New Features Streamline Your Workflow and Support

Transcription

New Features Streamline Your Workflow and Support
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Copyright © 2015, Zemax LLC. All rights reserved.
Specifications are subject to change without notice. OpticStudio is a registered trademark of Zemax LLC.
What’s New
New Features Streamline Your Workflow
and Support Manufacturability
New features to expand support
of the entire engineering design process
All New Tools
About OpticStudio
• Critical Rayset Generator Tool
Available in the Premium and Professional Editions. This tool will create a
set of reference rays that can be traced in non-sequential mode. These rays
are useful in order to verify system performance in the presence of optomechanical changes made in non-sequential mode. The Critical Raytracer Tool
is used to trace these rays in non-sequential mode.
Zemax puts quick, accurate design tools into the hands of optical engineers
with OpticStudio™ to drive faster innovation while reducing development
costs. OpticStudio is the industry standard optical and illumination design
software that supports the design process from end-to-end:
•Analysis Tools - bring your ideas to life with a single, seamless software
platform that includes the industry’s most comprehensive set of analysis
and simulation tools to create/improve both sequential and nonsequential models
•Optimization Tools - automatically improve the performance of your
optical/illumination design based on parameter constraints you define,
saving you time by eliminating manual tests of design iterations
•Tolerancing Tools - advanced tools and features that help design
engineers incorporate manufacturing and assembly limits into design
constraints to ensure manufacturability and production efficiency
The Industry’s Best Value
•Minimal Learning Curve – the industry’s most intuitive user interface
minimizes unproductive downtime
•Flexible Licensing – perpetual software license agreement in three (3)
different Editions, and as single-user or multi-user network license
•24/5 Worldwide Technical Support – provided by a global team of
Optical Engineers with a 95%+ customer satisfaction rating
•Industry Leading In-Person Training – taught by the world’s foremost
OpticStudio experts available through pre-scheduled events around the
globe throughout the calendar year
•Enterprise Level Programs – custom configured programs for multi-user
accounts available
•In-program tutorials and help – fast, easy access help when you need it
most with tutorials and interactive help files embedded in the software
•Minimal Software Investment Risk – 30-day money back guarantee
minimizes the risk of ownership by enabling accurate, real-world
evaluation
• Incorporate Manufacturing Aspects Into the Design
New Opto-Mechanical Semi-Diameter feature improves simulation and
modeling by incorporating mounting edges and chip zones required for lens
manufacture. Optical design engineers can now accurately define surfaces
that extend beyond the clear aperture.
• Accurately Simulate Opto-Mechanical Performance
New fully-instrumented non-sequential component (NSC) conversion tool
easily converts designs from sequential to non-sequential mode creating
field points and detectors to simulate optical performance in non-sequential
mode. Stray light and scatter analysis for opto-mechanical designs can now be
done quickly and easily.
• Seamless Sequential to Non-Sequential Transition
New Design Lockdown Tool and Critical Rayset Generator automatically
performs multiple operations to prepare a sequential optical system for
production, or for opto-mechanical analysis and production, eliminating the
need to reconfigure data for import to a separate software program.
• Analyze Diffractives and Holograms Accurately
Now analyze beam profiles both near and far from focus with the Huygens
PSF calculation that supports a spherical wavelet construction basis. Discrete/
pixelated diffractive and hologram surfaces can be analyzed accurately using
this enhanced feature instead of traditional physical optics propagation.
• Measure Light on Any Object
Enhanced Object Properties feature now includes a simple check box option
that enables light measurements on any object and can be viewed in the
Shaded Model Layout or as text listings in the Detector Viewer. Users can now
visualize and optimize illumination of target areas including complex areas
with multiple objects.
• Single User Soft-Key Licensing Improves Mobility
Completing our transition to soft-key licensing OpticStudio 16 is now
delivered to single-users via an electronic activation code, eliminating the
traditional USB dongle. New users don’t need to worry about losing their
OpticStudio key and existing users can upgrade to a new soft-key.
• Work Faster with Expanded Resource Libraries
New LuxExcel material catalog for 3D printed optics, a new Nihon Kessho
Kogaku material catalog, and updated Schott and Ohara material catalogs.
• Design Lockdown Tool
Available in the Premium and Professional Editions. This tool automatically
performs a number of operations needed to prepare a sequential optical
system for opto-mechanical analysis and production. The tool will convert
semi-diameters to fixed apertures, replace vignetting with fixed apertures,
switch from image-based to object based field definitions, remove solves, and
round thickness values.
• Auto-Calculated Pupil Shift Factors
Pupil shift factors used with ray aiming are now automatically calculated and
prepopulated in the appropriate fields. The values are calculated based upon
the difference between the location of the real and paraxial entrance pupils.
These values can be overwritten by the user if necessary.
• NSC Critical Raytracer Tool
Available in the Premium and Professional Editions. The NSC critical raytracer
tool traces critical raysets saved using the Critical Rayset Generator. A text
listing is generated providing a quick pass/fail diagnosis comparing the critical
rayset position and direction in sequential mode to non-sequential mode.
These raysets are intended to be used to validate the performance impact of
opto-mechanical components added in non-sequential mode.
• Fully Instrumented NSC Converter
Available in the Premium and Professional Editions. The NSC conversion tool
has been improved to create sources and detectors that enable simulation of
spot diagrams and extended scenes. This option is only available if converting
to pure NSC. When selected, source points and detectors corresponding the
defined field points are generated. In addition, if the object surface is at finite
conjugates, a slide object and extended detector are defined for extended
scene analysis. This capability is useful for determining what impact stray light
and opto-mechanics have on imaging performance.
New tools and faster UI responsivity
to improve your productivity
Programming Extensions
User Interface Improvements
New Analyses
Multiple additions to the Zemax Programming Language relate to the new
Opto-Mechanical Semi-Diameter feature.
Analysis window updates have been optimized to more quickly return UI
control to the editors.
The Huygens PSF calculation now supports a spherical wavelet
construction basis that significantly expands the range of optical systems
in which ray-based diffraction calculations can be performed. The image
below is a phase map of a computer generated hologram (CGH) that
encodes a tachometer display.
• ZPL Opto-Mechanical Semi-Diameter Commands
• SURP Keyword: set the Chip Zone and Mechanical Semi-Diameter on any
surface.
• CHZN(n) Numeric Function: get the Chip Zone on any surface.
• MCSD(n) Numeric Function: get the Mechanical Semi-Diameter on any
surface.
• Faster Analysis Window Updates
• Keyboard Shortcuts in Tooltips
Keyboard shortcuts are now shown in the tooltip that is displayed when
hovering over the icon of any tool or analysis. These shortcuts will update
accordingly if the user defines custom keyboard shortcuts in the Project
Preferences.
• Huygens PSF Spherical Wavelet Construction
• Detector Viewer Spot Size Values
Available in the Premium and Professional Editions. The detector viewer
now displays additional spot size values when displaying data on a detector
rectangle or the detector color. The calculated values are RMS spot radius,
RMS spot X & Y widths, and X & Y centroid location. These values could
previously only be obtained via the NSDD and NSDE operands in the merit
function. The values are provided in a new Beam Info tab at the bottom of the
detector viewer window.
• OCOD/OPEV Updates: work with new operands OMSD, OMMI, and
OMMX.
The phase is so complex, that it looks like random noise. Applying this
phase profile to a grid phase surface (added in OpticStudio 15.5), the
Huygens PSF can be used to render an image of the tachometer.
• Multi-Threaded Diffraction Encircled Energy
• Improved ALT Key Shortcuts
The diffraction encircled energy analysis is now multi-threaded for faster
analysis and optimization.
Analysis windows now support ALT key shortcuts. Using these shortcuts,
windows can be updated, settings can be opened, and focus can switch from
graph to text views
• API Opto-Mechanical Semi-Diameter Commands
Multiple additions to the ZOS-API relate to the new Opto-Mechanical SemiDiameter feature.
• ILDERow Properties: sets and gets Chip Zone and Mechanical SemiDiameter on any surface.
• SemiDiameterMarginsForThisSurface Boolean for Aperture: toggles
the Disable Semi-Diameter Margins for this Surface option in the Surface
Properties dialog.
• Detector Polar Output in ZOS-API
Detector polar data can be accessed via the ZOS-API using the
GetPolarDetectorData method. This allows users to more easily post-process
data from light collected on polar detectors.
Expanded Surfaces & Objects
• New File Syntax Highlighting
Syntax highlighting for POB (polygon object), ZMM (POP multimode beam),
DAT (coatings), and TSC (tolerance script) files. This highlighting is available
when editing these files in the built-in text editor in OpticStudio. Syntax
highlighting makes file syntax more readable and reduces the likelihood of
syntax errors.
• Additional NSC objects as detectors
The decision to use the default planar wavelet construction basis or new
spherical wavelet construction basis is determined automatically for
maximum accuracy. Systems that don’t form diffraction limited point
images can now use this analysis. One specific class of newly supported
systems is discrete/pixelated diffractive and hologram surfaces. These
optical surfaces are often used to generate very complex, diffraction-based
light distributions. They can even be used to form extended images from
collimated input.
In addition, users can now analyze beam profiles, both near and far from
focus. In this respect, the analysis shares some similarities with physical
optics, however with much faster computation speeds in certain systems.
Specifically, optical systems with large numbers of surfaces may benefit
from this calculation, whereas previously physical optics was required to
get an accurate simulation.
Most non-sequential objects now support the option to be used as detectors.
If the option is supported the “Object is a Detector” checkbox will be enabled
in the Type tab of the Object Properties dialog. Data collected on detector
objects can be viewed in the Shaded Model Layout or as text listings in the
Detector Viewer. The pixelation of detector objects is defined by the drawing
resolution defined in the Draw section of the Object Properties dialog.
New programming flexibility and small
improvements make optical design easier
Expanded Surfaces & Objects (cont.)
• Opto-Mechanical Semi-Diameters
Available in the Premium and Professional Editions. Sequential surfaces now
support a more realistic definition of surface aperture: Semi-Diameter (clear
aperture), Chip Zone, and Mechanical Semi-Diameter. The Semi-Diameter
functions the same as in previous releases, with the same optional margin
applied as specified in the System Explorer. The Chip Zone represents a buffer
region of the surface that follows the Semi-Diameter curvature. This region is
usually a coating falloff area and isn’t held to tight tolerances. The Mechanical
Semi-Diameter is used to define the mounting edge of the surface. Using this
diameter, users can add flat and angled flanges to lenses without having to
resort to dummy surfaces.
• Edge Apertures for NSC Even Asphere Lens
More Reference Libraries
General Improvements & Fixes
• The Code V to OpticStudio Converter macro has been updated to
Available in the Premium and Professional Editions. The NSC Even Asphere
lens supports an Edge diameter, similar to the Standard Lens. This was added
to support conversion of sequential even asphere lenses with Mechanical
Semi-Diameters defined. These edge regions of lenses are very important for
comprehensive stray light analysis.
version 1.40. The new version now supports correct conversion of
decentered circular apertures.
• Ray Aiming has been improved to better account for coordinate
break surfaces at the front of the optical system as a part of the
iterative algorithm for determining the launch points of the rays.
• An issue calculating the phase slope for the Zernike Annular Phase
• Updated Schott and Schott IRG Material Catalogs
These new diameters are accounted for across a range of features: thermal
modeling (new multi-configuration operands), optimization (new operands),
sag computations, manufacturing drawings, and the cost estimator. The
cost estimator will incorporate these diameters into the estimates provided.
The ISO element drawing will also incorporate the new diameters when
generating drawings. For stray light modeling purposes, the Standard and
Even Asphere surfaces will convert to NSC with the Mechanical Semi-Diameter
defined properly.
Two updated material catalogs from Schott have been added, including
updated relative price information, and an IRG catalog with thermal data for
infrared glasses. SCHOTT is a leading international technology group in the
areas of specialty glass and glass-ceramics. The company has more than 130
years of outstanding development, materials and technology expertise and
offers a broad portfolio of high-quality products and intelligent solutions.
SCHOTT is an innovative enabler for many industries, including the home
appliance, pharmaceutical, electronics, optics, automotive and aviation
industries.
surface which resulted in incorrect ray tracing has been corrected.
• The data in the Text tab of the FFT Line/Edge Spread Function now
agree with the data shown in the Graph tab, and are no longer
always normalized to unity.
• An issue with the Internal Transmission vs. Wavelength plot has been
corrected for cases when a table glass is used for the input to the
analysis.
• Updates have been made to the Test Plate Fitting algorithm to correctly account for the sign of the curvature and for the units of the
lens system when replacing an optimized Radius value with a value
from a test plate catalog.
• The SHA_ROTX and SHA_ROTZ inputs to the ZPL keyword MOD• New Catalog for 3D Printed Optics
Soft-Key Licensing & Installation
• Single User Soft-Key Licensing Improves Mobility
Single user softkey licensing is now available and allows users to digitally
activate OpticStudio as opposed to using a hardkey (USB dongle) for
authentication. The softkey license uses an activation code, obtained from
Zemax, that ties the license to a specific machine. The license can be easily
transferred from one machine to another. Activation, transfer, and update
of softkey licenses is managed through the License Manager. This capability
opens the door for running OpticStudio on virtual and cloud based machines
that don’t have USB ports.
Softkey licenses can only be used with OpticStudio 15.5 and newer versions
of the software. If you are interested in exchanging your existing hardkey for a
softkey license, contact Zemax sales ([email protected]).
• Expanded Multi-User License Management
The license manager for multi-user network licenses has been enhanced
to recognize black hardkeys (USB dongle) in the license manager alongside
the new softkey licenses. Upon launch of OpticStudio,the option to start
the License Manager to activate a softkey license or troubleshoot problems
will appear. A new Help tab has been added to the License Manager with
information about the different types of licenses OpticStudio supports and
relevant installation help resources.
IFYSETTINGS now result in rotations about the X and Z axes in
the Shaded Model, respectively (the functionality was previously
swapped, so that SHA_ROTX resulted in a rotation about Z and
SHA_ROTZ resulted in a rotation about X).
A new LuxExcel material catalog has been added. The catalog contains
LuxExcel’s primary material for 3D printed optics: LUX-Opticlear. For more
information, see LuxExcel’s website that includes design guidelines. When
conveying designs for 3D printing, the STL and STP CAD formats are preferred.
OpticStudio supports STL and STP export via the CAD Export tool.
• Selection of a Reference Glass has been added back to the Athermal
• New Nihon Kessho Kogaku Material Catalog
• An issue relating tor XY-plots has been corrected in which manual-
A new material catalog from Nihon Kessho Kogaku has been added. Crystals
for semiconductors and TV cameras, Scintillator and detectors for medical and
security, NK&K provides various products to several markets. Our motto is
“Small but shining in the world”.
• Updated Ohara Material Catalog
An updated material catalog from Ohara has been added. In particular,
this catalog contains new glasses S-LAH53V and S-LAH60V. For more than
70 years, Ohara has been building a reputation as one of the finest optical
glass manufacturers in the world. A key supplier of optical glass blanks, glass
ceramics, polished substrates and metrology services Ohara provides critical
materials to the technology leaders in numerous fields including photography,
microlithography, astronomy, telecommunications and data storage. The
Ohara Group services our customers requirements from manufacturing and
sales facilities located in Japan, Taiwan, Malaysia, Germany, China and the
United States. Currently Ohara melts over 300 tons of glass and produce more
than 25 million pressings per month.
Glass Map.
• Issues in which the Spot Diagram output series could be incorrectly
labelled and colored have been corrected.
ly editing the min/max axis limits via the context menu would not
rescale properly until after a calculation update.