4.2
4.3
4.4
BIAS CONDITION AND TEST SETUPS ................................................. 6
Testing technique ...................................................................................... 6
Test setup for the PWM UCC1806 ........................................................... 7
Test setup for the PWM UC1825A ........................................................... 8
Heavy Ion Test Facility ............................................................................. 8
5.
5.1
5.2
RESULTS .................................................................................................... 9
UCC1806................................................................................................... 9
UC1825A ................................................................................................ 13
6.
CONCLUSION ......................................................................................... 17
7.
Appendix.................................................................................................... 18
Document No D-P-REP-01388-SE
1.
Date : 2005-02-10
Issue : 1
ABSTRACT
This report presents the Single Event Effects results from heavy ion tests on two types,
UCC1806 and UCC1825A, of Pulse Width Modulator (PWM) controllers from Texas
Instrument. Both types have been manufactured in the Unitrode foundry at Merrimac,
UCC1806 in BiCMOS and UC1825A in Bipolar technology.
2.
INTRODUCTION
Pulse Width Modulator controllers are commonly used in various switching mode
power supply systems. PWM’s offer special features designed to optimize the controller
while minimizing the need for external circuitry. The devices generally have an error
amplifier, an oscillator circuit, an output circuit and internal reference voltage. In some
controllers such as the ones tested here there are also protection features as current
limiting and soft-start.
Depending on the implementation of the different devices the effect of heavy ion can be
significant in spaceflight hardware. UCC1806 has recently been heavy ion tested in two
different test set-ups [1,2]. The TERMA [1] set-up was a heavy ion test of a real
application where no errors could be observed. In a recent attempt to verify the results
[2] with different implementation of the PWM, heavy ion errors were clearly detected.
The present investigations performed at the European HIF facility at CYClotron of
Louvain la Neuve in Belgium have been guided by the set-ups and the results from the
previous tests [1, 2].
2.1
References
[1]
SEE Verification Test of Various Designs Using UCC1801/1805/1806 for Rosetta
R. Harboe Sorensen and H. Jensen, 4th D/TOS-QCA Final Presentation Day, Jan
2001
[2]
Heavy Ion Single Event Effects in UCC1806 PWMs, TOS-EPC/04.116/SL,
S. Landstrom and R. Harboe Sorensen, ESA/ESTEC test report, 27 April 2004
Page : 4
Document No D-P-REP-01388-SE
3.
TEST SAMPLES
3.1
UCC1806
Date : 2005-02-10
Issue : 1
UCC1806 is a low power, dual output, current mode Pulse Width Modulator controller.
Three samples were prepared for the tests whereof two were irradiated with heavy ions
The tested samples have been manufactured in a BiCMOS process at Unitrode
Merrimac.
Part Type
Manufacturer
Date Code
Quality
Bias Condition
Package
Serialization
UCC1806
Texas Instrument
(Unitrode/Merrimac)
0146
Mil Temp
5V
Ceramic 16 DIL
#1, #2
Figure 3.1.1 Package, top view
3.2
Figure 3.1.2 Chip marking
UC1825A
UC1825A is a high speed Pulse Width Modulator controller.
Three samples were prepared for the tests whereof two were irradiated with heavy ions
The tested samples have been manufactured in bipolar technology at Unitrode
Merrimac.
Part Type
Manufacturer
Date Code
Quality
Bias Cond.
Package
Serialization
UC1825A
Texas Instrument
(Unitrode/Merrimac)
0313
QMLV
5V
Ceramic 16 DIL
#55, #56
Page : 5
Document No D-P-REP-01388-SE
Figure 3.2.1 Picture of the UC1825A
Date : 2005-02-10
Issue : 1
Figure 3.2.3 Chip mark on UC1825A
Figure 3.2.4 Chip mark on UC1825A
4.
BIAS CONDITION AND TEST SETUPS
4.1
Test Technique
For both PWM types six different parameters have been recorded as a function of heavy
ion strike and LET value. Single Event Transients (SET) was measured using two
oscilloscopes (Tektronix TDS3054, 500 MHz, 5GS/s) with trig conditions set to the
same. The oscilloscope has been triggered for one parameter at the time with all other
parameters recorded simultaneous. In each test run all oscilloscope inputs have been
recorded. For each trigger set-up, about 30-40 recordings have been saved to the
computer.
The test software was developed by use of “Labview software” for the GPIB
communication between the computer and the oscilloscopes and to store all results.
Page : 6
Document No D-P-REP-01388-SE
4.2
Page : 7
Issue : 1
Date : 2005-02-10
Test setup for the PWM UCC1806
In this setup the PWM controller was tested in integrated feedback mode with two
different capacitors on the reference output voltage, 10nF and 150nF.
PWR
INPUT
1N6638U
1N6638U
2N2907A
5.62
33µ
µH
5.62
38.3
3µ
µ
VSTART
5.62
4k64
1N5806US
LATCHUP
CONTROL
66µ
µ
100
150n
100n
47p
150n
100p
10 SYNC
7 COMP
100k
6
4k64
5
CS-
INV
9
8
16
1
4
CS+
NI
RT
14
BOUT
VREFIN
19 PRIMAR
8 SECOND
250nH
3
38.3 OUTB
1N6638U
UCC1806
31.6
11
AOUT
CT
VREF
38.3
38.3
OUTA
SHUTDOWN
CURLIM
PSL230
215
RSENSE
2
VREF 5.1V
82k5
46k4
38.3
4k64
8k25
220p
150n
10n
215
100k
470p
6k81
0.56
Figure 4.2.1 Test setup diagram for the UCC1806
Recorded signals:
Signal
Circuit Pin
Aout
11
Bout
14
EA
7
CL
1
Vref
2
Rsence
Description
PWM Clock Output
PWM Clock Output
Error Amplifier Output
Current Limit input
Reference Voltage Output
Voltage drop over the source
resistor on the external
MOSFET.
Trig condition
Pulse-width <1µs
no trig
Neg. slope at 1.36V
Neg. slope at 2.80V
Neg. slope at 0.59V
no trig
Document No D-P-REP-01388-SE
4.3
Page : 8
Issue : 1
Date : 2005-02-10
Test setup for the PWM UC1825A
15V
1µ
µ
VC 13
15
2k61
330p
VCC
4
Clock
5
RT
6
CT
7
RAMP
3k16
3n3
178k
3
1
16
2
10
ILIM/SD
Soft Start
9
8
1k78
100p
UC1825A
E/A OUT
INV
VREF 5.1V
NI
GND
OUTA
OUTB
11
1N6638U
4.7mH
14
1µ
µ
1N6638U
PWR GND
12
825
1N6638U
2k61
15n
2k61
150n
8k25
Figure 4.3.1. Test setup diagram for the UCC1825A
Recorded signals:
Signal
Circuit pin
Aout
11
Bout
14
SS
8
EA
3
Vref
16
5V out
4.4
Description
PWM Clock Output
PWM Clock Output
Soft Start
Error Amplifier Output
Reference Voltage Output
Rectified Output Voltage
Trig condition
Pulse-width <3µs
no trig
Neg. slope at 2.60V
Neg. slope at 2.00V
Neg. slope at 2.80V
no trig
Heavy Ion Test Facility
Heavy ion tests were performed at the CYClotron at Louvain la Neuve (CYCLONE) in
Belgium. The high energy cocktail (M/Q=3.33) were used in order to ensure sufficient
penetration depth in Silicon. The ions used are given in Table 4.1. Test data as ion
beam, tilt angle, flux, fluence and SET data for the various test runs are given in
Appendix A
TABLE 4.1
Element
22 Ne7+
40 Ar12+
78 Kr25+
HEAVY IONS USED AT LOUVAIN LA NEUVE IN BELGIUM
Energy
Range
LET value
MeV
[ MeV/mg/cm2 ]
µm
235
199
3.3
372
119
10.1
756
92
32.4
Document No D-P-REP-01388-SE
5.
RESULTS
5.1
UCC1806
Page : 9
Issue : 1
Date : 2005-02-10
No Single Event Latch-up (SEL) has been observed for this device up to an LET of
65 MeV/mg/cm2.
SET data and cross sections looks very much the same for the various tested parameters.
It seems as any heavy ion induced transient (SET) generate errors on all parameters. In
Fig 5.1.1 the cross sections for one missed output pulse on Aout using a reference
voltage of 2.5 volts are shown. No significant difference in cross section could be
observed for 1,25 and 5 Volts reference voltage. Comparative measurements were
performed for LET=32.4 MeV/cm2/mg. The results are given in Table 5.1.1 below.
Cross section curves for the parameters Aout, Error Amplifier (EA) and Current Limiter
(CL) are given in Figs 5.1.2 .
UCC1806, Trig: Aout<1µs
Cross Section [cm2]
1.E-03
1.E-04
dev.1&2, C=10nF, Vref=2.5V
dev.1&2, C=150nF, Vref=2.5V
dev1, C=10nF, Vref=1.25V
dev1, C=10nF, Vref=5V
dev1, C=150nF, Vref=1.25V
dev1, C=150nF, Vref=5V
1.E-05
0
10
20
30
40
50
60
70
LET [MeV/m g/cm 2]
Figure 5.1.1 Cross Section versus LET value for one or more missed pulses on Aout. No
difference could be observed for the two different capacitances to reference output
voltage
TABLE 5.1.1 CROSS SECTION GIVEN IN CM2 FOR THREE DIFFERENT REFERENCE
VOLTAGES AND TWO DIFFERENT CAPACITORS CONNECTED TO THE REFERENCE VOLTAGE
2
OUT (PIN 2). THE LET WAS 32.4MEV/MG/ CM . THE TRIGGERING CONDITION WAS THE
SAME AS IN FIGURE 5.1.1
C
10nF
150nF
Vref=1.25V
4.20E-04
3.80E-04
Vref=2.50V
4.10E-04
3.55E-04
Vref=5.00V
4.30E-04
4.10E-04
Document No D-P-REP-01388-SE
Issue : 1
Date : 2005-02-10
Page : 10
HI results from PWM UCC1806
Cross Section [cm2]
1.E-03
1.E-04
A<1µs, C=10nF
EA neg. C=10nF
CL neg. C=10nF
1.E-05
0
10
20
30
40
50
60
70
80
LET [M eV/mg/cm2]
Fig 5.1.2 Cross Sections as a function of LET values for Aout, Error Amplifier and
Current Limiter with 10nF capacitance to reference output voltage. Average data of the
two samples.
S. Landström and R. H. Sörensen [2] have in recent report identified three sensitive
areas (functions) on the die, namely; PWM pulse drop-out, latching of PWM clock and
control loop transients. In the present investigation cross section of these errors have
been measured and given as Aout, Current Limiter (CL) and Error Amplifier (EA),
respectively.
The probabilities for critical transients are closely linked to the implementation of the
PWM and the design of the DC/DC converter. In ref [2] the cross sections are reported
to be about 10 times lower than in the present investigation. These discrepancies can be
attributed to the different test set-ups used.
A transient trigged by Aout with all other parameters followed is shown in Fig 5.1.3.
A typical oscilloscope picture when triggering on CL with all other parameters followed
is given in Fig 5.1.4. This type of transients are likely due to hit in the reference
regulator which will influence the latch controlling the UVLO (Under Voltage Lock Out
unit) and the different input voltages to the OP-amplifier comparators.
In the present test it has been observed that a voltage drop on the Vref can lead to a soft
start and a change of the pulse period time on the Aout clock (Bout as well). This
phenomenon is shown in Fig 5.1.5 where the SET trigger is set on CL. About 10µs
before the CL drop, the reference voltage start to decrease and shift the pulse period for
next pulse before the CL close down the PWM.
Document No D-P-REP-01388-SE
Page : 11
Issue : 1
Date : 2005-02-10
311-1-21, trig =Aout<1µs
Aout
Bout
EA
CL
Vref
0
20
40
60
80
100
Rsence
µs
Figure 5.1.3 Oscilloscope picture indicating that one of the latches in the UVLO
is hit by an ion. The CL signal show a short response time.
315-1-5, trig=CL neg. flank
Aout
Bout
EA
CL
Vref
0
20
40
60
80
100
Rsence
µs
Figure 5.1.4 Typical picture of an error generated in some of the OP-amplifiers
controlling the UVLO where almost all signals are affected.
Document No D-P-REP-01388-SE
Issue : 1
Date : 2005-02-10
315-1-21, trig = CL neg. slope
Aout
Bout
EA
CL
Vref
15
25
35
45
55
65
Rsence
µs
Figure 5.1.5 Oscilloscope picture of measured parameters when negative slope on the
CL signal was triggering the oscilloscopes. The Vref starts to decrease at about 10µs
before the CL close down the PWM and at the same time shift the Aout pulse period.
Page : 12
Document No D-P-REP-01388-SE
5.2
Page : 13
Issue : 1
Date : 2005-02-10
UC1825A
Fig 5.2.1 shows the SET cross section data for the parameters Aout, SoftStart (SS) and
Error Amplifier (EA). The Aout and the EA are very similar while the SS is slightly
lower in cross section. This indicates that the majority of all SET’s involve the SS
resulting in missing pulses on the Aout and error in EA. Only a small fraction of all
errors observed in the output stage or in the EA do not affect the SoftStart (SS).
UC1825A
Cross Section [cm2]
1.E-02
1.E-03
1.E-04
Aout<3µs
1.E-05
EA neg. slope
SS neg. slope
1.E-06
0
10
20
30
40
50
60
70
80
LET [MeV/mg/cm2]
Figure 5.2.1 Cross Sections as a function of LET values for heavy ion induced
SET on UC1825A. All data points show the average of the two tested devices. The
legend in the right corner indicate the trigger conditions
Figs 5.2.2-5.2.5 show oscilloscope pictures for typical heavy ion events. In each figure,
the oscilloscope has been triggered by one specific parameter (given in the fig caption)
with all other parameters followed. For each trigger set-up, about 30-40 snap-shots have
been recorded. The shown pictures are selected as representative snap-shots of heavy
ion strikes.
In this test, the UC1825A was controlling a buck converter in voltage mode by tying the
Ct and Ramp pins together. The SHDN/ILIM pin was grounded through a resistor. The
buck converter was running in continuous mode and thus shows the characteristic
damped resonance when controlled in voltage mode as in this case.
Independent of trigger parameter, a striking similarity in appearance between the
pictures is observed. The SET transients seen are what would be expected if the SSlatch is trigged. The SS pin “quickly” discharges the capacitance down to ~0.3V and
then returns “slowly” to its normal value of 5V. After the SS pin returns, a ringing is
seen on the EA pin. This is caused by the control loop trying to correct the output
voltage error caused by the missing pulses. The buck converter resonance is responsible
for this behavior, not the SET itself. The actual discharge/charge time and number of
missing pulses depend on the capacitance seen on the SS pin, the nominal EA output
voltage and of course the switching frequency.
Document No D-P-REP-01388-SE
Page : 14
Issue : 1
Date : 2005-02-10
In the plots below (Figs 5.2.2-5.2.4) it can be seen that many PWM pulses are missing
after an SET.
The influence of the test cable has been verified on the PWM type UC1806. In Fig 5.2.5
a SET in CL (Current Limiter) and EA (Error Amplifier) using a test set-up with a
capacitance of that in the flat cable (about 200pF) is shown. In Fig 5.2.6, the same test
data are shown where the DUT board was equipped with a transistor-driving circuit
eliminating the cable capacitance. As can be seen from the figures, the recovery time
changed a factor 3.
RUN #64-1
400
350
300
Aout
250
Bout
200
SS
150
Vref
100
EA
5Vout
50
0
0
50
100
150
200
250
300
350
400
µs
Fig 5.2.2 Oscilloscope picture of various parameters on the UC1825A triggered by the
Soft Start. For better visualization, the data for SS, EA and 5Vout have been amplified a
factor 4 in the picture. The long recovery times of the signals are due to test cable
capacitance (200pF). Elimination of the test cable capacitance will reduce the recovery
time with a factor 3.
Document No D-P-REP-01388-SE
Page : 15
Issue : 1
Date : 2005-02-10
RUN #71-3
400
350
300
Aout
250
Bout
200
SS
150
EA
100
Vref
5Vout
50
0
0
100
200
300
400
µs
Fig 5.2.3 Oscilloscope picture of various parameters on the UC1825A triggered by the
Error Amplifier. For better visualization, the data for SS, EA and 5Vout have been
amplified a factor 4 in the picture. The long recovery times of the signals are due to test
cable capacitance (200pF). Elimination of the test cable capacitance will reduce the
recovery time with a factor 3.
RUN #72-25
400
350
300
250
Aout
200
Bout
150
SS
100
EA
50
Vref
0
5Vout
0
50
100
150
200
250
300
350
400
µs
Fig 5.2.4 Oscilloscope picture of various parameters on the UC1825A triggered by the
Aout. For better visualization, the data for SS, EA and 5Vout have been amplified a
factor 4 in the picture. Bout is reduced a factor of 2. The long recovery times of the
signals are due to test cable capacitance (200pF). Elimination of the test cable
capacitance will reduce the recovery time with a factor 3.(se figs 5.2.5 and 5.2.6)
Document No D-P-REP-01388-SE
Page : 16
Issue : 1
Date : 2005-02-10
RUN #5-1
Aout
EA
CL
0
25
50
75
100
125
150
175
200
µs
Fig 5.2.5 Oscilloscope pictures of PWM parameters after heavy ion strike using a 3m
flat cable (∼ 200pF) to the DUT board giving a Current Limiter pulse of about 30µs.
RUN #311-3
Aout
EA
CL
0
25
50
75
100
125
150
175
200
µs
Fig 5.2.6 Oscilloscope pictures of PWM parameters after heavy ion strike using a
transistor-driver circuitry on the DUT board eliminating the capacitance in the flat
cable. The width of the CL pulse is reduced to about 10µs.
Document No D-P-REP-01388-SE
6.
Date : 2005-02-10
Issue : 1
Page : 17
CONCLUSION
The PWM’s UCC1806 and UC1825A from Texas Instrument have been manufactured
at the Unitrode facility at Merrimac.
No Single Event Latch-up (SEL) or hard errors were observed for UCC1806 and
UC1825A up to an LET value of 64.8 MeV/mg/cm2.
Both device types are very sensitive for soft errors with a LET threshold around 20
MeV/mg/cm2 for the UCC1806, around 10 MeV/mg/cm2 for the UC1825 and both have
cross sections about 1E-3 cm2.
Depending on the test configuration, the soft errors are more or less frequent. In the
recent test [1] of UCC1806, no soft errors were recorded at all. In the present
investigation the cross section is measured to be about 10 times higher than earlier
reported results.
No soft error was observed which caused more than two PWM output drop-out. The
long inhibit observed in some of the presented pictures for UC1825A in the present
report are solely due to extra capacitance in test cables.
Document No D-P-REP-01388-SE
7.
Issue : 1
Date : 2005-02-10
Appendix
Measured raw data:
High penetration, M/Q=3.33 Data, Aug 2004
Ion-tilt
LET
Fluence device C [nF] Reference
voltage [V]
Ar-0
10.1 1E5
2
10
2.50
Ar-0
10.1 1E5
2
150
2.50
Ar-45
14.3 1E5
2
10
2.50
Ar-45
14.3 1E5
2
150
2.50
Ar-60
20.2 1E5
2
10
2.50
Ar-60
20.2 1E5
2
150
2.50
Kr-0
32.4 1E5
1
10
1.25
Kr-0
32.4 1E5
1
150
1.25
Kr-0
32.4 1E5
1
10
2.50
Kr-0
32.4 1E5
2
10
2.50
Kr-0
32.4 1E5
1
150
2.50
Kr-0
32.4 1E5
2
150
2.50
Kr-0
32.4 1E5
1
10
5.00
Kr-0
32.4 1E5
1
150
5.00
Kr-45
45.8 1E5
1
10
2.50
Kr-45
45.8 1E5
2
10
2.50
Kr-45
45.8 1E5
1
150
2.50
Kr-45
45.8 1E5
2
150
2.50
Kr-60
64.8 1E5
1
10
2.50
Kr-60
64.8 1E5
2
10
2.50
Kr-60
64.8 1E5
1
150
2.50
Kr-60
64.8 1E5
2
150
2.50
PWM UCC1806, trig=Aout<1µs
SEE
Data
4
0
2
4
18
20
42
38
42
33
31
40
43
41
65
40
46
47
63
67
62
57
Run
no
85
84
86
87
89
88
8
13
7
57
12
58
10
11
45
68
46
67
52
65
51
66
Ion-tilt
LET
Ar-0
Ar-0
Ar-45
Ar-45
Ar-60
Ar-60
Kr-0
Kr-0
Kr-0
Kr-0
Kr-0
Kr-0
Kr-0
Kr-0
Kr-45
Kr-45
10.1
10.1
14.3
14.3
20.2
20.2
32.4
32.4
32.4
32.4
32.4
32.4
32.4
32.4
45.8
45.8
SEE
Data
1
0
2
8
22
37
60
40
52
38
46
46
49
50
56
63
Run
no
82
83
81
80
78
79
25
30
26
72
29
71
27
28
56
73
Fluence device C [nF] Reference
voltage[V]
1E5
2
10
2.50
1E5
2
150
2.50
1E5
2
10
2.50
1E5
2
150
2.50
1E5
2
10
2.50
1E5
2
150
2.50
1E5
1
10
1.25
1E5
1
150
1.25
1E5
1
10
2.50
1E5
2
10
2.50
1E5
1
150
2.50
1E5
2
150
2.50
1E5
1
10
5.00
1E5
1
150
5.00
1E5
1
10
2.50
1E5
2
10
2.50
Page : 18
Document No D-P-REP-01388-SE
Issue : 1
Date : 2005-02-10
Kr-45
45.8 1E5
1
150
Kr-45
45.8 1E5
2
150
Kr-60
64.8 1E5
1
10
Kr-60
64.8 1E5
2
10
Kr-60
64.8 1E5
1
150
Kr-60
64.8 1E5
2
150
PWM UCC1806, trig=EA neg. slope
2.50
2.50
2.50
2.50
2.50
2.50
63
68
86
85
77
81
55
74
53
76
54
75
Ion-tilt
Reference
voltage [V]
1.25
1.25
2.50
2.50
5.00
5.00
2.50
2.50
2.50
2.50
SEE
Data
66
50
61
56
56
62
63
70
96
91
Run
no
25
30
26
29
27
28
56
55
53
54
LET
Fluence device C[nF]
Kr-0
32.4 1E5
1
10
Kr-0
32.4 1E5
1
150
Kr-0
32.4 1E5
1
10
Kr-0
32.4 1E5
1
150
Kr-0
32.4 1E5
1
10
Kr-0
32.4 1E5
1
150
Kr-45
45.8 1E5
1
10
Kr-45
45.8 1E5
1
150
Kr-60
64.8 1E5
1
10
Kr-60
64.8 1E5
1
150
PWM UCC1806, trig=CL neg. slope
High penetration, M/Q=3.33Data Nov. 2004, Ref voltage=2.5V
Ion-tilt LET Fluence device SEE
Run
Data
no
Ne-60
6.6
4E5
55
17
97
Ne-60
6.6
4E5
56
12
95
Ar-0
10.1 1E5
55
95
77
Ar-0
10.1 1E5
56
94
79
Ar-60
20.2 1E5
55
183
73
Ar-60
20.2 1E5
56
190
80
Kr-0
32.4 5E4
55
186
107
Kr-0
32.4 5E4
56
175
109
Kr-60
64.8 3E4
55
150
108
UC1825, Trig=Aout<3µs
Fluence device SEE
Data
Ne-60
6.6
4E5
55
2
Ne-60
6.6
2E5
56
1
Ar-0
10.1 1E5
55
77
Ar-0
10.1 1E5
56
76
Ar-60
20.2 1E5
55
187
Ar-60
20.2 1E5
56
197
Kr-0
32.4 5E4
55
197
Kr-0
32.4 4E4
56
157
Kr-60
64.8 2.38E4 55
125
UC1825, Trig on EA-out on neg. slope
Ion-tilt
LET
Run
no
99
91
69
88
70
87
101
110
102
Page : 19
Document No D-P-REP-01388-SE
Ion-tilt
LET
Fluence device SEE
Data
Ne-60
6.6
4E5
55
3
Ne-60
6.6
5E5
56
5
Ar-0
10.1 1E5
55
79
Ar-0
10.1 1E5
56
85
Ar-60
20.2 1E5
55
119
Ar-60
20.2 1E5
56
95
Kr-0
32.4 5E4
55
76
Kr-0
32.4 5E4
56
88
Kr-60
64.8 5E4
55
132
UC1825, Trig on SS on neg. slope
Date : 2005-02-10
Run
no
98
93
62
83
63
82
104
111
103
Issue : 1
Page : 20

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