Master Class - IMT RAS:Welcome Page (Engl)

Comments

Transcription

Master Class - IMT RAS:Welcome Page (Engl)
Monday 30.05
10:00 – 13:00
Conference hall №1
(room 314, floor 3)
button 3 in the lift
14:30 – 19:00
19:00 – 21:00
4th Scientific School on Electron Microscopy
School for Young Scientists "Modern methods of electron and scanning
probe microscopy in studies of nanostructures and nanomaterials”.
10.00 – 11.30
Equipment installation
12.00 – 12.20 Polyakov V.V. ("NT-MDT"). “Modern methods of surface studies
using atomic force microscopy”.
Conference hall №2
(floor 11)
button 11 in the lift
14.30 – 14.55 Korenev P.A. (”SERNIA”). "The use of digital optical microscopy
for 3d modeling of samples with the developed surface”.
Round Table
15.00-18-00
1."Lithographic production" (Avi Aradjuan, Israel)
2.Prospects of fine focused e-beam application for IC development and low volume
manufacturing. V.V. Kazmiruk, I.G. Kurganov, A.A. Podkopaev, T.N.Savitskaya.(IMT
RAS).
Business area
Small conference hall
(room 413, floor 4)
Meeting of Israel companies
representatives with potential
partners in Zelenograd
button 4 in the lift
Demonstration
Hall
Open area
Master Class
Master Class
"Atomic Force Microscopy"
("NT-MDT")
"Digital 3D optical
microscopy“
(”SERNIA”)
Welcome party
Tuesday 31.05
10:00 –11:30
11:30 – 12:45
14:30 –18:00
Opening
Conference hall
№1
(room 314,
floor 3)
button 3 in the lift
of the
International
Forum
Oral presentations
SEM–2016
“Technounity
- SEM 2016"
18:00 – 19:30
19:30 –
20:00
17.40 – 18.10 Urubkov I.V.,
specialist scientific and analytical
equipment. ("Tokyo Boeki (RUS))."
New models of electron microscopes
JEOL»
18.10 – 19.00 Dr. Meiken Falke
(“Bruker”). “Element distribution
analysis from the mm scale to single
atoms; possibilities with energy
dispersive X-ray spectroscopy in
SEM and STEM.”
New methods, equipment and
applications
11.30 – 12.00 Martyn Green, global sales manager of MantisSigma holding, Ph.D.(MANTIS-SIGMA). New real time XPS
chemical analysis of reduction of Titanium Oxide and advances in
Low Temperature STM.
12.05 -12.35 Novotný Karel (TESCAN ORSAY HOLDING).
Analysis of advanced microelectronic devices by means of
electron microscopy.
Conference hall
№2
(floor 11)
button 11
in the lift
14.30 – 14.45 Milovzorov N.G. (“TESCAN”).
Nanospace - SEM with ionic column, compatible with all
installations for molecular beam epitaxy.
14.50 – 15.05 Trusov M. A., head of Raman / AFM ( “Nytek
Instruments”). Raman / AFM spectroscopy of carbon structures
on the nanoscale.
15.05 – 15.30 Trusov M. A., head of Raman / AFM ( “Nytek
Instruments”). Systems for cathodoluminescence from HORIBA
Scientific: a description of the advantages and application
examples for the study of semiconductors and nanomaterials.
15.30 – 16.00 Bykov V.A. , president of NT-MDT companies
New possibilities of scanning probe microscopy and spectroscopy
16.00 – 18.00
Round table
The use of metrology
Среда Wednesday 01.06
10:00 – 13:00
14:00 – 18:00
18:00 – 19:30
17.45–18.10
Hans
Dijkstra,
ведущий
специалист
по
микроанализу
Thermo
Scientific (Thermo Scientific). "The Analysis of
Mo5SiB2 in the SEM using EDS and WDS"
Conference hall
№1
(room 314,
floor 3)
Oral presentations
SEM–2016
button 3 in the lift
18.15–18.35 Neudachina V.S., head of
"Analysis of surfaces and nanostructures"
(INTERTECH Corp.). "Photothermal excitation
of the cantilever as a revolutionary approach to
obtainn AFM images of the highest resolution."
18.40–19.00 Lukashova M.V. (“TESCAN”).
“Experience in the use of ionic column dualbeam scanning electron microscope for
precision-EBSD sample preparation”.
Presentations of companies
11.00–11.25 Milovzorov N.G. (“TESCAN”). "Scanning electron
microscopes TESCAN»
11.30–11.50 Kozlov V. V., head of the Moscow office of the Oxford
Instruments Overseas Marketing Ltd.
"Systems of electron probe microanalysis of the Oxford Instruments
company“.
Conference hall
№2
(floor 11)
11.50–12.15 Kozlov V. V., head of the Moscow office of the Oxford
Instruments Overseas Marketing Ltd.
"Application of the Kikuchi diffraction for crystal structure diagnostics of
rare and new minerals."
button 11
in the lift
12.20–12.45 Khanin V.A. (“Melytec”). "Phenom XL - a novelty in the
desktop SEM FEI Helios Plasma FIB for microelectronics“.
14.00–14.25 Kapchenko I.V., head of ERCATA GmbGH. Materials for
Advanced Metallization, Challenges, Tools and Technoogies.
14.35
Round Table
“Presentation of the product
on the international market"
(JS-Capital, Israel)
Application of the cathoderay microscopy equipment
19:30 –
20:00
Friday 03.06
Thursday 02.06
10:00 – 13:00
Conference hall
№1
(room 314,
floor 3)
14:30 – 18:10
Oral presentations
SEM–2016
19:00 +
10:00 – 14:00
Oral
presentations
SEM–2016
Oral
presentations
SEM–2016
button 3 in the lift
New methods, equipment and applications
Conference hall
№2
(floor 11)
button 11
in the lift
Small conference
hall
(room 413,
floor 4)
button 4 in the lift
Demonstration
10.00 – 10.20 Shelaev A.V. (NT-MDT). Near field IR-microscopy and
spectroscopy with nanometer resolution.
10.20 – 10.40 Gelever V.D. (MSTU MIREA). Low voltage hybrid nanoscope.
10.40 – 11.00 Starkov V.V. (IMT RAS). Technological aspects of achievement,
properties and application of porous Silicon.
11.00 – 11.30 Fedik I.V. (CAMECA). Atomic probe tomography and secondary
ions mass spectrometry in investigation of nanoscaled systems.
10.00-11.30
14.00-18.10
Round table
Oral presentations at the
biological section
(11 section)
Discussion of joint
projects in biomedicine
and other areas
11.30-13.00
Round table
Discussion of joint
projects in
microelectronics and
ECB
18.10
Roundtable - biological
section
(11 section)
Master Class
Master Class
"Atomic Force
"Digital 3D optical
Closing
of the
International
Forum
“Technounity
- SEM 2016"

Similar documents