11_presentation_Wroclaw Research Centre EIT+

DOLNOŚLĄSKIE CENTRUM MATERIAŁÓW I BIOMATERIAŁÓW
WROCŁAWSKIE CENTRUM BADAŃ EIT+
WROCLAW RESEARCH CENTRE EIT+
RESEARCH – IMPLEMENTATION – TECHNOLOGY TRANSFER
Microscopy SEM/FIB as a tool for unconventional hydrocarbons analysis
Rafał Kubik – Nanotechnology Department
Patrycja Radek – Business Development Departament
WROCŁAW RESEARCH CENTRE EIT+ LLC
EST. 2007 AS JOINT INITIATIVE OF LOCAL AUTHORITIES AND 5 LARGEST UNIVERSITIES
EUR 200 M FOR R&D INVESTMENT AND RESEARCH PROJECTS
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WROCŁAW RESEARCH CENTRE EIT+ SHAREHOLDERS
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CAMPUS PRACZE
CA. 25 000 SQ. M. OF NET SPACE
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CORE COMPETENCE EIT+
|RTO|
WRC EIT+ ACTIVITY
RTO – Research and Technology Organisation
IP – Intellectual Property
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STRIVING FOR SPECIALISATION
RESEARCH PROJECTS – SCIENTISTS – MARKET NEEDS
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ELECTRON MICROSCOPY LABORATORY
FEI Quanta 650 FEG
FEI Helios NanoLab 450HP FIB Dual Beam
SCANNING ELECTRON MICROSCOPE
FEI Quanta 650 FEG
 The only one microscope
in Poland equiped with
QEMSCAN system
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Possibility of working in 3 modes:
Environmental
Low vacuum
High vacuum
 Equiped with 2 EDS detectors
of Bruker Company
 Possibility of working in temperature scope from 25°C (Peltier cooled stage) up to 1400°C (Heating
stage system)
QEMSCAN
Quantitative Evaluation of Minerals by Scanning Electron Microscopy
QEMSCAN
Quantitative Evaluation of Minerals by Scanning Electron Microscopy
Y. Liu et al./Fuel 84 (2005)
QEMSCAN
EDITION OF MINERALS LIBRARY (SIP LIST)
QEMSCAN
Quantitative Evaluation of Minerals by Scanning Electron Microscopy
R.D.Pascoe et al./Minerals Engineering 20 (2007)
MAP OF ELEMENTS
Fe 0-20 %
MAP OF ELEMENTS
Mg 0-50 %
Quanta 650F – EDS Bruker – „Esprit”
QEMSCAN
Quantitative Evaluation of Minerals by Scanning Electron Microscopy
thomasnet.com
Qemscan WellSite
Qemscan
Electron Scanning Microscope
FEI Helios NanoLab 450HP FIB Dual Beam
 Precise imaging of samples in high vacuum up
to resolution reaching 1nm
 Equiped with ion unit enabling „shearing”
sections of samples – creating 3D models
 Creating high-resolution maps
HIGH-RESOLUTION MAPS OF SAMPLES SURFACE
Dual Beam
Helios NanoLab 450 HP
Dual Beam
Helios NanoLab 450 HP
A
B
C
D
Dual Beam
Helios NanoLab 450 HP
SAMLE PREPARATION
Leica EM TIC 3X
SAMPLE PREPARATION
 Grinding and polishing machine device
dedicated to coarse and precise cutting
 Devices dedicated to including samples in
RESIN with cold conditions in vacuum or
with warm conditions and under pressure.
 Grinding and polishing metallographical
machine
 High vacuum coater (carbon, gold,
platinum, tungsten etc.) for SEM samples
preparation
REVENUE GENERATION MODEL
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COOPERATION OPPORTUNITIES
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WROCLAW RESEARCH CENTRE EIT+
RESEARCH – IMPLEMENTATION – TECHNOLOGY TRANSFER