ULTIMA2 Brochure

ULTIMA 2
The Ultimate in ICP-OES
High Performance in ICP-OES
High Quality Spectrometer
Analyst Software
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Ultima
ULTIMA
22
High performance in ICP-OES
ULTIMA 2 ICP Optical Emission Spectrometer
combines simplicity and high performance
ULTIMA 2 is based on a versatile platform
to match actual and future needs of your
laboratory. The knowledge of HORIBA Scientific
in manufacturing ICP-OES and high quality
optics were combined to provide the highest
performance in ICP-OES.
ULTIMA 2 is the only instrument able to provide
an analytical answer for almost any matrix.
RESOLUTION
The one meter focal length monochromator
associated with the high density holographic
grating and advanced PMT detection offers
the best resolution achievable. Less than 5
picometers are achieved in the 160-320 nm
range and less than 10 picometers in the 320800 nm range. Resolution shortens the time
needed for method development, even for
difficult matrices.
Cd 228.802 nm & As 228.812 nm in soils
Cd
Cu 324.754 nm in Co 10 g/L
Cd 228.802 nm in Co 10 g/L
As
Cu
228.791
228.802
228.813
228.823
Cd
324.711
324.732
324.754
324.776
324.797
228.756
228.779
228.802
228.825
228.840
The highest performance is
offered with an easy to use
instrument
SENSITIVITY
The total plasma view concept, using a vertical
torch and radial viewing with the measurement
of the whole Normal Analytical Zone allows
running the most difficult matrices with the
highest performance due to low matrix effects
and enhanced sensitivity. Radial viewing
reduces matrix effects, simplifying the analysis
and improving detection limits in real samples.
Detection limits in µg/L
H
He
Li
Be
B
0.5
0.05
0.3
Na
Mg
0.6
0.03
N
C
O
F
Ne
Ar
Al
Si
P
S
Cl
0.2
1.3
1.5
1.5
200
K
Ca
Sc
Ti
V
Cr
Mn
Fe
Co
Ni
Cu
Zn
Ga
Ge
As
Se
Br
1.5
0.03
0.09
0.2
0.2
0.2
0.05
0.2
0.2
0.3
0.2
0.2
2.6
2.5
1.2
1.1
100
Tc
Ru
Rh
Pd
Ag
Cd
In
Sn
Sb
Te
I
1.5
3
1.1
0.6
0.1
1.4
1.3
1.5
2.2
10
Pt
Au
Hg
Tl
Pb
Bi
Po
At
Kr
Xe
Rb
Sr
Y
Zr
Nb
Mo
6
0.03
0.2
0.3
0.9
0.2
Ta
W
Re
0.9
0.13
Os
Ir
Pm
Sm
Eu
Gd
Tb
Dy
Ho
Er
Tm
Yb
Lu
1.2
0.15
0.8
0.9
0.5
0.35
0.7
0.3
0.06
0.08
Np
Pu
Am
Cm
Bk
Cf
Es
Cs
Hf
Ba
3.2*
0.04
Fr
Ra
1
0.9
2
La
Ce
Pr
Nd
0.6
1.5
1.7
0.9
Ac
Th
Pa
1.9
U
1.4
2
1.3
0.6
1.3
1
1.5
2.6
Rn
* concentration in mg/L
VERSATILITY
ULTIMA 2 can be tailored to your specific needs.
The Far UV kit allows measuring wavelengths
down to 120 nm, offering halogens analysis
capability and the use of alternative wavelengths
for many elements.
High resolution can be extended to 430 nm
using the dual back-to-back gratings option.
Upgrade with a polychromator is also available,
providing simultaneous measurement for
unattended productivity and performance.
Nd in Pt 20 g/L
Nd
Cl 134.664nm in oil
Cl
134.604
134.634
134.664
134.694
134.724
401.210
401.230
401.250
ULTIMA 2
High quality ICP-OES Spectrometer
Excellence in ICP-OES design with attention
on every component
•
Spacious sample introduction area with
corrosion resistant sample tray for the
analysis of all types of samples and for the
use of a wide variety of sample introduction
systems.
•Quick release and quick mount torch design
in a large plasma compartment with no
adjustment required. Multi-user operation
is thus facilitated, providing excellent
reproducibility.
• Vertical torch and Total Plasma View concept
providing optimum sensitivity and reduced
matrix effects, for both aqueous and organic
matrices. The original sheath gas device
and the large 3 mm i.d. injector tube gives
unique high dissolved solids capability, up to
30% NaCl, with excellent long-term stability,
minimized memory effects and with no
compromise in performance.
•
High efficiency 40.68 MHz solid state
generator enhancing ability to handle a large
range of applications and improving the limits
of detection. Water cooling ensures improved
reliability, stability and a reduced warm-up
time, usually less than 15 minutes.
User oriented design for
ease of use and high
technology for unrivaled
performance
•The 2400 g/mm holographic grating used in
the 1st and the 2nd orders offers constant
spectral resolution and full wavelength
coverage over the spectral range. The
optical resolution is less than 5 pm in the
160-320 nm range and less than 10 pm in
the 320-800 nm range. Using the optional
dual back-to-back gratings (4320 g/mm and
2400 g/mm used in the 1st order) allows an
optical resolution of less than 6 pm in the
160-430 nm range and less than 10 pm in
the 430-800 nm range.
•
The dual PMT detection system offers
optimum sensitivity according to the
wavelength range. Optional Far UV detector
allows reaching high sensitivity down to
120 nm.
Unique PMT technology dedicated to ICP-OES
High precision can be obtained using the true
simultaneous measurement of an internal
standard, only available with PMT detectors.
This measurement can be done on a dedicated
reference monochromator or on the optional
polychromator.
Cd from 0.001 to 1000 mg/L
1 000 000 000
10 000 000
Intensity (c/s)
ULTIMA 2 is equipped with the patented High
Dynamic Detection system, exclusively
available from HORIBA Scientific. The dynamic
range is enhanced, with up to 10 orders of
magnitude. The adjustment of the gain is done
within milliseconds without hysteresis, allowing
full spectrum acquisition in less than 3 minutes.
Measurement of trace and major elements is
possible in a single run for qualitative and semiquantitative analysis purposes using optional
Image Navigator.
The use of PMT detection provides unique
advantages such as UV sensitivity without
any coating of the detector that can reduces
lifetime. Detection of halogens and alternative
lines in the Far UV has never been so easy.
The high sensitivity of PMT detectors reduces
analysis time by using short integration times,
even for trace analysis.
100 000
1 000
0.001
0.01
0.1
1
10
100
1000
Concentration (mg/L)
Saturation of high concentrations
Classical PMT: To see the signal of a
major element at high concentrations,
gain is lower and trade concentration
are non-detectable.
Relative intensity
Poor sensitivity, trace
element non-detected
Measurement of high concentration
with no saturation
Relative intensity
Relative intensity
Measurement of high concentrations
Sensitivity for trace
analysis
Sensitivity for trace analysis
HDD: Tailored sensitivity to the
signal present, allowing the
detection of trace and high
concentrations in the same
acquisition without saturation or
loss of sensitivity
Classical PMT: To see the signal of
a trace concentration, gain is raised
and high concentrations saturate.
ULTIMA 2 offers productivity and unrivaled performance
NaCI 30 % over 5 hours
1.10
1.06
Normalized Intensity
The design of ULTIMA 2 allows reduced matrix
effects, high sensitivity and enhanced stability,
even with difficult matrices. To obtain this high
level of performance, every component has
been optimized to its best. The original sheath
gas device, the 3 mm i.d. injector, the vertical
torch with radial viewing and Total Plasma
View concept, the size and quality of optical
components and the detection system. Each
component is integral to the high performance
offered by the ULTIMA 2.
Productivity is ensured by short integration time
due to high sensitivity, by stability avoiding
frequent periodic recalibrations and by high
dynamic range avoiding dilution of the samples.
1.02
0.96
0.94
0.90
0
1
2
4
3
5
Time (hours)
Al 167.020
Ca 393.366
Sr 407.771
V 292.402
K 766.49
M, 257.610
Si 251.611
Analyst Software
ULTIMA 2
Analyst software extends instrument capability and
ensures traceability
•Analyst provides a data audit trail for users
and instrument operation. 21 CFR Part 11
compliance is obtained through a powerful
SQL Server database ensuring integrity of
raw data and traceability of operations.
•
Enhanced productivity with automated
analysis thanks to multiple methods
sequence, programmable recalibration and
automated QC checks with user defined
actions, in combination with the autosampler.
•
User rights management is available for
enhanced security and management of
access levels for each analyst.
•Import and export of data from LIMS with a
large variety of report and exports formats
for results.
•
Automatic start up and shutdown afford
flexibility of use and reduces argon usage.
• Semi-quantitative analysis using full spectrum
acquisition and Image Navigator.
•Statistical Process Control included for X, R,
SD and histogram charts for user-selected
samples.
Multi-method sequences automate the analysis. Automatic
tasks such as QC, recalibration, standard additions and
blanck substraction can be inserted into the sequence
with the click on a button.
Advanced tools are
provided by Analyst,
Image Navigator and CLIP
Qualitative and semi-quantitative analysis with Image Navigator
Image Navigator is used to display the full
spectrum acquired on the ULTIMA 2 and
offers unique features for high resolution ICP
spectrometers thanks to its library containing
over 25 000 lines.
The display of spectra is possible, allowing
careful visual inspection, line selection according
to spectral interferences and comparison of the
fingerprint between several samples.
• Qualitative analysis based on the identification
of the most sensitive lines for each element.
•Semi-quantitative analysis using the library
or a reference spectrum.
As the full spectrum is stored in a file,
retrospective analysis is always possible to
confirm a result or to find the result for other
elements.
CLIP: Collection of Line Intensity Profiles
Line selection is the crucial part of method
development. As high resolution ICP-OES are
often dedicated to the analysis of complex
matrices with more risk of spectral interferences,
this step can be difficult and time consuming.
Using the CLIP will shorten the time needed for
line selection and enhance the reliability of the
resulting method.
CLIP stands for Collection of Line Intensity
Profiles. The CLIP is dedicated to the PMTbased instruments of the ULTIMA 2 Family and
can be used with older instruments.
Using the proprietary ICP-based S3-base
wavelength database, containing wavelengths
and detection limits, allows the analyst to ensure
that lines, sensitivity and relative intensities are
really close to what will be observed on the
instrument. Profiles of each line are calculated
according to the instrument settings (focal
length, slit combinations, grating(s), order
used) and are displayed.
As the display allows the analyst to look at each
individual spectrum and also at the total
spectrum, he can easily validate a line for the
analysis.
More-over, the display of the various slit
combinations can validate the best combination
that can be used. The CLIP, based on theoretical
calculations of the profiles reduces the need to
prepare various solutions and to perform many
profiles.
The benefits of CLIP are:
`` Help for line selection
This is an efficient tool to select lines for analysis
in complex matrices and to select the optimum
slit combination.
`` Save time
It reduces the time needed for method
development due to reduced solutions
preparation and reduced time for profiling lines.
`` Allows you access to new markets
The method development for new applications
is easy and fast
Zoom of lines list
in green: validated
in red: rejected
Line proposition with CLIP
Line zoom
TECHNICAL SPECIFICATIONS
Options
Generator
Cooling system
Exhaust Plasma
Sample introduction
• D
ual back-to-back gratings (4320 g/mm and 2400 g/mm) used in the 1st
order offering resolution < 6 pm for 160-430 nm and < 10 pm for 430-800
nm.
• Far UV kit for sensitive measurement of wavelength down to 120 nm
• AS-500 Autosampler with optional rinse station
• Ar humidifier
• Micro/high dissolved solids/inert material/iorganic nebulizers
• Scott/HF resistant/cooled spray chambers
• Ultrasonic nebulizer
• CMA for simultaneous measurement of hydride forming elements and other
elements
• Oxygen kit for organic samples
• Laser ablation system
Optical system
Wavelength range Detection
Radio frequency, solid-state
40.68 MHz, water cooled
GenCo water chiller for the generator
and the coil
Direct exhaust connection for
plasma compartment
Fully demountable torch, 3 mm i.d.
injector, 12 L/min plasma gas,
0.2 L/min sheath gas
Concentric glass nebulizer and glass c y clonic spray chamber, 3-channel peristaltic
pump (4-channel optional)
Thermo-regulated, 1 meter focal length, 2400
g/mm grating used in the 1st and 2nd order with
optic resolution < 5 pm for 160-320 nm and
< 10 pm for 320 - 800 nm.
160-800 nm (optional 120-800 nm with far UV
kit)
Dual PMT detection with High Dynamic Detection system (HDD®)
PHYSICAL DATA
Depth
Width
Height Weight
Power
Cooling water
Argon
Nitrogen
Exhaust Environmental
698 mm (27.5 in)
1696 mm (66.8 in)
604 mm (23.8 in)
205 kg (452 lb)
Single phase, 220-240 V, 50/60 Hz, 4 kVA
2 to 3 L/min, 2 bars
99.995% purity
160 to 190 nm, 99.999% purity
120 to 160 nm, 99.9995% purity
250 m3/h (150 cfm)
20 to 80% humidity, 18-24 ± 2°C
www.horiba.com/scientific
France: HORIBA Jobin Yvon S.A.S., 16-18 rue du Canal, 91165 Longjumeau cedex - Tel: +33 (0)1 69 74 72 00 - Fax: +33 (0)1 69 09 07 21 - Email: [email protected]
USA:
HORIBA Instruments Inc., 3880 Park Avenue, Edison, NJ 08820-3012 - Toll-free: +1-866-562-4698 - Tel: +1 732 494 8660 - Fax: +1 732 549 5125 - Email: [email protected]
Japan:
HORIBA Ltd., Tokyo Branch Office, 2-6, KandaAwaji-cho, Chiyoda-ku, Tokyo 101-0063, Japan - Tel: +81-(0)3 6206 4721 - Fax: +81 (0)3 6206 4730 - Email: [email protected]
Germany: HORIBA Jobin Yvon GmbH, Hauptstrasse 1, 82008 Unterhaching - Tel: +49 (0)89 4623 17-0 - Fax: +49 (0)89 4623 17-99 - Email: [email protected]
Italy:
HORIBA Jobin Yvon Srl., Via Cesare Pavese 21, 20090 Opera (Milano) - Tel: +39 2 5760 3050 - Fax: +39 2 5760 0876 - Email: [email protected]
UK:
HORIBA UK Ltd., 2 Dalston Gardens, Stanmore, Middlesex HA7 1BQ - Tel: +44 (0)20 8204 8142 - Fax: +44 (0)20 8204 6142 - Email: [email protected]
China:
HORIBA (China) Trading Co. Ltd., Unit D 1F, Bldg A, Srynnex International Park, No. 1068 West Tianshan Road, Shanghai 200335 - Tel: +86 (0)21 6289 6060 - Fax: +86 (0)21 6289 5553
Email: [email protected]
Brazil:
HORIBA Instruments do Brasil Ltda., Av. das Nações Unidas, 21.735, Bairro Jurubatuba, São Paulo CEP 04795-100 - Tel: +55 (0)11 5545 1500 - Fax: +55 (0)11 5545 1570
Email: [email protected]
Other:
Tel: +33 (0)1 69 74 72 00 - Email: [email protected]
Explore
Explore
the
the
future
future
| Process
| Process
| Medical
| Medical
| Semiconductor
| Semiconductor
| Scientific
| Scientific
Automotive
Automotive
Test
Test
Systems
Systems
& Environmental
& Environmental
This document is not contractually binding under any circumstances - Printed in France - ©HORIBA Jobin Yvon 02/2013
Refer to ULTIMA 2 Pre-installation Guide for more details.