message from the conference president year 2010 msc woodington

Navy Metrology and Calibration Program
Air Force Metrology and Calibration Program
Army Primary Standard Laboratory
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Measurement Science Conference will occasionally send you subscription, invitation, marketing and research email messages.
Cancelation Policy:
*Cancellation policy: if written notification of cancellation is received before:
February 26, 2010, all registration fees (less $25.00) will be refunded.
Please make checks payable to: “Measurement Science Conference”
We will accept Visa, Master Card, and American Express for payment.
1280 Bison Ave., Suite B9-530, Newport Beach, CA 92660 Or register using the internet at
http://­www.msc-conf.com. For registration information call 1.866.MSC.MEAS or 1.866.672.6327
or fax 1.951.273.5175 or e-mail to [email protected]
N03
N06
N02
N05
VISA
E-MAIL
TOTAL CONFERENCE FEES: $______________
$825 AFTER FEBRUARY 28, 2010
AMER.EXP
ASQ TRAINING (2-Days): MARCH 22 - 23, 2010
$725 ON OR BEFORE FEBRUARY 28, 2010 . . . . . . . .
CONFERENCE REGISTRATION INCLUDES:
REFRESHMENTS • LUNCHES • ONE COPY OF PROCEEDINGS
PRESIDENT’S RECEPTION
$625 ON or BEFORE 2/28/10
$725 AFTER 2/28/10
$525 ON or BEFORE 2/28/10
$625 AFTER 2/28/10
THURSDAY ONLY
FRIDAY ONLY
ZIP
$6­­95 AFTER 2/28/10
Community College of Aurora
National Cooperation for Laboratory Accreditation (NACLA)
$595 ON OR BEFORE 2/28/10
San Diego Biometrology Society
(TWO DAY)
National Conference of Standards Laboratories (NCSL)
N01
N04
PTTI (Precision Time & Time Interval)
Califomia State University Long Beach (CSULB)
HAVE SPECIAL MEAL REQUIREMENTS
U.S. Naval Observatory Time Service Dept.
MSC (2 DAYS)
MSC (1 DAY)
Clip & Mail
National Institute of Standards and Technology (NIST)
$595 AFTER 2/28/10
See website for abstracts.
International Metrology Organization (IMEKO)
National Association For Proficiency Testing (NAPT)
TUTORIAL WORKSHOPS: MARCH 23-24, 2010
(ONE DAY)
$495 ON OR BEFORE 2/28/10
Tuesday
Wednesday
Government Rate: Current year’s Federal Government Rate
International Society for Weighing and Measuring (ISWM)
Select One:
SEMINAR
SEMINAR
Non-Government Room Rate: $179 Singles/Doubles
Instrument Society of America (ISA)
NIST SEMINARS - (2-Day Courses): MARCH 22-23, 2010
(NIST Seminars are limited to the first 25 applicants)
$725 ON OR BEFORE FEBRUARY 28, 2010 $825 AFTER FEBRUARY 28, 2010
Government • Group: Measurement Science Conference - Government Block • Code: MSCG
International Accreditation Service, Inc.
PLEASE INDICATE IF YOU:
HAVE ADA REQUIREMENTS
Non-Government • Group: Measurement Science Conference • Group Code: MSC
IEEE Instrumentation and Measurement Society
(REQUIRED FOR E-MAIL CONFIRMATION OF REGISTRATION)
Hilton Pasadena
168 South Los Robles Avenue
Pasadena, CA 91101
Phone: (626) 584-3108
Reservations Phone: (626) 577-1000 Ask for MSC
Government Industry Data Exchange Program (GIDEP)
MC
March 21 , 2010 - March 26, 2010
A2LA
California State University Dominguez Hills (CSUDH)
)
HOTEL INFORMATION
American Society for Quality (ASQ)
ASQ - Measurement Quality Division
TELEPHONE (
The Measurement Science Conference (MSC) presented six scholorships
during the 2009 Conference on March 27, 2009. MSC has an established fund to
award scholarships to students in an Engineering, Science, or Quality Assurance
degree program. The scholarship program places emphasis on papers or projects
that discuss the advancement of measurement science technology. Students from
participating schools must submit complete scholarship applications and transcripts
by our deadline to be eligible for the MSC Scholarship
Awards. An MSC sub-committee evaluates all
applications and provides a list of finalists to the MSC
Board of Directors. The Board selects the scholarship
recipients from this list of finalists. MSC would like to
congratulate each of these 2009 Scholarship Award
Winners and wish them much success with their
future.
[L-R]Arman Hovakemian (MSC 2009 President),
Christine Donaldson, Owen Cupp, Jared Cupp,
Send recommendations for the scholarships to:
Sergio L. Zaragoza, Nicholas Goldberg, Brian
Shafer and Ed Trovato, (Scholarship Chairman)
Miguel Cerezo at [email protected]
SPONSORS
EXPIRATION DATE PASADENA CONVENTION CENTER
Hilton Pasadena
168 South Los Robles Avenue
Pasadena, CA 91101
www.msc-conf.com
MSC SCHOLARSHIPS
See website for abstracts.
CREDIT CARD
Friday • March 26, 2010
Speakers Breakfast
Exhibit Hall Opens
Luncheon Speaker • Scholarship Awards
Door Prizes
Joe Simmons Best DeveloperAward for 2009
The Joe D. Simmons Best Developer Award was
presented to Shay Edwards for scholastic excellence in
the study of measurement science and quality.
Balance Calibration and Use in an Analytical Environment
Val Miller, NIST and Mark Ruefenacht, Heusser Neweigh
STATE
Thursday • March 25, 2010
Speaker’s Breakfast
General Session • Keynote Speaker
Exhibit Hall Opens
Luncheon Speaker • Woodington Award
Presidents Reception
Algie Lance Best Paper Award for 2009
The Algie Lance Best Paper Award went to Ding Huang for her
paper entitled “Calibration Interval Interpreted Within Reliability
Centered Calibration”.
Flow Measurements and Uncertainties
Aaron Johnson, John Wright, NIST Process Measurements Division
CITY
Wednesday • March 24, 2010
Exhibits Open • Reception • Drawing
WOODINGTON AWARD
The Woodington Award is intended to honor those individuals who personify the
highest level of Professionalism and Dedication to the Metrology Community. Do
you know such an individual? Someone who consistently demonstrates dedication,
unquestioned competence, and commitment? Has this individual demonstrated
noteworthy Professional achievements that have warranted
national and/or international recognition?
The Woodington Award, since its inception in 1978, has been
an annual award under the aegis of the Measurement Science
Conference. It is awarded by the Conference to recognize a
member of the Measurement Community who represents the
highest level of professionalism and dedication to the Metrology
Profession. Candidates for the Woodington Award shall have
exhibited noteworthy professional achievement in the Metrology
Profession.
Send recommendations by using the Recommendations
Jesse Morse
2009 Woodington Award Recipient
form at: www.msc-conf.com
Temperature Measurements and Uncertainties
Greg Strouse and Karen Garrity, NIST Process Measurements Division
MAILING ADDRESS
EVENTS
Practical Measurement Assurance
Georgia Harris, NIST Weights and Measures Division
TITLE/DEPT.
HANDS ON WORKSHOP
Friday • March 26, 2010
John Billingsley
President, MSC 2010
WEDNESDAY, MARCH 24, 2010
5S, Lean Thinking and Project Management for Metrology Laboratories
Nat Russo • Raytheon Space and Airborne Systems
Measurement Uncertainty: Fundamental Applications and Considerations
Dilip Shah • E=mc3 Solutions
Accreditation Preparation - Accrediting Bodies and Laboratory Prospectives
Terry Burgess, Suzi Wesch • ACLASS, Davis Calibration
Temperature Calibration Uncertainty Analysis: Introduction and Overview
Ronald Ainsworth • Hart Scientific
Uncertainty Computation by Monte-Carlo Simulation and its Use in the Calibration
Software MetroVal
Alex Lepek • Newton Metrology Ltd, Israel
Optical Detectors and Laser Measurements
John Lehman, Maria Dowell • NIST Optoelectronics Division
RF Power Calibraton Techniques
Andy Brush, Charles Sperrazza, Robert Kilgore • TEGAM, Inc., Northrop
Grumman
Humidity Measurement Tutorial
Jack Herring • Michell Instruments, Inc.
Common Misinterpretations of ISO 17025 and A2LA Requirements
Pamela Wright • The American Association for Laboratory Accreditation
(A2LA)
Very Low Pressure Calibration
Mike Bair, Karl Kurtz • DH Instructions, Inc.
A Quality Calibration Program for ISO & QSR Programs
Jay L. Bucher • Bucherview Metrology Services, LLC
Paperless Records - Designing and Creating Your Own Electronic Forms
Jay L. Bucher • Bucherview Metrology Services, LLC
Liquid Flow Rate - Fundamentals
Richard Fertell • Proteus Industries, Inc.
Measuring and Test Equipment Substitution - Good Practices to Avoid Pitfalls
Graeme C. Payne • GK Systems, Inc.
Z540.3 Applications and Practices
Stephen Doty, Dennis Jackson, Del Caldwell • NSWC Corona Division /
US Navy
Effectively Managing a Metrology Lab: Skills and Activities ISO 17025 Doesn’t Define
Milton Krivokucu • California State University Dominguez Hills
Hands-on Workshop on Estimating and Reporting Measurement
Uncertainty
Will Guthrie and Hung-Kung Liu, NIST Statistical Engineering Division
MEASUREMENT SCIENCE CONFERENCE: MARCH 25-26, 2010
MSC TECHNICAL PROGRAM
Thursday-Friday • March 25-26, 2010
Accreditation to 17025 with NVLAP
Barbara Belzer, Tom Hettenhouser, Dana Leaman, and Sherrie Wentzel, NVLAP
COMPANY
TUTORIAL WORKSHOPS
Tuesday-Wednesday • March 23-24, 2010
The 2010 MSC will host the following NIST Seminars. All Seminars are two
full days long and will begin at 8:00am on Monday, March 22nd, 2010 and
end at 5:00pm onTuesday, March 23rd, 2010.
NAME
ASQ TRAINING
Monday-Tuesday • March 22-23, 2010
TUESDAY, MARCH 23, 2010
ASQ Certified Calibration Technician Exam • Refresher Workshop - Part Two
Dilip Shah, Graeme Payne • E=mc3 Solutions • (Full Day)
Improving Your Organization Through Proficiency Testing
Jeff C. Gust • MeasurePT
Analytical Chemistry for Metrologists and Engineers
Jerry D. Messman • Stranaska Scientific LLC
Calibration and Testing 101 - Back to Basics • Practical Applications of Measurement
Standard Requirements
James (Smitty) Smith, Boeing IDS • Tim Mason, Edison ESI
Accrediting a University Laboratory to ISO 17025: UC San Diego and IAS Partnership
Hershal Brewer, International Accreditation Services, Inc. (IAS)
Dan C. Radulescu, UC San Diego Engineering Department
Meter Calibration for Beginners
Mitch Johnson • Donaldson Company Inc.
Metrology Laboratory Design for Success
Doug Cooper, Matt Albright • TAC Precision Environments Group
NIST SEMINARS
Clip & Mail
NIST SEMINARS
Monday-Tuesday • March 22-23, 2010
New Metrologists
How to for Outreach Programs
Analytical Measurements
Automated Calibration Management Systems
Earned Value Management in Metrology
Lab Operations Measurement
Recall Systems
Job Opportunities in Calibration
Electrical Standards
Going “Green”
High Power CO2 Laser Calibration
How to Measure the Quality of the Workforce
Laboratory Accreditation
Legal Metrology
Measurement Assurance Programs - Liquid Flow Rate
Meeting FDA Requirments for Traceable Calibration
Metrology in Research and Testing for Public Safety
Metrology Basics
Navy Shipboard Calibration
Intrinsic Standards
Quantum Hal Resistance Standards
RF/Microwave
Statistical Process Control
Thermo Image Cameras - Uses & Hands on w/CMM
Temperature Measurements
Gas Liquid/Flow Measurements
Advanced Technologies
Environmental Testing
Accurate Noise Figure/ENR measurement
For the latest updates and abstracts go to: www.msc-conf.com
MONDAY, MARCH 22, 2010
ASQ Certified Calibration Technician Exam • Refresher Workshop - Part One
Dilip Shah, Graeme Payne • E=mc3 Solutions • (Full Day)
Clip & Mail
“GLOBAL MEASUREMENT: ECONOMY & TECHNOLOGY”
The 2010 theme is Global Measurement: Economy and Technology. In keeping
with the theme, the following topics have been selected for MSC 2010 Technical
Papers. If you are interested in participating in the tehnical program as an author or
session chair, please email Patty Leyva at: [email protected].
MSC 2010 TUTORIAL WORKSHOPS
Clip & Mail
2010
Hello, my name is John Billingsley and I will be hosting the 2010 Measurement
Science Conference in Pasadena, CA from March 22 – 26, 2010. The theme for the
2010 conference is Global Measurement: Economy & Technology.
The Measurement Science Conference was founded in 1970 to promote
education and professionalism in the measurement sciences and other related
disciplines. The conference is an annual event that provides an excellent forum
for professionals from all industries & disciplines to come together in a common
location to learn new skills, introduce measurement or business solutions, network,
see the latest Measurement & Test Equipment, and most importantly support the
continuing education that is so vital to the sustainment of the talent pool whom are
our future educators and measurement specialists.
In closing, I chose the theme “Global Measurement: Economy & Technology”
because Measurement Science is not simply making measurements. There is
a strong interrelationship between the measurements we make and the impact
they have on our economy. More than ever, as professionals in the measurement
community we need to consider not only the technical aspects of the measurements
we perform, but the economic impact they relate to as well. The
Measurement Science Conference is an excellent forum for
sharing your thoughts and I encourage your participation in the
2010 Measurement Science Conference
Hopefully you share my enthusiasm as I look forward to this
conference. See you there.
TECHNICAL PROGRAM
PRELIMINARY
CONFERENCE REGISTRATION • 2010 MEASUREMENT SCIENCE CONFERENCE • TRAINING SYMPOSIUM
MESSAGE FROM THE CONFERENCE
PRESIDENT YEAR 2010 MSC
HANDS-ON WORKSHOP (1/2 DAY): FRIDAY, MARCH 26, 2010
$395 - ON OR BEFORE FEBRUARY 28, 2010
$495 - AFTER FEBRUARY 28, 2010
Association of Measurement Professionals(AMP)
103
58
33
7
37-40
TBA
26
87-99
6
2
66
5
85
13
112
51
78, 79
WEBSITE
RH Systems
50
www.rhsystems.net
Standard Calibrations, Inc.
72
www.standardcal.com
t.a.c.
56
www.tac.com
8
TEGAM
www.tegam.com
28, 29
TestEQUITY
www.testequity.com
Tovey Engineering
15
www.toveyengineering.com
Troemner
59
www.troemner.com
Veriteq Instruments Inc.
77
www.veriteq.com
Western Environmental Corp.
90
www.westernenvironmental.com
Wilmington Instrument Company
60
www.calcert.com
WorkPlace Training
32
www.wptraining.com
MSC 2010 TIMELINE
NIST SEMINARS
Monday • March 22, 2010
7:00 AM Registraion Opens
8:00 AM NIST Seminars
Tuesday • March 23, 2010
8:00 AM NIST Seminars
ASQ-CCT TRAINING
Monday & Tuesday • March 22-23, 8:00 AM
TUTORIAL
WORKSHOPS
Tuesday-Wednesday • March 23-24, 2010
7:00 AM Registration Opens
8:00 AM MSC Tutorial Workshop
CONFERENCE
Board Treasurer
Arman Hovakemian
NSWC Corona
[email protected]
Alan Ho
The Boeing Company
[email protected]
President
Director
John Billingsley
Northrop Grumman
Space Technology Sector
[email protected]
John Bowman
Fluke Corporation
[email protected]
Executive Vice President
Bob Everly
CSC
[email protected]
Emil Hazarian
NSWC Corona
[email protected]
Board Secretary
John Schulz
JCS Engineering
[email protected]
Friday • March 26, 2010
Speakers Breakfast
Continental Breakfast
Exhibit Hall Open
Hands On Workshops
Technical Session
Morning Break
Technical Session
Luncheon • Speaker • Scholarship
Technical Session
Door Prizes
DOOR PRIZES
The Conference will end with a Door Prize Drawing supported by Exhibitors,
Sponsors and the MSC Committee. If you wish to donate, please contact:
Don Felt - [email protected].
WWW.MSC-CONF.COM
Please visit our website on a regular basis for the latest program updates,
speakers and special announcements. You can also register on the webiste
(securely) with your credit card.
Director
Nidal Kerdiya
eDoc Publish, Inc.
[email protected]
Arrangements
Frank Mendoza
Retired
[email protected]
NIST Seminars
Bob Fritzsche
NSWC Corona
[email protected]
A/V, Ancillary Meetings
Karen Jackson
GIDEP
[email protected]
Programs Lead
Patricia Leyva
NAVAIR Metrology Division Head
[email protected]
Awards
Nidal Kerdiya
eDoc Publish, Inc.
[email protected]
Programs
Mark Kaufman
NSWC Corona Division
[email protected]
[email protected]
Conference Administrator
Diana Poulton
NSWC Corona
[email protected]
Door Prizes & Exhibitor Raffle
Don Felt
Amgen, Inc.
[email protected]
e-Commerce, Intranet, Evaluations
Richard Schumacher
NSWC Corona
[email protected]
Exhibits
Muhamed Samman
GNS World
[email protected]
Finance
Alen Petrossian
American Technical Services, Inc.
[email protected]
Logistics
Rey Cheesman
NSWC Corona
[email protected]
Marketing
Tim Mason
ESI
[email protected]
NCSLI Liaison, Scholarships
Miguel Cerezo
Amgen, Inc.
[email protected]
NIST Liaison
Georgia Harris
NIST
[email protected]
NIST Liaison MSC-9TS
Gregory Strouse
NIST
[email protected]
“40 th Anniversary of MSC!”
Director, Alternate
CONFERENCE COMMITTEE
Education/Committee Support
John Fishell
Retired
[email protected]
Wednesday • March 24, 2010
Exhibits Open/Reception
Thursday • March 25, 2010
Speakers Breakfast
Continental Breakfast
General Session • Keynote Speaker
Exhibit Hall Open
Morning Break
Technical Session
Luncheon • Speaker • Woodington Award
Technical Session
Afternoon Break
Technical Session
Presidents Reception
Chairman of the Board
DATED MATERIAL
BOOTH
Public Relations
Troy Clarke
NSWC Corona
[email protected]
Publications
Doug Sugg
NSWC Corona
[email protected]
Publicity
John Schulz
JCS Engineering
[email protected]
Registration Lead
John Bowman
Fluke Corporation
[email protected]
Registration
Cindy Becker
NSWC Corona
[email protected]
Secretary
Chris Contreras
NSWC Corona
[email protected]
Site Selection
Arman Hovakemian
NSWC Corona
[email protected]
NIST SEMINARS
Monday-Tuesday, March 22-23, 2010
ASQ TRAINING
Monday-Tuesday, March 22-23, 2010
TUTORIAL WORKSHOPS
Tuesday-Wednesday, March 23-24, 2010
MSC TECHNICAL PROGRAM
Thursday-Friday, March 25-26, 2010
HANDS ON WORKSHOP
Friday, March 26, 2010
EXHIBITORS RECEPTION
Speakers
Bob Everly
CSC
[email protected]
Sponsors
Sue Slagle-Smith
Northrop Grumman Space Technology Sector
[email protected]
Tutorials/Hands On Workshops
Emil Hazarian
NSWC Corona
[email protected]
Wednesday, March 24, 2010
Global Measurement:
Economy
&
Technology
Measurements International
Michell Instruments
Navy Primary Standards Lab
NCSLI
NVLAP
Northrop Grumman
NSWC Corona Measurement Science
NSWC Corona METBENCH
NSWC Corona Product Engineering
Oak Ridge National Laboratory
Ohm-Labs, Inc.
On Time Support, Inc.
One Red X Software
Oplink Solutions, Inc.
Opto-Cal, Inc.
Paroscientific, Inc.
Pond Engineering Lab
PSNA
www.atecorp.com
www.agilent.com
www.akotorque.com
www.ametek.com
www.andeen-hagerling.com
www.ashcroft.com
www.atspage.com
www.biosint.com
www.callabmag.com
www.centellax.com
www.ceesi.com
www.4condec.com
www.crystalengineering.net
www.csc.com
www.dataproof.com
www.davidsonoptronics.com
www.daviscalibration.com
www.sce.com
www.fluke.com
www.gidep.org
www.gras.us
www.ietlabs.com
www.interfaceforce.com
www.kingnutronics.com
www.l-a-b.com
www.labx.com
www.lmco.com
www.marbleassociates.com
www.measurept.com
www.mintl.com
www.michell.com
www.navy.mil
www.ncsli.org
www.nist.gov
www.ngc.com
www.corona.navy.mil
www.corona.navy.mil
www.corona.navy.mil
www.ornl.gov/sci/metrology
www.ohm-labs.com
www.ontimesupport.com
www.1redx.com
www.oplinksolutions.com
www.optocal.com
www.paroscientific.com
www.pondengineering.com
www.primarystandards.com
EXHIBITOR
Measurement Science Conference, Inc.
1280 Bison Ave., Suite B(-530
Newport Beach, CA 92660
9
Advanced Test Equipment
Agilent Technologies
10, 11
AKO
69
Ametek, Inc
83, 84
Andeen-Hagerling
62
Heise
49
ATS
41
Bios International Corp.
96
Cal Lab
31
Centellax
30
CEESI
27
Condec
68
Crystal
98
CSC
57
Data Proof
1
Davidson Optronics
Davis Calibration
81
Edison Metrology
4
FLUKE
63, 64
Gidep
23-25, 42-44
Gras Sound & Vibration
52
IET LABS, INC.
54, 55
Interface
36
King Nutronics Corp.
97
Laboratory Accreditation Bureau
35
LABX
30
Lockheed Martin Technical
67
Marble Associates
34
MeasurePT
WEBSITE
Corporate Address:
BOOTH
MSC BOARD OF DIRECTORS
Measurement Science Conference, Inc.
1280 Bison Ave., Suite B9-530
Newport Beach, CA 92660
EXHIBITOR
MSC 2010 EXHIBITORS CONT.
Return Address:
MSC 2010 EXHIBITORS
Tel: (866) 672-6327
Fax: (951) 273-5175
www.msc-conf.com