Workshop IV: X-ray Nano-analysis on Condensed Matter Physics

Workshop IV: X-ray Nano-analysis on Condensed Matter
Physics and Materials Science
Chair: Dr. Ching-Shun Ku (古慶順)
Name
Topic
Kai Chen
Xi'an Jiaotong Univ., China
Applications of Laue Microdiffraction to
Low-symmetry Materials and Minerals
Carol Handwerker
Purdue Univ., USA
Heterogeneous Stress Relaxation in Thin Films:
Whiskers, Hillocks, and Beyond
Ching-Shun Ku (古慶順)
NSRRC
(國家同步輻射研究中心)
The Current Status and Scientific Opportunities
for Submicron X-ray Diffraction at TPS
Wenjun Liu
Advanced Photon Source, USA
X-ray Laue Diffraction 3D Microscopy: Progress
and New Opportunities
Gema Martinez-Criado
ESRF, France
X-ray Nano-analysis Activities at the Beamline
ID16B of the ESRF
Jörg Maser
Advanced Photon Source, USA
A Next-generation Hard X-ray Nanoprobe
beamline for In-situ Studies of Energy Materials
and Devices
Volker Rose
Advanced Photon Source, USA
Synchrotron X-ray Scanning Tunneling
Microscopy (SX-STM)
Helena Van Swygenhoven-Moens
In Situ Laue Diffraction to Study Deformation
Paul Scherrer Institute,
Mechanisms in Metals
Switzerland
Gung-Chian Yin (殷廣鈐)
NSRRC
(國家同步輻射研究中心)
The Development of Hard X-ray Nanoprobe by
Montel Mirrors at Taiwan Photon Source