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Advanced Detection of Electronic Counterfeits (ADEC)
NOKOMIS Supporting Americas Advanced Technology Advanced Detection of Electronic Counterfeits (ADEC) 19 April 2013 Presenter: Bogdan A. Pathak Authors: Walter J. Keller and Bogdan A. Pathak Nokomis Inc. (724) 483-3946 [email protected] Copyright Nokomis, Inc. 2013 Nokomis Background NOKOMIS Supporting Americas Advanced Technology • Nokomis is dedicated to the detection, identification, classification and diagnostics of electronics based on electronic emission signatures – Nokomis products exploit EM emissions for our customer’s benefit – Providing unique detection and diagnostics capabilities since 2002 • Over $15 Million in R&D Resulted in ADEC Core Sensor – Sensitive receiver developed over several years – Application specific digital signal processing/automated detection techniques leveraged – 17 Phase I SBIRs, 7 Phase II SBIRs, 11 Phase III SBIRs • Experienced staff/specific skill set for application – Multiple years experience in sensitive EM/RF effects analysis – Significant institutional experience in electronic device detection, analysis and diagnostics methodologies Copyright Nokomis, Inc. 2013 2 Company Overview NOKOMIS Supporting Americas Advanced Technology • Small business - offices in Charleroi, PA; Toledo, OH; Athens, GA • Unique capability to support ADEC • Three anechoic chambers – largest is 50’ x 18’x 15’ • 50,000 square foot facility • Secure facility for assessment of counterfeit modalities • All employees are U.S. citizens • Substantial Counterfeit Part Repository (18000 parts in inventory) • Unique signature assessment capabilities Copyright Nokomis, Inc. 2013 3 ADEC Part Screening Configurations NOKOMIS Supporting Americas Advanced Technology • Detects anomalies in electronic parts • Detects counterfeits and verifies trusted parts − Piece part screening − Part screening on fully integrated boards Screening of Boards After Integration Piece Part Screening Copyright Nokomis, Inc. 2013 4 NOKOMIS Supporting Americas Advanced Technology Current Counterfeit Dilemma and Applicability of ADEC Copyright Nokomis, Inc. 2013 5 Uncovering Counterfeits • The counterfeit problem continues to increase in size, scope and sophistication NOKOMIS Supporting Americas Advanced Technology Large percentage of counterfeit components not identified until problems occur during use! • Limitations with standard methods of electronic component screening – Low chance of counterfeit ID – Too costly – Overly specific • Poorly labeled chips • Pin continuity • Temperature testing Copyright Nokomis, Inc. 2013 6 Counterfeit Problem NOKOMIS Supporting Americas Advanced Technology • Counterfeit part incident reports from January through the end of August 2012 averaged 107.3 per month, up slightly from 107.1 in 2011 − 1,336 separate verified counterfeit part incidents − Transactions involved more than 834,079 parts − Sources include GIDEP and ERAI • Integrated Circuit (IC) counterfeiting especially critical Field Programmable Gate Array (FPGA), Memory and Microprocessor counterfeiting continue to increase • Government screening methods still incapable of ensuring integrity of system subcomponents − Counterfeits highly likely to be responsible for critical system functions in military systems now! Copyright Nokomis, Inc. 2013 7 US Defense Electronic Parts Supply Chain NOKOMIS Supporting Americas Advanced Technology Copyright Nokomis, Inc. 2013 8 Industry Standard Testing Methods NOKOMIS Supporting Americas Advanced Technology • Sophisticated counterfeits can evade detection methods – High-quality labeling – Functional component • Up-marked • Recycled • Limited testing risky – Counterfeits easily overlooked – Single questionable component – Can compromise entire system • More extensive testing required Source: NASA briefing; Workshop and Exhibition on COUNTERFEIT ELECTRONIC PARTS; October 1, 2009 - Expensive - Time-intensive Copyright Nokomis, Inc. 2013 9 Unintended Emissions Application to Counterfeits NOKOMIS Supporting Americas Advanced Technology All electronics give off unintentional radiated emissions • All electronics radiate electromagnetic energy that is characteristic of their function, design, and construction • Integrated circuits can be characterized by emission signatures, and changes to those signatures indicate counterfeit devices • Electromagnetically reactive markers whose signatures (fingerprint) change predictably can be leveraged to provide authentication, and provide dynamic levels of security Integrated Circuit (IC) Signature Copyright Nokomis, Inc. 2013 10 ADEC Piece Part Screening NOKOMIS Supporting Americas Advanced Technology • ADEC System repurposes mature device detection technology for counterfeit detection – Phenomenology heavily researched – Capability proven through extensive testing • Government-sponsored • Substantial IR&D – Leveraged to detect counterfeit electronics • Counterfeit detection modality is non-contact and non-invasive – Radio frequency measurements • • • • Multiple channels/high throughput Emissive content analyzed Embedded processing assets Algorithms assess component signature • Unintended emissions are produced by all electronic components ADEC Detects Counterfeits Prior to Integration into Weapon Systems – Autonomous analysis and categorization – Authentic or suspected counterfeit determined Copyright Nokomis, Inc. 2013 11 ADEC: Sensitivity and Discrimination • Sensor technology state-of-the art for extracting extremely weak phenomena • Ultra-sensitive Hiawatha receiver forms core of ADEC system NOKOMIS Supporting Americas Advanced Technology High End Commercially Available Capability ‒ Product of more than $15M in targeted government investment ‒ Unique design features • • • • Extremely sensitive front-end Multi-channel High throughput Substantial back-end processing ADEC o Achieves significant processing gain • Developed specifically for unintended emissions assessment of electronics Copyright Nokomis, Inc. 2013 12 Where Does ADEC Fit In? • NOKOMIS Supporting Americas Advanced Technology ADEC offers improved performance at lower cost compared to existing methods Type of Analysis No die Possible Mark Perm Possible Wrong-die Possible Possible Likely Yes Yes Yes Yes Yes Board pull Possible No No Yes Possible Likely Yes Yes No No No Likely Possible Likely Yes Yes Possible Possible No Yes No Possible Yes Yes Possible Possible No Yes No Possible Yes Yes Possible Possible No Likely No No Yes Yes Possible Possible Possible Yes Possible Possible Likely Yes No No Possible Yes No No Possible Possible Visual Counterfeit Types Sophistication nonfunctional devices Failed real part Speed upmarking Spec upFunctional marking Devices Temp uprange Lesser part / knock-off high-end counterfeit Internal Visual Yes ADEC Yes Basic DC Min Func. Full Spec. Test Test Extended Yes Yes Yes Test & Qual Yes Expense *Modified from “Basic Detection Methods for Counterfeit Components,” Integra, March 2010 Copyright Nokomis, Inc. 2013 13 NOKOMIS Comparative Costs Supporting Americas Advanced Technology • Visual Inspection • Visual and acetone tests: $0.05 / piece • X-ray or de-capsulation: $125 / piece • Minimal Functionality Tests • Simple devices: $1K – $2K NRE + $1 / piece • Complex devices: $3K – $5K NRE + $2 / piece • Full Functionality Tests • Simple devices: $2K – $5K NRE + $5 / piece • Complex devices: $5K – $20K NRE + $7.5 / piece (assumes software exists for component) • Burn-in: $2K – $5K NRE + $2/piece • ADEC System: $.5K - $1K NRE + $0.25 / piece *Cost data of existing methods taken from “Basic Detection Methods for Counterfeit Components,” Integra, March 2010 Copyright Nokomis, Inc. 2013 14 ADEC User Interface: Logging In NOKOMIS Supporting Americas Advanced Technology • Standard user login upon system startup – Username – Password • Optional: additional verification from fingerprint reader – Strengthens identity proofing • User classifications – Admin: Full access to basic and advances features – Operator: Access to all basic features; limited access to advanced features Copyright Nokomis, Inc. 2013 15 ADEC User Interface: Basic User Screen NOKOMIS Supporting Americas Advanced Technology Status bar { Active part to screen Push button to start scan Editable Serial No. Primary status display Button to select part to screen System connection status Copyright Nokomis, Inc. 2013 16 The ADEC User Interface: The User’s Experience NOKOMIS Supporting Americas Advanced Technology • System startup • Select part • Initiate scan • Scan performed • Result displayed • Detection history appended • Load next part Copyright Nokomis, Inc. 2013 17 ADEC User Interface: Part Selection NOKOMIS Supporting Americas Advanced Technology • Select from parts within ADEC signature database – Filter by manufacturer – Filter by part type • • • • • Microcontroller Microprocessor Programmable Logic Memory Other – Manual search field • Database easily updated as new parts are identified and characterized Copyright Nokomis, Inc. 2013 18 ADEC User Interface: Advanced Features NOKOMIS Supporting Americas Advanced Technology • Advanced mode for maintenance engineers and R&D (admin level users) • Spectral display for each channel • Manual tuning • Review, append, and export logs • Record received data for additional analysis Copyright Nokomis, Inc. 2013 19 Recent Work Emphasis NOKOMIS Supporting Americas Advanced Technology • Nokomis maintains continually growing inventory of counterfeit components – Emission collection and analysis – Part information is recorded and stored • Source and date received • Reason for being suspect • Any source or traceability information available • Parts database contains substantial counterfeits – Over 90 different part types with 18,000+ total counterfeit parts and counting – Parts received from 6 distributors • Emphasis on programmable logic, microcontrollers, microprocessors, and memory Copyright Nokomis, Inc. 2013 20 NOKOMIS Parts Database/Inventory Manufacturer Part Num ber Part Type Quantity Suspect Received From Programmable Logic 13 Parts A Xilinx XC3042A FPGA 5 SMT W Altera EPM7032LC44-12 MAX7000 Series CPLD 24 Inland Empire X Altera EPM7160ELC84-12 CPLD 10 PCX Y Lattice Semiconductor GAL16V8D 15LP D302DD08 PLD 20 Inland Empire Z Lattice Semiconductor Manufacturer Microprocessor Supporting Americas Advanced Technology Part Num ber Part Type Quantity Suspect Received From 3 Parts AB Zilog Z8681PS Z8 ROMLESS 8517 ROMless Microcomputer 8 Inland Empire BJ D70208L-10 Microprocessor 10 PCX TN80C188EB1 Embedded Processor 10 PCX NEC BK Intel Others - OF INTEREST 19 Parts pLSI 1016-60LJ 13450B05 PLD 12 Inland Empire K National Semiconductor ADC0817CCN 16 ch, 8-bit ADC 9 4 Star AA Lattice Semiconductor MACH131-12JC 0108MDM A CPLD 20 Inland Empire AC Actel A1020A ACT1 anti-fuse FPGA 3 Inland Empire M N Philips Rockw ell NE568AN R6522P Phase-locked loop Versatile Interface Adapter 5 2 4 Star 4 Star AD Lattice Semiconductor GAL18V10 PLD 31 Inland Empire AL NEC NEC D71084C 8948AY2D1 Inland Empire XCR5064C-10VQ44I CPLD 10 PCX AM Philips SCN2681AC1A44 ClockUART Pulseasynchronous Generator/Driver Dual receiver/transmitter Local Area Netw ork Controller 106 BG Xilinx 43 Inland Empire BH Xilinix XC7354-10PC68C CPLD 10 PCX AN AMD AM7990PC/80 3363LJL for Ethernet 7 Inland Empire BI MACH435-15JC-20JI CPLD 10 PCX AP Texas Instruments ADC1205 12-bit Plus sign ADC 4 Inland Empire BX AT&T Micro ATT65630 CPLD 10 PCX AQ Analog Devices AD7237ABN 0319 8690171 Dual 12-bit DAC 11 Inland Empire CG Xilinx XC95108-15TQ100I XC9500 Family CPLD 0 (Avnet - Navy) AV TI CD4046BF3A PLL 10 Inland Empire BB Texas Instruments 74LS138N FJG3421 9109VG 8 Inland Empire AMD Microcontrollers 7 Parts L Philips MAB8421P Microcontroller P National Semiconductor HPC46003V17 Microcontroller 4 Star BD VLSI VL82C315AFC2 03200C 3-line to 8-line decoder related to 386SX System Cache Control 10 Inland Empire Q Motorola MC6809CPC65P Microcontroller 34 AERI BT M82C53-2 Programmable Interval Timer 10 PCX V Motorola MC68HC705P6CDW HCMOS Microcontroller 850 Inland Empire BU National Semiconductor DP8571AN Timer Clock Peripheral 10 PCX CJ Freescale/Motorola MC68334GCEH20 32-bit Microcontroller 5 Sensible Micro BY Motorola MC3371D FM Receiver IC 10 PCX CL Atmel AT89S8252-24JC Microcontroller 20 Sensible Micro BZ MAX180BCQH 10 PCX 10 PCX MC68HC11F1CPU4 Microcontroller 20 Sensible Micro 0 Crestw ood CQ Motorola 2 6 4 Star Memories 23 Parts H Texas Instruments TBP28L22N PROM 2 4 Star J Hyundai HY628100BLLG-70 RAM 2 4 Star O Atmel AT29C040A-90PC Flash memory 5 4 Star T Atmel AT29LV040A-15TU Memory 83 AERI OKI Maxim CD AMD AM79M574-1JC Data Acquisition System Metering Subscriber Line Interface CI TLC32044IN Voice-Band Analog Interface CK Crystal/Cirrus CS8412-CS Digital Audio Receiver 5 Sensible Micro CN CMD G65SC51P-4 CMOS Interface Adapter 26 Sensible Micro Texas Instruments Others 26 Parts E Texas Instruments TL604CP P-MOS analog sw itch 5 4 Star F International Rectifier IR2110S High and Low Side Driver 1 4 Star G Sprague UDN6118A Flourescent light driver 12 4 Star Philips NE571D Compandor 12 4 Star Allegro Intersil UDN2985A CA3240AE1 Source Driver Amplifier er Inverting Sw itching Micropow 20 25 AERI AERI 238 Inland Empire 6 Inland Empire 12500 Inland Empire 890 Inland Empire 2500 Inland Empire I PROM (?) 25 Inland Empire AM29F032B-120EC 0644MBM Flash Memory 10 Inland Empire R S AH Toshiba XC6913 TC58NVG0S3AFT05 EEPROM 10 Inland Empire AR Maxim MAX4391CPA Regulator AI Intel MD2764-45/B 8243 T245051B UV Eraseable PROM 10 Inland Empire AS Linear Technology LT1086IT Low -Drop Out Voltage Regulator AJ IDT IDT 7006 S70GB X5DC9613EP Dual Port SRAM 10 Inland Empire AT ON Semiconductor MC33274ADR2 operational amplifier AK SGS Thompson HPD1L535 M628128-20E1 SRAM 25 Inland Empire AU Texas Instruments LMC660CM CMOD quad operational amplifier BE Intel 28F400B5 Boot Flash ROM(?) 10 Inland Empire AW Phillips 74HC14N L0D1C5 Inverting Schmitt Trigger 2 Inland Empire BL K6X1008C2D-GF70 Static RAM 10 PCX AX Analog Devices T0212 CMP04F Quad Precision Comparator 20 Inland Empire IDT7MMV4101 Static RAM 10 PCX AY Fairchild PF30AD CD4051BCN Analog Multiplexer/ Demultiplexer 12 Inland Empire PCX AZ Motorola MC54HC4066J KKFH9052 Quad Analog Sw itch 60 Inland Empire LBR3 406690867 1350K 9322 K62 Quad Analog Sw itch 8 Inland Empire 650 Inland Empire AE Xilinx 1765DSC Configuration PROM AF Texas Instruments 8044X 288 TBP18S030N AG AMD/Fujistsu/ Spansion Samsung BM IDT BN Toshiba TC551001CF-70L Static RAM 10 BP AMD AM29F200BB-50SI Boot Sector Flash Memory 10 PCX BA AT&T BQ Atmel AT29C512-90TU Flash Memory 10 PCX BC Xicor X2864BJ-25 BR Sharp LH28F320BJE-PTTL90 Flash Memory 10 PCX CA Motorola MC33076D Op Amp 10 PCX BS Intel MD2716M/B EPROM 10 PCX CB Intersil HA3-2544C-5 Video Op Amp 10 PCX BV Samsung KM41C4000DJ-6 Dynamic RAM 10 PCX CC National Semiconductor 5962-9081201MPA High Speed Buffer 10 PCX BW Samsung K6F1616U6C-FF55 Static RAM 10 PCX CE National Semiconductor 5962-8769301EA Multiplexer 10 PCX CH Xicor X28C256KMB-25 Byte Alterable EEPROM 0 Crestw ood CF ADE7755ARSZ Energy Metering IC 10 PCX CM ISSI IS41LV16256B-35TL DRAM 39 Sensible Micro AD515AJH Op Amp 10 Sensible Micro Analog Devices CP Analog Devices Copyright Nokomis, Inc. 2013 21 Recent Pilot Testing NOKOMIS Supporting Americas Advanced Technology • 7 parts provided by a Fortune 500 company – Contained sprinkled sampling of both counterfeits and authentic parts for an aviation specific program • Nokomis procured 40 certified authentic parts from the OCM separately to provide baseline • 2 Groups conducted separate testing on the parts – Group 1: Determine if exploitable content present – Group 2: Characterize performance of automated system • Groups prevented from sharing data until conclusion of tests Copyright Nokomis, Inc. 2013 Recent Pilot Results NOKOMIS Supporting Americas Advanced Technology • All blind studies accurately identified the same 2 parts as authentic and the same 5 parts as counterfeit – – – – Each part scanned for 3 seconds 100% true positive rate 0% false alarm rate 100% specificity Copyright Nokomis, Inc. 2013 Next Steps NOKOMIS Supporting Americas Advanced Technology • The ADEC system will be available for purchase at the end of August 2013 – Contact Nokomis if you have counterfeit detection needs • Nokomis intends to perform multiple additional pilot tests to continue to validate system performance and reliability – Industry and government partners are necessary for this testing – Contact Nokomis if your entity is interested in partnering on a pilot test Copyright Nokomis, Inc. 2013 NOKOMIS Summary Supporting Americas Advanced Technology • ADEC technology effectiveness verified – Demonstrated against multiple counterfeits – Cost-effective technology for identifying high-quality IC counterfeits • Highly autonomous system – Simple user interface – All functionality autonomous after user selections made • Multiple algorithm combination greatly improves component screening results – High confidence fingerprinting of components/low false positives • Statistical results favorable and improvements continuously being implemented • Undertaking additional Pilot activities across several programs to further improve results and develop a wider statistical range of parts and applications Copyright Nokomis, Inc. 2013 25
