N5990A User Guide for USB

Transcription

Keysight N5990A
Test Automation
Software Platform for
USB
User Guide
Notices
Copyright Notice
© Keysight Technologies 2015-2016
No part of this manual may be reproduced in any form or by any means
(including electronic storage and retrieval
or translation into a foreign language)
without prior agreement and written consent from Keysight Technologies, Inc. as
governed by United States and international copyright laws.
Manual Part Number
N5990-91030
Edition
Edition 5.0, July 2016
Published by:
Keysight Technologies
Deutschland GmbH,
Herrenberger Str. 130,
71034 Böblingen, Germany
Technology Licenses
The hardware and/or software described
in this document are furnished under a
license and may be used or copied only
in accordance with the terms of such
license.
U.S. Government
Rights
The Software is “commercial computer
software,” as defined by Federal Acquisition Regulation (“FAR”) 2.101. Pursuant
to FAR 12.212 and 27.405-3 and Department of Defense FAR Supplement
(“DFARS”) 227.7202, the U.S. government acquires commercial computer
software under the same terms by which
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the public. Accordingly, Keysight provides the Software to U.S. government
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(EULA), a copy of which can be found at
http://www.keysight.com/find/sweula
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Safety Information
CAUTION
A CAUTION notice denotes a hazard. It
calls attention to an operating
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not correctly performed or adhered to,
could result in damage to the product
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proceed beyond a CAUTION notice
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A WARNING notice denotes a hazard. It
calls attention to an operating procedure,
practice, or the like that, if not correctly
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and met
Contents
Contents
Contents
1
Introduction
1.1
What’s in This Chapter
1.1.1
1.2
2
Document History 7
Test Automation Software Platform 9
Test Station Configuration 11
3.1.1
3.2
3.3
Using Keysight IO VISA Connection Expert
Starting Test Station
3.2.1
3.2.2
3.2.3
15
17
Configuring DUT 17
Selecting, Modifying & Running Tests 19
Results 23
Oscilloscope Transmitter Test Integration
3.3.1
3.3.2
27
Using the Software 27
Troubleshooting
28
USB Computer Bus Test Application
4.1
Introduction
4.2
Supported Hardware Configurations 31
4.2.1
4.2.2
4.2.3
4.3
4.4
ValiFrame USB Station Configuration 31
Starting ValiFrame USB
37
Configuring the USB DUT
39
Calibration
Receiver 56
51
Super Speed Module Procedure Description 67
4.4.1
4.4.2
4.5
31
High Speed Procedure Description 51
4.3.1
4.3.2
Calibration
Receiver 93
67
Super Speed Plus Module Procedure Description
4.5.1
4.5.2
5
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Using Software
3.1
4
Overview of This Guide
N5990A Overview
2.1
3
7
Calibration
Receiver 214
191
191
Troubleshooting and Support
5.1
Log List and File 244
5
Contents
6
Appendix
6.1
Data Structure and Backup 247
6.1.1
6.1.2
6.2
247
Remote Interface 249
6.2.1
6.2.2
6.2.3
6.2.4
6.3
ValiFrame Data Structure
ValiFrame Backup 249
Introduction
249
Interface Description
250
Using the Remote Interface 252
Results Format
254
Controlling Loop Parameters and Looping Over Selected Tests
256
6.3.1
6.3.2
6.3.3
6.3.4
6.3.5
6.3.6
6.4
IBerReader
6.4.1
6.5
6
Connect() 258
SetToDefault()
258
Init()
258
GetParameterList() and GetParameterValues() 258
SetNextValue()
258
Disconnect()
259
260
IBerReader Interface
261
Main Power Switch Control 263
Introduction
1
Introduction
1.1
1.1
This chapter provides an introduction to this user guide.
1.1.1 Overview of This Guide
This guide provides a detailed description of the N5990A Test Automation Software
Platfom.
1.2
Document History
First Edition
(September, 2014)
The first edition of this user guide describes functionality of software version N5990A
ValiFrame_2.23_USB3_1.40.
Second Edition
(October, 2014)
The second edition of this user guide describes functionality of software version
N5990A ValiFrame_2.23_USB3_1.40.
Third Edition
(January, 2015)
The third edition of this user guide describes functionality of software version N5990A
ValiFrame_2.23_USB3_1.50.
Fourth Edition
(September, 2015)
The fourth edition of this user guide describes functionality of software version
N5990A ValiFrame_2.23_USB3_1.53.
Fifth Edition
(July, 2016)
The fifth edition of this user guide describes functionality of software version
N5990A_ValiFrame_2.23_USB_2.00.
7
N5990A Overview
2
N5990A Overview
2.1
2.1
Test Automation Software Platform
Test Automation Software Platform
The Keysight Technologies N5990A Test Automation Software Platform “ValiFrame” is
an open and flexible framework for automating electrical compliance tests for digital
buses such as USB and PCI Express.
The product runs on a standard PC that controls a wide range of test hardware.
Typically, the hardware comprises of instruments for stimulus and response tests, such
as pattern generators, bit error ratio testers (BERTs), and oscilloscopes. Key elements
of the software platform are a test sequencer, receiver test libraries, and interfaces to
oscilloscope applications for transmitter tests. Additional options are available, e.g.
User Programming.
N5990A is impemented in C# within the Microsoft .NET Framework.
The software platform is specified in the data sheet 5989-5483EN, including the PC
requirements.
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3
3.1
Using Software
3.1
Test Station Configuration
3.2
3.3
Test Station Configuration
Test Station Selection
The set of test instruments used for a specific application is referred to in the
following as "Test Station" or in short "Station". The test station is controlled by a
suitable PC and the N5990A Test Automation Software Platform. At first, ValiFrame
Station Configuration
(Start > All Programs > BitifEye> USB >ValiFrame USB Station Configuration) must
be started prior to “ValiFrame USB” (see Figure 3-1 and Figure 3-6).
Figure 3-1: ValiFrame station configuration icon
When the ValiFrame Station Configuration is started, a window is displayed as shown
in Figure 3-2. The available Test Stations are listed in a drop-down menu. Multiple
entries can be generated by User Programming (N5990A opt. 500) and the required
station can be selected.
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Figure 3-2: N5990A station selection window
The N5990A opt. 001 is an interface to SQL databases (and web browsers). In case
this option was purchased, the connection to the database application server is
established by unchecking the default "Database Offline" selection and entering the
IP address of the server.
You can select how the results of the calibrations and tests will be presented: as an
MS Excel workbook or as an HTML document.
You can receive an audio notification when a sequence of tests completes, when a
Connection diagram is displayed, or when there is a Dialog prompt. Select the
specific sound for each of these (see Figure 3-2). Following are the available options:
o None
o Car brake
o Feep Feep
o Ringing
o TaDa
o Tut
You can also hear the selected sound by clicking “Play” before you set the sound of
your choice.
Proceed with “Next” or quit with “Cancel”. Clicking “Next” opens a ValiFrame Station
Configuration window as given in Figure 3-3.
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Figure 3-3: N5990A station configuration window
Test Station
Configuration
Depending on the selected station in Figure 3-2. ,the ValiFrame Station
Configuration window shows the instruments or instrument combinations that are
required. All the required instruments can be selected using the drop-down menus.
Click “Next” to continue.
The user must ensure that all the selected instruments for the test station are
connected to the test station PC controller by the remote control interfaces such as
LAN or USB.
After the required instruments have been selected, they are listed in the ValiFrame
Instrument Configuration Window (see Figure 3-4). In order to control instruments
for use with the test station, connections to the instruments need to be established
by using specific hardware addresses as described in the following section. The
"Mode" check box must be checked to set a specific instrument status from "Offline"
to "Online".
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Figure 3-4: N5990A instrument configuration window
When starting a specific test station configuration for the first time, all instruments
are set to the “Offline” mode. In this mode the test automation software does not
connect to any instrument. This mode can be used for demonstrations or checks.
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3.1.1 Using Keysight IO VISA Connection Expert
Introduction
The Keysight Connection Expert is recommended to setup new connections
or verify existing connections. Start the Connection Expert by right-clicking
on the Keysight IO Libraries Suite icon in the task bar and selecting
“Connection Expert”. A window similar to the one shown in Figure 3-5 is
displayed.
Figure 3-5: Keysight Connection Expert
Under “Instruments”, click “Rescan”.
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For each instrument that is required, verify that an entry exists in the list for the
instrument and that before the VISA Address there is a green checkmark.
Once all the instruments to be used are listed properly, their address strings can be
entered in the ValiFrame Instrument Configuration Window (Figure 3-4). The
recommended way of doing this is by copying and pasting instrument addresses as
follows:
Click the “VISA Address” field next to an instrument in the Connection Expert. Copy
the address, highlight the same instrument in the Test Station Connection window,
paste the address in the “Instrument Address” text field and click “Apply Address”.
Repeat this procedure for all the instruments being used, except standard specific
applications running on the oscilloscope.
The applications running on the oscilloscope use a different technology to provide
remote access to ValiFrame, called .NET Remoting. Communication. The remote
access is only possible using a LAN connection to the oscilloscope and for this
reason the IP address needs to be used with this type of instrument.
Once all the instruments are set with the appropriate addresses, select the
instruments that will be used by the Test Automation Software by selecting the check
boxes. This will set the instrument mode to “Online”. Click “Check Connections” to
verify that the instrument addresses are valid.
Click “Finish” to save the changes and close the ValiFrame Station Configuration.
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3.2
Start the ValiFrame test station by double-clicking the icon on the desktop (example
for USB test station given in Figure 3-6). Alternatively, start the ValiFrame station by
clicking “Start > All Programs > BitifEye > USB > ValiFrame USB”.
Figure 3-6: ValiFrame USB test station icon
The ValiFrame N5990A connects automatically to the instruments which are set to
“Online” mode in the ValiFrame Station Configuration (see Figure 3-4). The
application is ready for use once all the connections have been initialized
successfully and the main menu is displayed as shown in Figure 3-7.
3.2.1 Configuring DUT
Once the N5990A main menu is displayed, the DUT needs to be configured in order
to proceed with testing. Click the “Configure DUT” icon on the toolbar or select the
“Configure DUT” option from the File menu (see Figure 3-7). A window is displayed
as shown in Figure 3-8.
Figure 3-7: ValiFrame main window
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Figure 3-8: Configure DUT panel
The parameters available on the “Configure DUT” panel depend on the specific
application. Enter all the information which is relevant for a USB DUT, such as DUT
identification, type (Device or Host), specification version and connector type. The
selected DUT parameters and the information entered by the user will be shown in
the measurement reports. It is also stored with the measurement data in case a
connection to an SQL database exists. As this information will be used to retrieve
data from the database, select unique identifiers and descriptions. Additional
calibration and test parameters can be set in a separate dialog which is displayed by
clicking “Show Parameters”.
In USB applications, either Compliance or Expert Mode must be selected. In
compliance mode, the tests run according to the specific test specification. In
expert mode, the DUT can be characterized to determine performance margins. It is
provided for advanced users and includes additional tests as well as additional
parameters to run tests differently than in compliance mode.
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3.2.2 Selecting, Modifying & Running Tests
After the DUT has been configured, click “OK” in the Configure DUT Panel. The
ValiFrame main window is displayed with the procedure tree as shown in Figure 3-9.
It contains the list of calibration and test procedures, typically in the following
groups:
1. Calibration
2. Receiver tests
3. Transmitter tests
Figure 3-9: N5990A main window with the procedures
Click the “Properties” and “Log List” buttons of the main toolbar (highlighted in
Figure 3-9) to display or hide procedure parameters on the right side and log
messages at the bottom of the ValiFrame main window, respectively. The parameter
grid on the right side of the window shows the parameters which are related to the
selected calibration or test procedure subgroups or to individual procedures.These
parameters can only be set before the execution of the procedure subgroup or
procedure is started. The log list at the bottom of the window shows calibration and
test status messages (regular progress updates as well as warnings and error
messages).
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System Calibration
It is necessary to calibrate the test system before running the first test, in order to
ensure that the test results are consistent from run to run. Provided the equipment
has achieved thermal stability before the calibration is started (typically after 30 min
of warm-up), and no system elements have been exchanged, the calibration is stable
and may only have to be repeated once a week or even less frequently. The
calibration interval depends on the degree of accuracy desired. If the station is not
calibrated prior to a DUT test, the results of the previous calibration will be used for
the current tests.
Selecting Procedures
The calibration, receiver, and transmitter test procedure groups can be selected
globally by selecting the check box at the top of the group. Alternatively, an
individual test procedure can be selected by selecting the specific check box next to
it. Only the procedures that are selected will be executed.
Modifying Parameters
Most calibration and test procedures, as well as the groups containing them, have
parameters that control the details of how the procedures are run. In compliance
mode, most of these parameters are read-only. In expert mode, almost all the
parameters can be modified. First, select a specific calibration or test procedure or
one of the groups containing them in the ValiFrame procedure tree. The parameters
should be displayed in a property list on the right side of the screen. If they are not
displayed, click the “Properties” icon on the toolbar. Depending on the user selection
in the Properties pane, the properties are ordered either alphabetically or in
categories. The test parameters available can be changed individually (see Figure
3-10). The test parameters selected are listed in the results viewer, see Figure 3-11.
Figure 3-10: Editing the test parameters
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Figure 3-11: An example of test results
Running Procedures
To run the selected procedures, click the “Start” icon on the toolbar (see Figure 3-9).
The procedures are run sequentially in the order shown in the procedure tree. Some
procedures may require user interaction, such as changing cable connections or
entering DUT parameters. The required action is prompted in pop-up dialog boxes
prior to the execution as shown in Figure 3-12.
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Figure 3-12: Connection diagram pop-up window
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3.2.3 Results
Runtime Data Display
Most procedures generate data output. While the procedure is running, the data is
displayed in a temporary MS Excel worksheet or HTML document, which opens
automatically for each individual procedure. An example is given in Figure 3-13. See
the Appendix for more details about the file directories.
Figure 3-13: Example of test results
The MS-Excel worksheet or HTML document is opened during the procedure run and
closes once the specific procedure is finished. As long as the N5990A Software is
running, each result file can be reopened with a double-click on the respective
procedure. However, the individual files are lost when the N5990A main window is
closed, unless individual files or a collection of them were saved by the user.
If a test or calibration procedure was run more than once, the list of results is visible
below the particular procedure after expanding the tree below the procedure
(see Figure 3-14).
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Figure 3-14: Selecting the repeated procedure and show test results
Results Workbook
For user convenience, all individual results are combined in a summary MS Excel
workbook or HTML document at the end of the test run. The workbook must be
saved explicitly (File > Save Results as Workbook...) as shown in Figure 3-15,
otherwise it will be lost! After all tests have been run, a test report document can be
generated additionally for easy documentation and printing with the standard Print
function of the File menu (see Figure 3-15). An example test report for USB is shown
in Figure 3-16.
Figure 3-15: Save results as workbook
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Figure 3-16: Test report example
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Smiley's Representation
Once the selected procedures are run successfully, the smiley at the individual
procedure indicates the result (Pass / Fail / Incomplete) by displaying its face in
specific ways as given below (see Table 1).
Table 1: Smiley's result description table
Smiley
Description
It indicates that the procedure passed successfully at the previous run and the results are available.
It indicates that the procedure passed successfully at the present run.
It indicates that the procedure was aborted/disturbed somehow and failed at the previous run.
It indicates that the procedure was aborted/disturbed somehow and failed at the present run.
It indicates that the procedure failed at the previous run.
It indicates that the procedure failed at the present run.
Generally this kind of smiley displays two results such as the first half indicates that the result of the present
run and the second half shows the result of the previous run. In this example, the first half indicates that the
procedure passed successfully at the present run and the second half means that it was not completely run
at the previous run.
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3.3
Keysight Technologies provides a range of transmitter test applications for highspeed digital interfaces. The transmitter test applications run on real-time
oscilloscopes of the Keysight 90000 series such as a Digital Sampling Oscilloscope
(DSO). The transmitter test applications can be used standalone, without the N5990A
Test Automation Software Platform. For this use model, please refer to the user
documentation of the specific application.
The transmitter test applications however can be run through the N5990A Test
Automation Software Platform too. A remote interface is used to execute the
transmitter test procedures. For this model, a test controller PC with the N5990A
software must be connected to the oscilloscope via Ethernet, e.g. through a LAN
switch. The remote interface of the transmitter test applications does not support
USB connections.
3.3.1 Using the Software
In the N5990A Test Station Configuration, the available transmitter test applications
are listed as instruments (see Figure 3-17). The IP address of the oscilloscope has to
be used as the instrument address. After entering the address, the transmitter test
application instrument needs to be set to “Online” by selecting the check box. Click
“Check Connections” to verify that the connection works properly. If the transmitter
test application is not already running on the oscilloscope, the N5990A Test
Automation Software automatically starts it via the oscilloscope firmware.
Figure 3-17: Setting the TX scope application online
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The N5990A Main Window lists the transmitter tests in the procedure tree under the
“Transmitter” group.
During the test run, the oscilloscope transmitter test application sends its connection
diagrams and pop-up dialog windows to the controller PC on which the N5990A Test
Automation Software is running. Once the oscilloscope application finishes the test
run, the N5990A software saves the test results including screenshots, data graphs,
data tables and specification limits similar to a calibration or receiver test report.
3.3.2 Troubleshooting
This section provides solutions for the following problems:
•
Wrong version of the transmitter test application
•
Error message at startup and connection failures
• Transmitter test application and oscilloscope seem to hang
Wrong version of the transmitter test application
When starting the transmitter tests, the N5990A software compares the version of
the transmitter test application which is currently installed on the oscilloscope with
the version which was tested with N5990A. In case the versions do not match, an
error message is displayed in the N5990A log file and a warning dialog shows the
details about the latest tested version. The appropriate version of the transmitter test
application must be installed on the oscilloscope to avoid problems. Even if the
versions do not match, the N5990A Test Automation Software can try to run the
transmitter tests. This may work if the changes between the transmitter test
application versions are small, but installing the officially supported version is always
strongly recommended.
Error message at startup and connection fails
The connection to the transmitter test application must be established through
Ethernet (LAN); however, the firewall settings might not be set properly on the
oscilloscope or the controller PC. This might result in error messages when the
N5990A Test Automation Software tries to start the oscilloscope transmitter test
application. In this case, check whether the following applications are added to the
firewall exception list:
1. Transmitter test application on the oscilloscope
2. N5990A Test Automation Software and N5990A Station Configuration on
the controller PC
In case the controller PC has more than one LAN adapter, the .Net remoting back
channel, which displays the dialogs may not work and the oscilloscope application
may try to open the remoting back channel to an invalid address. To recover from
this, the LAN adapter which is connected to the oscilloscope should be set to be the
primary adapter. This might require help from a network administrator as the specific
setting depends on the Windows version.
If the connection and information dialogs from the oscilloscope are not displayed
properly, check the firewall settings first and then make sure that the LAN adapter
connected to the oscilloscope network is set to the primary one.
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Transmitter test application and oscilloscope seem to hang
In general, the transmitter test application expects a valid signal that can be used as
a trigger for the sampling but sometimes the signal is missing or too small, i.e.,
below the threshold. In this case, the oscilloscope may appear to be frozen. This is
expected oscilloscope behavior because the oscilloscope trigger hardware stops the
execution of oscilloscope firmware as long as the trigger signal is missing. To exit
from this state, apply a valid signal or reboot the oscilloscope and restart the
N5990A software to check the signals before starting transmitter tests if the required
trigger signal is unknown. Please report the test and test conditions to your Keysight
support contact.
29
USB Computer Bus
Test Application 4
4
4.1
USB Computer Bus
Test Application
4.1
Introduction
4.2
Supported Hardware Configurations
4.3
USB2 Module Procedure Description
4.4
USB3 Module Procedure Description
Introduction
This chapter describes the calibrations and test procedures conducted by N5990A
ValiFrame for Universal Serial Bus (USB) in detail. The N5990A software implements
the Electrical Compliance Test Specification and also offers some custom
characterization tests to provide more details on DUT behavior beyond the limits. The
electrical compliance tests are conducted to verify that the receiver can handle
maximum stress signals according to the specification.
4.2
Supported Hardware Configurations
ValiFrame N5990A supports the following instruments for receiver testing
1. USB 2.0: Keysight J-BERT N4903B and Keysight J-BERT M8020A
4.2.1 ValiFrame USB Station Configuration
After the software has been installed, an icon is added to the desktop as shown in
Figure 4-1. Start the software with a double-click of the left mouse button or,
alternatively, start the application from "Start > All Programs > BitifEye > USB >
ValiFrame USB Station Configuration".
31
4 USB Computer Bus
Test Application
Figure 4-1: USB station configuration icon
When the software is started, a window as shown in Figure 4-2 is displayed. It allows
the “USB station” to be selected.
Figure 4-2: USB Station Selection Window
32
USB Computer Bus
Test Application 4
USB Station Configuration Window Options
4.2.1.1.1 Data Generator
The data generator is used to create patterns with specified stress parameters. The
following instruments can be selected as data generator:
•
JBERT- N4903B (Keysight N4903B High Perfomance Serial BERT)
•
JBERT- M8020A (Keysight J-BERT M8020A High Perfomance Serial BERT)
The error detector of the selected data generator (BERT system) will be used to
check if the data looped back from the DUT contains errors.
Figure 4-3: Configuration with JBERT N4903B
33
4 USB Computer Bus
Test Application
Figure 4-4: Configuration with JBERT M8020A
34
USB Computer Bus
Test Application 4
4.2.1.1.2 De-Emphasis Generation
When the data generator is the JBERT N4903B, the de-emphasis source can be
selected as:
•
N4916 (Keysight N4916 De-Emphasis Signal Converter)
•
AUX_DATA (requires JBERT second data channel option 002)
•
None (only for debugging purposes)
M8020A will generate the de-emphasis internally. Therefore this selection is not
visible when M8020A is selected as Data Generator.
4.2.1.1.3 Power Supply for Auto Loopback Training
It contains the following options:
•
None
•
E3631A (Keysight Triple Output DC Power Supply)
•
E363xA (Keysight E363xA Series Programmable DC Power Supplies)
•
E364xA (Keysight E364xA Single Output DC Power Supplies)
•
N67xx (Keysight N67xx Modular Power Supply from MATLAB)
When any power supply is selected, the DUT is power-cycled automatically.
4.2.1.1.4 Power Switch for Auto Loopback Training
It can be selected as:
•
None
•
NetIo 230 B (a power distribution unit with one 230 V input and four 230 V
outlets)
•
ALL4076
•
SynaccessNP
When any power switch is selected, the DUT is power-cycled automatically.
To use the Power Switch, the ValiFrame opt. 008: Remote Power Management
Support is required.
•
For more details, refer to the Appendix section
Main Power Switch Control.
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4 USB Computer Bus
Test Application
4.2.1.1.5 Tx Scope Application
Depending on the selection of “Tx Scope Application” (for USB2 or USB3), the
respective tests in the “Transmitter” group are available. It contains the following
options:
•
N5416A_Usb2: Required for Tx USB2.0 compliance test software.
•
N5416B_Usb2: Required for Tx USB2.0 compliance test software.
•
U7243A_Usb3: Required for Tx USB3.0 compliance test software.
•
U7243B_Usb3: Required for Tx USB3.1 compliance test software.
4.2.1.1.6 SigTest Configuration
The SigTest software is used in several calibration procedures in order to calculate
the eye height, eye width, and jitter parameters of the generated signal. The
calculations are done in parallel instead of sequentially to reduce the calibration
time, using two levels of performance (“Full” or “Economic”), i.e. the amount of
processing power that will be used for this purpose.
It is possible to use the SigTest binaries provided by the N5990A or use a custom
SigTest installation.
Figure 4-5: Signal Test Configuartion Window
36
USB Computer Bus
Test Application 4
Figure 4-6: USB instrument configuration window
After the installation process, all instruments are configured by default in “Offline”
mode. In this simulation mode, hardware does not need to be physically connected
to the test controller PC. ValiFrame cannot connect to any instrument in this mode.
In order to control the instruments that are connected to the PC, the instrument
address must be entered in the text box shown in Figure 4-6. The address depends
on the bus type that is used for the connection, for example, General Purpose
Interface Bus (GPIB) or Local Area Network (LAN). Most of the instruments used in
the USB station use a Virtual Instrument Software Architecture (VISA) connection.
To determine the VISA address, run the “Keysight Connection Expert” (right-click on
the IO Libraries Suite icon in the taskbar and then select the first entry “Keysight
Connection Expert”). Enter the instrument addresses in the “Station Configuration
Wizard”, for example, by copying and pasting the address strings from the
Connection Expert entries. After the address strings have been entered, remove the
“Offline” flag of all the required instruments and click “Check Connections” to verify
that the connections for the instruments have been established properly.
4.2.2 Starting ValiFrame USB
Start ValiFrame USB by double-clicking the “ValiFrame USB” icon that is displayed
on the desktop, as shown in Figure 4-7. Alternatively, start the ValiFrame USB
Station from “Start > All Programs > BitifEye > USB > ValiFrame USB”. Starting
ValiFrame USB opens the window shown in Figure 4-8.
Figure 4-7: ValiFrame USB icon
37
4 USB Computer Bus
Test Application
Figure 4-8: ValiFrame USB user interface
38
USB Computer Bus
Test Application 4
4.2.3 Configuring the USB DUT
Clicking the “Configure DUT” icon on the toolbar of the ValiFrame USB user
interface window to display the Configure DUT window. See Figure 4-9, Figure 4-10
and Figure 4-11 for Spec Version 2.0, 3.0 and 3.1 respectively.
Figure 4-9 Configure DUT window with Spec Version 2.0 selected
39
4 USB Computer Bus
Test Application
Figure 4-10: Configure DUT window with Spec Version 3.0 selected
40
USB Computer Bus
Test Application 4
Figure 4-11: Configure DUT window with Spec Version 3.1 selected
41
4 USB Computer Bus
Test Application
Product Parameters
DUT Type:
The DUT type can be chosen as:
•
Device
•
Host
Spec Version:
The available specific versions are:
•
2.0
•
3.0
•
3.1
Connector:
When DUT type Device is selected:
•
With Spec Version 2.0
o StandardB
•
o Standard-B
o Micro-B
o Tethered Std-A
•
o Micro-B
o Type-C
o Tethered Std-A
o Tethered Type-C
When DUT type Host is selected:
•
o Standard-A
•
o Standard-A
•
o Standard-A
o Type-C
42
USB Computer Bus
Test Application 4
Test Parameters
As for all the applications, a description, a user name, and a comment can be
entered.
Compliance/Expert Mode:
In Compliance mode only the plain compliance tests are shown with very little
customization parameters. In Expert mode additional debugging tests are added and
the compliance tests can be run with customized settings.
Speed Class:
•
When Spec Version 2.0 is selected: The available USB Speed class is
HighSpeed.
•
When Spec Version 3.0 is selected: The available USB Speed class is Super
Speed.
•
When Spec Version 3.1 is selected: The available USB Speed classes are
Super Speed and Super Speed Plus.
Show Parameters:
Clicking “Show Parameters” displays a dialog that enables you to configure some
additional test parameters, which are available for Spec Version 3.0 and 3.1.
Depending on the speed classes selected, individual tabs are displayed (see Figure
4-12).
Figure 4-12: Test Parameters Window
43
4 USB Computer Bus
Test Application
In station Configuration window if you have selected ‘None’ in ‘Power Supply for
auto loopback training’, then Power Supply Mode will not appear in
PowerAutomation (see Figure 4-13).
Similarly if in station Configuration window, you have selected ‘None’ in ‘Power
Switch for auto loopback training’, then Power Switch Mode will not appear in
PowerAutomation (see Figure 4-14).
Figure 4-13: Station Configuration Window showing the available options for Power Supply for auto loopback training
Figure 4-14: Station Configuration Window showing the available options for Power Switch for auto loopback training
44
USB Computer Bus
Test Application 4
J-BERT N4903B and J-BERT M8020A have the same Test Parameters
under the Rx Super Speed tab execpt for the Error Detector parameters as
shown below.
Figure 4-15: Test parameters window showing the parameter of RxSuper Speed with J-BERT M8020A
45
4 USB Computer Bus
Test Application
Figure 4-15: Test parameters window showing the parameter of RxSuper Speed with J-BERT N4903B
Please note that the DUT transmits with SSC and Deviation parameters are
available only when JBERT N4903B is the selected Data Generator in the
N5990A Station Configuration.
46
USB Computer Bus
Test Application 4
Figure 4-16: Test parameters window showing the parameter of RxSuper Speed with J-BERT M8020A
The Equalization and Sensitivity parameters are available only when J-BERT
M8020A is the selected Data Generator in the N5990A Station
Configuration. Please note that the Equalization requires M8070A option
0A3 and that the available presets depend on the factory calibration of the
J-BERT M8020A.
J-BERT N4903B and J-BERT M8020A have same Test Parameters for Rx
Super Speed Plus as shown in Figure 4-17 and Figure 4-18.
47
4 USB Computer Bus
Test Application
Figure 4-17: Test parameters window showing the parameter of RxSuper Speed Plus with J-BERT N4903B
48
USB Computer Bus
Test Application 4
Figure 4-18: Test parameters window showing the parameter of RxSuper Speed Plus with J-BERT M8020A
49
4 USB Computer Bus
Test Application
Figure 4-19: Test parameters window showing the parameter of Transmitter
For more detail about these parameters see Receiver.
Rx Super Speed Plus tab is not available with Spec Version 2.0 and 3.0.
50
USB Computer Bus
Test Application 4
4.3
High Speed Procedure Description
This section describes the High Speed calibration and test procedures of the USB2
module based on version 1.40. These procedures are available for Spec Version 2.0.
The following configurations are included:
•
J-BERT N4903B
•
J-BERT M8020A
4.3.1 Calibration
Common Calibration Parameters
Repetitions: The number of times to repeat a test or a test sequence.
Direct SMA scope connection: Direct SMA connections to the oscilloscope can be
either to channels 1 and 3 or to channels 2 and 4.
Differential scope connection: Differential connections to the oscilloscope can be to
any channel (1, 2, 3, or 4).
USB2 Random Jitter Calibration
Purpose and Method:
In the Rx tests, the input signal will be stressed with a combination of jitter sources
to simulate the possible impairments expected at the Rx input when operating in a
target system. Random jitter is added to simulate the effects of thermal noise. Due to
system intrinsic jitter, the effective jitter level is different from the value set in the
data generator, so the jitter amplitude is calibrated.
The test automation calibrates six equally spaced RJ values (from 0 to 220 ps). The
data generator sends a clock pattern during this calibration procedure. The actual
jitter is measured on a DSO using the RJ/DJ-separation software EzJIT.
The set and measured random jitter values are stored in a cal table file.
Connection Diagram:
51
4 USB Computer Bus
Test Application
Figure 4-20: Connection setup for USB 2 random jitter calibration for M8020A and N4903B, respectively
52
USB Computer Bus
Test Application 4
Parameters in Expert Mode:
The following Sequencer parameters are available for all the tests:
Procedure Error Case Behavior: Specifies the action to be taken when an error occurs
during the execution of a test in a test sequence. The available options include:
Proceed with Next Procedure and Abort Sequence.
Procedure Failed Case Beavior: Specifies the action to be taken when the execution
of a test fails in a test sequence. The available options include: Proceed with Next
Procedure and Abort Sequence.
Repetitions: Specifies the number of times to repeat the execution of a test.
Used Calibrations:
None
Procedure Report:
Figure 4-21: Result description
53
4 USB Computer Bus
Test Application
•
•
Column 1:
o Set Random Jitter: The jitter amplitude set in the instrument.
Column 2:
o Measured Random Jitter: The measured jitter amplitude.
USB2 Differential Voltage Calibration
Purpose and Method:
This procedure calibrates the differential voltage. The test automation uses the data
generator to send the IN packet pattern to the DUT. It measures the differential
amplitude of the received IN packets with a real time oscilloscope. The voltage is
calibrated from 0 to 600mV with 25 mV steps. This calibration depends on the DUT,
so it is necessary to do it every time the user configures a new DUT. It is not saved.
Connection Diagram
Figure 4-22: Connection setup for USB 2 differential voltage calibration for M8020A
54
USB Computer Bus
Test Application 4
Sequencer parameters as described in the Random Jitter Calibration. Additionally:
Keep Caldata: When set to True, calibration data is saved and reloaded when
configuring the DUT. Since the differential voltage calibration data is DUT
dependent, this option must be used if the calibrated DUT is identical to the DUT
currently used.
Used Calibrations:
None
Procedure Report:
55
4 USB Computer Bus
Test Application
•
•
Column 1:
o Set Differential Voltage [mV]: The differential voltage set in the
instrument.
Column 2:
o Measured Vdiff [mV]: The differential voltage of the IN packet in
the DUT.
4.3.2 Receiver
Common Calibration Parameters
Repetitions: The number of times to repeat tests in a test sequence.
Scope connection: For Rx tests a differential connection to the oscilloscope is used.
The connection can be to any oscilloscope channel (1, 2, 3 or 4).
Force DUT re-initialization at each step
56
USB Computer Bus
Test Application 4
USB2 Rx Sensitivity Compliance Test, EL_11, EL_13, EL_15, EL_17
Purpose and Method:
This test verifies that the DUT meets the high speed compliance electrical criteria
EL_11, EL_13 ,EL_15, and EL_17.
According to EL_11 and EL_15, the DUT must be able to receive at 480Mb/s ±0.05%
and should be able to reliably receive in the presence of a common mode voltage
component over the range of -50 mV to 500 mV. So the DUT is tested at the four
corner points: (480-0.05%, -50 mV), (480+0.05%, -50 mV), (480-0.05%, 500 mV) and
(480+0.05%, 500 mV).
According to EL_13, a USB 2.0 upstream facing port on a device must tolerate
300 mU of jitter. The automated test adds 80 mU of random jitter and 220 mU of
sinusoidal jitter for all the four points.
The procedure sends an IN packet pattern to the DUT and checks if in these four
points the DUT answers with NAK packets.
Connection Diagram:
Same as for Differential Voltage Calibration.
•
Vdiff: Differential Voltage used for this test.
•
Vcm: Common mode voltage used for this test.
•
Random Jitter: Random jitter (peak-peak) used for this test.
•
Sinusoidal Jitter: Sinusoidal jitter used for this test.
•
Sinusoidal Jitter Frequency : Sinusoidal jitter frequency used for this test.
•
Num In Packets: The number of IN packets that the scope observes to
check if they have NAK answer.
•
Max missing NAK: The maximum number of allowed missing NAK packets.
Used Calibrations:
•
Differential Voltage Calibration
•
Random Jitter Calibration
Procedure Report:
57
4 USB Computer Bus
Test Application
•
•
•
•
58
Column 1:
o Result: Pass if the number of missing NAK is below or equal of the
max number of missing NAK packets.
Column 2:
o Common Mode Voltage [mV]: CM voltage applied during the test.
Column 3:
o Data Rate [Mbit/s]: Effective data rate applied during the test.
Column 4:
o Number of missing NAK packets.
USB Computer Bus
Test Application 4
USB2 Squelch Detection Compliance Test EL_16
Purpose and Method:
This test verifies that the DUT meets the high speed compliance electrical criterion
EL_16. According to EL_16 “a high speed capable device must implement a
transmission envelope detector that indicates squelch (i.e., never receives packets)
when a receivers input falls below 100 mV differential amplitude”. The procedure
begins with setting 50 mV differential amplitude and increases it until the DUT starts
sending NAK packets. The last voltage with which the DUT does not send any NAK
packet is the squelch level. To pass the test the squelch level has to be above
100 mV.
Connection Diagram:
•
•
•
Sinusoidal Jitter Amplitude: Sinusoidal jitter amplitude used for this test.
•
Sinusoidal Jitter Frequency : Sinusoidal jitter frequency used for this test.
•
Start Differential Voltage: The differential amplitude where the test starts
looking for the squelch level.
•
Differential Voltage Step Size: Step size used to increase the differential
amplitude.
•
Used Calibrations:
•
•
Procedure Report:
59
4 USB Computer Bus
Test Application
•
•
60
Column 1:
o Result: Pass if the squelch detection voltage is more than 100 mV.
Column 2:
o Squelch Detection Voltage [mV]: Differential voltage below which
the DUT does not respond.
USB Computer Bus
Test Application 4
USB2 Minimum SYNC Field Compliance EL_18
Purpose and Method:
The purpose of this test is to check the high speed electrical criterion EL_18: “A high
speed capable device’s transmission envelope detector must be fast enough to allow
the HS receiver to detect data transmission, archive DLL lock, and detect end of the
SYNC field within 12 bit times”. The procedure sends the IN Token with the Minimum
SYNC of 12 bits and checks if the DUT answers with NAKs.
Connection Diagram:
•
Vdiff: Differential voltage used for this test.
•
•
•
Sinusoidal Jitter Amplitude: Sinusoidal Jitter amplitude used for this test.
•
Sinusoidal Jitter Frequency: Sinusoidal Jitter frequency used for this test.
•
•
Max missing NAK Packets: The maximum number of allowed missing NAK
packets.
Used Calibrations:
•
•
Procedure Report:
61
4 USB Computer Bus
Test Application
•
•
62
Column 1:
o Result: Pass if the number of missing NAK is below or equal to the
maximum number of missing NAK packets.
Column 2:
o Missing NAK packets [ ]: Number of IN packets that are not
answered with a NAK packet.
USB Computer Bus
Test Application 4
USB2 Sensitivity Characterization EL_13, EL_16, EL_17
Purpose and Method:
This test characterizes the answer of the DUT depending on the differential voltage
amplitude. According to EL_13 and EL_16 the device should not send any NAK
packets below 100 mV and should always answer with NAK packets above 150 mV.
The procedure sends IN packets to the DUT and analyses the response using a real
time oscilloscope. It detects every IN packet and checks if there is a NAK packet after
each one.
The test stops if the DUT responds to all NAK packets at any point above 150 mV. If
that does not happen it stops at the voltage defined in “Max Differential Voltage”.
Connection Diagram:
•
Min Differential Voltage: Start amplitude used for this test.
•
Max Differential Voltage: The maximum tested voltage.
•
Differential Voltage Step Size: Step size to increase the voltage amplitude.
•
Common Mode Voltage: Common mode voltage added to the input signal.
•
Data Rate Deviation: Variation on the data rate.
•
Random Jitter: Random jitter added to the signal.
•
Sinusoidal Jitter: Sinusoidal jitter amplitude added to the signal.
•
Sinusoidal Jitter Frequency: Frequency of the sinusoidal jitter component.
•
•
Max missing NAK Packets. The maximum number of allowed missing NAK
packets.
Used Calibrations:
•
•
Procedure Report:
63
4 USB Computer Bus
Test Application
•
•
•
•
•
64
Column 1:
o Result: Pass if DUT does not respond with NAK packets below
100 mV and responds to all NAK packets above 150 mV.
Column 2:
o Actual Differential Voltage [mV]: Voltage of the IN packets.
Column 3:
o Squelch Detection Spec [mV]: Level below which NAK packets
should not be sent.
Column 4:
o Min Differential Voltage Spec [mV]: Level above which all IN
packets should be responded to with a NAK packet.
Column 5:
USB Computer Bus
Test Application 4
USB2 Constant Parameter Stress EL_13, EL_16
Purpose and Method:
This test analyses the DUT answer for specific values of the signal parameters that
can be modified in the user interface. As in all the other tests, the IN packet pattern
is sent with the data generator and the number of missing NAK packets is measured
with the scope. The test passes if the answer meets the specification EL_13 and
EL_16 (no NAK packets below 100 mV and always a NAK packet for each IN packet
above 150 mV).
Connection Diagram:
•
Vdiff: Differential voltage of the IN packet.
•
Common Mode Voltage: Common mode voltage added to the input signal.
•
Data Rate Deviation: Variation on the data rate.
•
Random Jitter: Random jitter added to the signal.
•
Sinusoidal Jitter: Sinusoidal jitter amplitude added to the signal.
•
Sinusoidal Jitter Frequency: Frequency of the sinusoidal jitter component.
•
•
Max missing NAK Packets. The maximum number of allowed missing NAK
packets.
Used Calibrations:
•
•
Procedure Report:
65
4 USB Computer Bus
Test Application
•
•
•
•
•
66
Column 1:
o Result: Pass if DUT does not respond with NAK packets below
100 mV and responds to all NAK packets above 150 mV.
Column 2:
o Differential Voltage [mV]: Voltage of the IN packets.
Column 3:
o Squelch Detection Spec [mV]: Level below which NAK packets
should not be sent.
Column 4:
o Min Differential Voltage Spec [mV]: Level above which all IN
packets should be responded to with a NAK packet.
Column 5:
USB Computer Bus
Test Application 4
4.4
Super Speed Module Procedure Description
This section describes the Super Speed calibration and test procedures for
Specification Versions 3.0 and 3.1.
4.4.1 Calibration
Common Calibration Parameters:
Repetitions: The number of times to repeat tests in a test sequence.
Scope Cal Connection: Connection to the scope used for calibrations. The available
choices include Chan 1 3 Direct Connect and Chan 2 4 Direct Connect.
Amplitude Imbalance Check: Enables or disables the amplitude imbalance check
during calibration.You can also access the following parameter from the Test
Parameters window that can be invoked from the Configure DUT screen:
Scope Connection: It allows you to select Chan 1 3 Direct Connect or Chan 2 4
Direct Connect.
Calibration with Specification Version 3.0
4.4.1.1.1 5G LFPS Voltage Calibration
Purpose and Method:
This procedure calibrates the differential voltage for low frequency periodic signaling.
The data generator sends an LFPS pattern. The test automation sets nine equally
spaced differential voltages from 600 mV to 1400 mV in the data generator. The
differential amplitude is measured with the scope.
Connection Diagram:
67
4 USB Computer Bus
Test Application
Figure 4-29: Connection Setup for 5G LFPS Voltage Calibration (J-BERT M8020A)
Figure 4-30 : Connection Setup for 5G LFPS Voltage Calibration (J-BERT N4903B, DeGeneration = AUX DATA)
68
USB Computer Bus
Test Application 4
No additional parameters.
Used Calibrations:
None
Available for the following configurations:
•
J-BERT N4903B with AUX_DATA
•
J-BERT M8020A
Procedure Report:
69
4 USB Computer Bus
Test Application
•
•
70
Column 1
o Set Differential Voltage [mV]: The differential voltage amplitude
set in the instrument.
Column 2
o Measured Differential Voltage [mV]: The measured voltage
amplitude.
USB Computer Bus
Test Application 4
4.4.1.1.2 5G De-Emphasis Calibration
Purpose and Method:
This procedure calibrates the de-emphasis. The pattern generator sends the CP0
pattern to the oscilloscope. The calibration is done in several differential voltage
points. For every point, de-emphasis is set from 70 % to 0 % with 10 % steps. The
de-emphasis is measured with a scope doing eye height measuements with eye
mask folding for transition and non-transition bits.
Connection diagram:
•
J-BERT N4903B with AUX_DATA and J-BERT M8020A: Same as for 5G
LFPS Voltage Calibration.
•
J-BERT N4903B with N4916 De-Emphasis Generator: Figure 4-32.
Figure 4-32: Connection setup for 5G De-Emphasis Calibration (J-BERT N4903B, DeGeneration = N4916B)
71
4 USB Computer Bus
Test Application
Differential Voltage Points: Set of voltage points where the de-emphasis is
calibrated.
Used Calibrations:
None
•
J-BERT N4903B with N4916 De-Emphasis Generator
•
•
J-BERT M8020A
Procedure Report:
72
USB Computer Bus
Test Application 4
•
•
Column 1:
o Set De-Emphasis [%]: The de-emphasis set in the instrument.
Column 2:
o Actual De-Emphasis (x mV) [%]: The measured de-emphasis for
each voltage point.
73
4 USB Computer Bus
Test Application
4.4.1.1.3 5G Generator Output Voltage Calibration
Purpose and Method:
This procedure calibrates the differential voltage. The data generator sends the
compliance pattern CP0 and does a sweep of the signal voltage amplitude. For each
value, the oscilloscope measures the peak to peak differential voltage.
Connection Diagram:
Same as for 5G De- Emphasis Calibration
No additional parameters
Used Calibrations:
None
•
•
•
J-BERT M8020A
Procedure Report:
74
USB Computer Bus
Test Application 4
•
•
Column 1:
o
Column 2
o
Set Differential Voltage [mv]: Shows the diiferential value, set
in the instrument.
Measured differential Voltage [mv]: Shows the measured
voltage.
75
4 USB Computer Bus
Test Application
4.4.1.1.4 Long Channel
4.4.1.1.4.1
5G Random Jitter Calibration
Purpose and Method:
This procedure calibrates the random jitter (RJ). The pattern generator sends a clock
pattern and adds random jitter to the signal. It sets eleven equally spaced RJ values
(from 0 to 250 mUI). The jitter is measured with a real time oscilloscope using
SigTest.
Connection Diagram:
Figure 4-35: Connection setup for LF Sinusoidal Jitter Calibration (J-BERT N4903B, DeGeneration = N4916B, Device)
76
USB Computer Bus
Test Application 4
Figure 4-36: Connection setup for LF sinusoidal jitter calibration (J-BERT N4903B, DeGeneration = AUX DATA, Device)
77
4 USB Computer Bus
Test Application
Figure 4-37: Connection Setup for LF Sinusoidal Jitter Calibration (J-BERT M8020A)
In the host case the instruments connections are the same but with the following
fixtures:
78
USB Computer Bus
Test Application 4
Figure 4-38: Host case fixtures of connection setup for LF sinusoidal jitter calibration
BER: The target BER used for the random jitter measurements.
Used Calibrations:
None
•
•
•
J-BERT M8020A
Procedure Report:
79
4 USB Computer Bus
Test Application
•
•
80
Column 1
o Set Jitter [mUI]: The jitter amplitude set in the instrument.
Column 2
o Actual Random Jitter [mUI]: The measured jitter amplitude.
USB Computer Bus
Test Application 4
4.4.1.1.4.2
5G LF Sinusoidal Jitter Calibration
Purpose and Method:
This procedure calibrates the sinusoidal jitter for low frequencies (from 100 KHz to 2
MHz). The data generator sends a Clock pattern during this calibration.
The procedure makes a sinusoidal jitter sweep in five different frequencies.
It checks that the measured jitter amplitude values are consistent across jitter
frequencies. Deviations bigger than 2.5 % between the measured jitter amplitudes
for the same set jitter amplitude with different frequencies are not allowed. In case of
a bigger deviation, the point is re-measured up to three times.
The sinusoidal jitter is measured with the oscilloscope using the SigTest software.
SigTest is the standard method to measure Eye Height and Jitter. It is the only valid
option for compliance testing.
Connection Diagram:
Same as for 5G Random Jitter Calibration.
Used Calibrations:
None
•
•
•
J-BERT M8020A
Procedure Report:
81
4 USB Computer Bus
Test Application
•
•
82
Column 1:
o Set Jitter [UI]: The jitter amplitude set in the instrument.
Column 2:
o Sinusoidal Jitter (x jitter frequency) [UI]: The measured jitter
amplitude for each jitter frequency.
USB Computer Bus
Test Application 4
4.4.1.1.4.3
5G HF Sinusoidal Jitter Calibration
Purpose and Method:
This procedure calibrates the sinusoidal jitter for high frequencies (from 4.9 MHz to
50 MHz). The method is the same as for 5G LF Sinusoidal Jitter Calibration but in this
case the maximum allowed deviation is 5%.
As in the LF calibration, the data generator sends a Clock pattern during this
calibration. The procedure makes a sinusoidal jitter sweep in five different
frequencies. It checks that the measured jitter amplitude values are consistent across
jitter frequencies. Deviations bigger than 5 % between the measured jitter
amplitudes for the same set jitter amplitude with different frequencies are not
allowed. In case of a bigger deviation, the point is re-measured up to three times.
The sinusoidal jitter is measured with the oscilloscope using the SigTest software.
SigTest is the standard method to measure Eye Height and Jitter. It is the only valid
option for compliance testing.
Connection Diagram:
Used Calibrations:
None
•
•
•
J-BERT M8020A
Procedure Report:
83
4 USB Computer Bus
Test Application
•
•
84
Column 1:
o Set Jitter: The jitter amplitude set in the instrument.
Column 2:
o Sinusoidal Jitter (x jitter frequency): The measured jitter amplitude
for each jitter frequency.
USB Computer Bus
Test Application 4
4.4.1.1.4.4
5G Eye Height Calibration
Purpose and Method:
This procedure calibrates the eye height. The data generator sends the CP0 pattern.
The test automation sets several differential voltage amplitudes and measures the
corresponding eye height amplitude for each one. The measurements are done on
the scope using the SigTest software.
Connection Diagram:
Use CTLE: Enable CTLE in the scope.
Used Calibrations:
All the previous calibrations except 5G LFPS Voltage Calibration
•
•
•
J-BERT M8020A
Procedure Report:
85
4 USB Computer Bus
Test Application
•
•
86
Column 1:
o Input Diff Voltage [mV]: The differential voltage amplitude set in
the instrument.
Column 2:
o Measured Eye Height [mV]: The measured eye height amplitude.
USB Computer Bus
Test Application 4
4.4.1.1.4.5
5G Total Jitter Calibration
Purpose and Method:
This procedure calibrates the total jitter. The data generator sends the
“CPO_2SKP_RD-” pattern. Random jitter and sinusoidal jitter with the values
specified in the USB Compliance Test Specification are added to the signal. Total
jitter is measured on the oscilloscope using the SigTest software.
Connection Diagram:
Same as for 5G LF Sinusoidal Jitter Calibration.
SJ Frequency: The frequency of the sinusoidal jitter component.
Used Calibrations:
•
•
•
J-BERT M8020A
Procedure Report:
•
•
Column1:
o Pass/Fail Result
Column2:
o Total Jitter (mUI): The measured total jitter.
87
4 USB Computer Bus
Test Application
4.4.1.1.4.6
5G Eye Height Verification
Purpose and Method:
This test checks if it is possible to meet the eye height specification with the current
calibration data and setup. The pattern generator sends the CP0 pattern to the
oscilloscope and random jitter and sinusoidal jitter are set to the values specified in
the USB Compliance Test Specification. The differential output voltage amplitude is
set to the specified value plus a small margin defined with the “Eye Height Margin”
parameter. The eye height is measured with the oscilloscope using SigTest.
Connection Diagram:
Eye Height Margin: Differential voltage added to the value specified in the CTS.
Used Calibrations:
•
•
•
J-BERT M8020A
Procedure Report:
88
USB Computer Bus
Test Application 4
•
•
•
•
•
4.4.1.1.4.7
Column 1:
o Result: Specifies whether the eye height specifications have been
met.
Column 2:
o Set Eye Height [mV]: The eye height set in the instrument.
Column 3:
o Measured Eye Height [mV]: The measured eye height.
Column 4:
o Upper Spec [mV]: The upper spec limit.
Column 5:
o Lower Spec [mV]: The lower spec limit.
5G Total Jitter Verification
Purpose and Method:
This test checks if it is possible to meet the total jitter specification with the current
oscilloscope. The differential output voltage amplitude is set to the value specified in
the USB Compliance Test Spec. Random jitter and sinusoidal jitter are set to the
specified values plus a small margin defined with the “Random Jitter Margin” and
“Sinusoidal Jitter Margin” parameters. The total jitter is measured with the
oscilloscope using SigTest.
Connection Diagram:
Specification
•
Random Jitter Margin: Percentage added to the specified RJ amplitude
value.
•
Sinusoidal Jitter Margin: Percentage added to the specified SJ amplitude
value.
•
Sinusoidal Jitter Frequency
Used Calibrations:
•
•
•
J-BERT M8020A
Procedure Report:
89
4 USB Computer Bus
Test Application
•
•
•
•
90
Column 1:
o
Result.
Column 2:
o Measured Total Jitter.
Column 3:
o Min TJ at IE-12 [mUI].
Column 4:
o Max TJ at IE-12 [mUI].
USB Computer Bus
Test Application 4
Calibration with Specification Version 3.1
The calibration procedures defined for specification version 3.0 hold true for
specification version 3.1. The difference with regard to specification version 3.0 is the
addition of the connectors Type-C and Tethered Type-C.
The following are the calibration procedures for the specification version 3.1:
•
5G LFPS Voltage Calibration
•
5G De-Emphasis Calibration
•
5G Generator Output Voltage Calibration
•
5G Random Jitter Calibration
•
5G LF Sinusoidal Jitter Calibration
•
5G HF Sinusoidal Jitter Calibrations
The above calibration procedures are available for all the following configurations,
except the 5G LFPS Voltage Calibration, which is not available for the first
configuration:
•
•
•
J-BERT M8020A
For the following information, please refer to the descriptions in the Calibration
section for specification version 3.0:
•
Purpose and Method
•
Parameters in Expert Mode
•
Used Calibrations
•
Procedure Report
The connection diagrams for all the calibration procedures are the same. An
exception is the 5G LFPS Voltage Calibration, which does not support DeGeneration
= N4916.
Figure 4-46: Connection Setup for 5G LFPS Voltage Calibration (M8020A)
91
4 USB Computer Bus
Test Application
Figure 4-47: Connection Setup for 5G LFPS Voltage Calibration (J-BERT N4903B, DeGeneration = N4916B)
Figure 4-48: Connection Setup for 5G LFPS Voltage Calibration (J-BERT N4903B, DeGeneration = AUX DATA)
92
USB Computer Bus
Test Application 4
4.4.2 Receiver
You can see the Receiver parameters by clicking Show Parameters in the Configure
Dut window, which is shown in Figure 4-49.
Figure 4-49: Configure DUT Window
Please select Spec Version 3.0 for Super Speed Module procedure.
93
4 USB Computer Bus
Test Application
Figure 4-50: Test Parameters Window
94
USB Computer Bus
Test Application 4
For Super Speed Module description you have three tabs for classifying the Test
parameters; Common, Rx Super Speed and Transmitter.
The receiver-related parameters are confined to the Common and Rx Super Speed
tabs. Following is a description of these tabs.
•
Common: This tab includes the Power Automation and BER Reader
sections.
o
Power Automation: There are three available modes: Manual, Power
Supply, and Power Switch:

Manual: The user will be responsible for supplying power to
the DUT and power-cycling it.

Power Switch: It is only available when a power switch was
selected in the Station Configurator. Following are the
additional parameters:
•
Component: The component which is used to power
up the DUT or enable the DUT’s USB bus. This can
be MainPower or Vbus (see figure).
•
Channel: This indicates the channel of the power
switch that will be used to power-cycle the DUT. The
number of channels available depends on the power
switch model selected.
•
Off On Duration: The duration between turning off
the DUT off and turning it on.
•
Settling Time: The timespan after the DUT is turned
on and before the test continues with loopback
training.
•
Max Power Cycle Retries: The maximum number of
loopback training retries. After all retries, the
following SER test will be considered as failed.

o
Power Supply: It is only available when a power supply was
selected in the Station Configurator. All of the additional
parameters are the same as those for Power Switch, except
for:
•
Vdd(5.0 V): The DC output voltage of the power
supply connected to the DUT DC power input.
BER Reader: It has two available options: External Analyzer and Offline
BER Reader. For External Analyzer, there is no address but for Offline
BER Reader you need to specify the address.
Figure 4-51: Power Automations : Mode & Component Types
95
4 USB Computer Bus
Test Application
Rx Super Speed

Calibration :
o Scope Connection: It allows you to select Chan 1 3
Direct Connect or Chan 2 4 Direct Connect
Loopback Training
o Loopback Training Method: Determines how the
loopback training is performed.
o LFPS Idle: The signal applied between the LFPS
bursts.
o LFPS Trigger Threshold: Detection level for LFPS
signals sent by the DUT. This parameter is available
only if Loopback Training Method “PowerOnReset” is
selected.
o Use Link Training Suite:
If False, you can configure the link training directly in ValiFrame:

Delay After Reset: Time span between the Reset state and
Configure.LFPS used during loopback training.

LFPS count: Number of bursts that are sent to the DUT.

TS1 count: Number of TS1 Ordered Sets which are sent to the
DUT.

TS2 count: Number of TS2 Ordered Sets which are sent to the
DUT.

TSEQ count: Number of TSEQ Ordered Sets which are sent to
the DUT.
If True, the user can specify the Link Training Suite script file which will
be loaded, depending on the loopback training method selected:

Warm Reset Link Training Suite Settings File

Power On Reset Link Training Suite Settings File
o For PowerOn Reset: All the parameters are same
except that in this training method you can set the
value of LFPS trigger threshold.

Vendor Specific Link Training Suite Settings File
o For VendorSpecific: Just select the sequence file.
This file should only contain the loopback pattern for
the generator and the analyzer. When Vendor
Specific is selected, the user is responsible for
setting the DUT in loopback mode.

96
USB Computer Bus
Test Application 4
o
Differential voltage for loopback training: It has the following parameters:
o Long Channel
o Short Channel
o Use voltage setting from Rx tests
o
Error Detector: It sets the following CDR settings:
o Loop bandwidth: It sets the loop bandwidth in MHz.
o Transition density: It sets the Transition density in %.
o Peaking: It sets the peaking in dB.
o DUT transmits with SSC: Indicate if DUT transmits with SCC to
configure the error detector. It is available only for J-BERT
N4903B.
o Expected SSC Deviation: In case DUT transmits with SCC,
specify the expected deviation. Only for J-BERT N4903B
o Equalization: Only for J-BERT M8020A
o Sensitivity: Only for J-BERT M8020A
97
4 USB Computer Bus
Test Application
Rx Specification Version 3.0
4.4.2.1.1 Long Channel Tests
These tests are available for the following configurations:
•
•
•
J-BERT M8020A
4.4.2.1.1.1
5G Receiver Compliance Test
Purpose and Method:
This test determines if the DUT meets the receiver Compliance Test Specification.
The procedure measures the number of symbol errors when all jitter types and the
eye height are set to their specification limit values (maximum for jitter, minimum for
eye height). This is done for several predefined jitter frequencies.
For this measurement, it is necessary to train the DUT into loopback mode. For that,
the data generator sends a training sequence to the DUT. The training sequence is
generated based on the Loopback Training parameter settings (e.g. PowerOnReset
or WarmReset).
The loopback training should be done with the same physical stress parameters as
the measurements. This gives the DUT receiver the chance to optimize its equalizer
for the test signal during loopback training.
Connection Diagram:
98
USB Computer Bus
Test Application 4
Figure 4-52: Connection diagram for 5G Rx Compliance for JBERT N4903B, degenerator = N4916B (Device)
99
4 USB Computer Bus
Test Application
Figure 4-53: Connection diagram for 5G Rx Compliance for JBERT N4903B, degenerator = AUX DATA (Device)
100
USB Computer Bus
Test Application 4
Figure 4-54: Connection diagram for 5G Rx Compliance for M8020A, warm reset (Device)
101
4 USB Computer Bus
Test Application
Figure 4-55: Connection diagram for 5G Rx Compliance for M8020A, Power On Reset (Device)
Loopback Training
•
Retrain at each Jitter Frequency: If false, the DUT is trained into
loopback only at the beginning. If true, it is trained into loopback
for each sinusoidal jitter frequency.
•
Train with Jitter: If true, random and sinusoidal jitter are added to
the signal during loopback training.
Specification
•
•
•
•
•
102
SSC Deviation: Spread spectrum clock deviation (downspread).
SSC Frequency: Frequency of SSC.
Eye Height: The eye height of the generator signal.
Random Jitter: The amount of random jitter (peak peak) added to
the test signal.
HF Sinusoidal Jitter: The sinusoidal jitter amplitude. That only
applies for jitter frequencies above or equal to the 4.9 MHz corner
frequency. For all frequencies below 4.9 MHz, the compliance SJ
levels are used.
USB Computer Bus
Test Application 4
•
•
•
Eye Height Margin: The amount of voltage added to the specified
value of the eye height.
Random Jitter Margin: Percentage of random jitter added to the
base value.
Sinusoidal Jitter Margin: Percentage of sinusoidal jitter added to
the base value.
BER Setup
•
•
•
Target BER: The Target BER for the measurements used in the
test.
Allowed Errors: The number of allowed symbol errors for one
measurement.
Relax Time: The time between the jitter is changed at the
beginning of the measurement.
Used Calibrations:
•
All 5G calibrations except 5G LFPS Voltage Calibration
Procedure Report:
103
4 USB Computer Bus
Test Application
104
USB Computer Bus
Test Application 4
•
•
•
•
•
•
Column1:
o Result: Pass if the number of symbol errors is smaller than or
equal to the Allowed Errors, failed otherwise.
Column 2:
o SJ Frequency [MHz]: The tested sinusoidal jitter frequency point.
Column 3:
o Failed Jitter [UI]: The sinusoidal jitter amplitude if the tested point
fails.
Column 4:
o Passed Jitter [UI]: The sinusoidal jitter amplitude if the tested point
passes.
Column 5:
o Min Spec [UI]: Minimum sinusoidal jitter amplitude that the DUT
must tolerate.
Column 6:
o Symbol Errors: Number of errors during the test.
105
4 USB Computer Bus
Test Application
4.4.2.1.1.2
5G Receiver Constant Parameter Stress Test
Purpose and Method:
This test determines if the DUT meets the receiver specifications for a particular jitter
frequency. The procedure is similar to the receiver compliance test but it measures
the number of symbol errors at a single sinusoidal jitter frequency, by default 4.9
MHz. This procedure is not a compliance test.
Connection Diagram:
Same as for 5G Receiver Compliance Test.
Loopback Training
•
Train with Jitter: Jitter is turned on or off for loopback training.
Specification
•
•
•
•
•
•
•
•
•
SSC Frequency
Random Jitter: The amount of random jitter (rms) added to the test
signal.
Sinusoidal Jitter: The amplitude of the sinusoidal jitter component.
Sinusoidal Jitter Frequency: The frequency of the sinusoidal jitter
component.
base value.
the base value.
BER Setup
•
•
test.
Allowed Errors: The number of allowed errors for one
measurement.
Used Calibrations:
All 5G Calibrations except 5G LFPS Voltage Calibration
Procedure Report:
106
USB Computer Bus
Test Application 4
•
•
Column1:
o Result: Pass if the number of errors is less than or equal to the
number of allowed errors, fail otherwise.
Column 2:
o Bit Errors: Number of errors during the test.
107
4 USB Computer Bus
Test Application
4.4.2.1.1.3
5G Receiver Jitter Tolerance Test
Purpose and Method:
This test characterizes how much jitter a DUT can tolerate at different sinusoidal
jitter frequencies. For each sinusoidal jitter frequency, the jitter amplitude is
increased in equally-spaced steps until the number of measured symbol errors is
bigger than “Allowed Errors”. Please note that this receiver test is not a compliance
test.
Connection Diagram:
Same as for 5G Receiver Compliance Test
Loopback Training
•
Force LB Training at Initialization: If true, loopback training is always done
at the initialization of this test procedure without checking if the DUT is
already in loopback.
•
Retrain at each Jitter Frequency: If true, the DUT is re-trained into loopback
mode for each SJ frequency.
•
Train with Jitter: Jitter is turned on or off for loopback training.
Sinusoidal Jitter Variation
•
Frequency Mode: Specifies the distribution of the frequency points to test. It
can be:
o Compliance Frequencies: Only the jitter frequencies from the
compliance test.
o Equally Spaced Frequencies. Between a minimum and a maximum
frequency the frequency points are distributed equally (linear or
logarithmic).
o User Defined Frequencies: The user can define a list of
frequencies.
o Single Frequency: Only one frequency is tested.
•
Number of Jitter Steps: Number of jitter values tested to search the “Max
passed jitter” at one frequency.
•
Show Min Failed Points: The results graph can show the minimum failed
jitter amplitude in addition to the maximum passed jitter amplitude for each
tested frequency.
Specification:
•
•
SSC Frequency
•
•
Random Jitter: The amount of random jitter (peak-peak) added to the test
signal.
•
Eye Height Margin: The amount of voltage added to the specified value of
the eye height.
•
Random Jitter Margin: Percentage of random jitter added to the base value.
•
Sinusoidal Jitter Margin: Percentage of sinusoidal jitter added to the base
value.
108
USB Computer Bus
Test Application 4
BER Setup
•
Target BER: The Target BER for the measurements used in the test.
•
Allowed Errors: Number of allowed errors for one measurement.
•
Relax Time: Time between when the jitter is changed and the beginning of
the measurement.
Used Calibrations:
Procedure Report:
109
4 USB Computer Bus
Test Application
110
USB Computer Bus
Test Application 4
•
•
•
•
•
•
•
Column 1:
o Results: Shows whether the test has passed or failed.
Column 2 :
o SJ Frequency [MHz]: Shows the sinusoidal jitter frequency set in
the instrument.
Column 3:
o Min Failed Jitter [UI]: Shows the minimum jitter amplitude at
which the DUT introduces errors.
Column 4:
o Max Passed Jitter [UI]: Shows the maximum jitter amplitude at
which the DUT introduces no errors.
Column 5:
o Jitter Capability Test Setup [UI]: Shows the maximum jitter
amplitude that can be set depending on the current hardware
setup.
Column 6:
o Min Spec [UI]: Shows the minimum jitter amplitude defined by the
specification at which the DUT is not allowed to introduce any
error.
Column 7:
o Margin [%]:Shows the ratio between the minimum jitter amplitude
defined by the specification and the maximum jitter amplitude
passed.
111
4 USB Computer Bus
Test Application
4.4.2.1.1.4
5G Receiver Sensitivity Test
Purpose and Method:
This test searches the minimum eye height a DUT can tolerate. The procedure starts
with an eye height value of “Start Eye Height” and decreases it with steps of “Step
Size”. The minimum passed value is the last test point that did not return more errors
than specified in the Allowed Errors parameter. For DUTs which do not support
disconnect it is necessary to train the DUT in every step. This procedure is not a
compliance test.
Connection Diagram:
Loopback Training
•
Force LB Training at Initialization: If true, loopback training is always done
at the initialization of this test procedure without checking if the DUT is
already in loopback.
Eye Height Variation
•
Start Eye Height: The eye height that is used when the test starts.
•
Eye Height Step Size: The amount the eye height is decreased by in one
step to locate the “Min passed Eye Height”.
Specification
•
SSC Deviation: Spread spectrum clock deviation (down spread).
•
SSC Frequency: Frequency of SSC.
•
Random Jitter: The amount of random jitter (peak-peak) added to the test
signal.
•
Sinusoidal Jitter: The amount of sinusoidal jitter (peak-peak) added to the
test signal.
•
component.
•
Random Jitter Margin: Percentage of random jitter added to the base value.
•
Sinusoidal Jitter Margin: Percentage of sinusoidal jitter added to the base
value.
Used Calibrations:
Procedure Report:
112
USB Computer Bus
Test Application 4
•
•
•
•
Column 1:
o Result: The Minimum Passed Differential Voltage should be
smaller than the Minimum Spec.
Column 2:
o Min Passed Differential Voltage [mV]: The smallest eye height at
which the DUT passes the test.
Column 3:
o Min Spec [mV]: The smallest eye height at which the DUT has to
pass the test to meet the specifications.
Column 4:
o Margin [%]: Margin between the Minimum Passed Differential
Voltage and the Min Spec, expressed as a percentage.
113
4 USB Computer Bus
Test Application
4.4.2.1.1.5
5G Receiver Data Rate Deviation Test
Purpose and Method:
This test checks the range of data rate deviation in which the DUT works properly.
The method sets the specified values for eye height, jitter and SSC and measures the
number of symbol errors for every tested deviation. The test is successful when all
deviations between -300 ppm and 300 ppm pass the error test. This method is not a
compliance test.
Connection Diagram:
Data Rate Variation
•
Deviation Mode: Specifies the distribution of the deviation points
to test. It can be:
o Pre-Defined Deviations: The tested points in this mode
are: min spec (-300 ppm), nominal spec (0 ppm), max
spec (300 ppm), -600 ppm, +600 ppm and +2500 ppm.
The last three of those do not affect the overall test result
because they are out of the specification range.
o Equally Spaced Deviations.
o User Defined Deviations.
o Single Deviation.
Specification
•
•
•
•
•
•
•
•
•
SSC Deviation: Spread spectrum clock (down spread) deviation.
SSC Frequency: Frequency of the SSC.
Random Jitter: The amount of random jitter (rms) added to the test
signal.
Sinusoidal Jitter: The amplitude of the sinusoidal jitter component.
component.
base value.
the base value.
BER Setup
•
•
•
114
test.
measurement.
Relax Time: Time between when the jitter is changed and the
USB Computer Bus
Test Application 4
Used Calibrations:
Procedure Report:
115
4 USB Computer Bus
Test Application
•
•
•
•
•
Column1:
o Result: The deviations inside the range -300 ppm to 300 ppm have to
pass for the the overall test result to pass. The other deviations are
informative only.
Column 2:
o Deviation [ppm]: Deviation added to the nominal data rate.
Column 3:
o Data Rate [GBit/s]: Data rate after adding the deviation.
Column 4:
o Errors [ ]: Number of errors during the test.
Column 5:
o Comment: Additional remarks.
4.4.2.1.2 Short Channel Tests
•
•
•
J-BERT M8020A
4.4.2.1.2.1
5G Receiver Short Channel Compliance Test
Purpose and Method:
or WarmReset).
Connection Diagram:
116
USB Computer Bus
Test Application 4
Figure 4-61: Connection diagram for JBERT N4903B, degenerator = N4916B (Device)
117
4 USB Computer Bus
Test Application
Figure 4-62: Connection diagram for JBERT N4903B, degenerator = AUX DATA (Device)
118
USB Computer Bus
Test Application 4
Figure 4-63: Connection diagram for M8020A, warm reset (Device)
119
4 USB Computer Bus
Test Application
Figure 4-64: Connection diagram for M8020A, Power On Reset (Device)
The method and the parameters in Expert mode are the same as for the 5G Receiver
Compliance Test. There are two differences, however:
•
Instead of using a signal with the minimum eye height, the maximum
differential voltage is set to test the short channel scenario.
•
Instead of the USB 3.0 Device/Host fixtures the Keysight U7242-66501
fixture is used. It has less insertion loss.
Used Calibrations:
Procedure Report:
120
USB Computer Bus
Test Application 4
121
4 USB Computer Bus
Test Application
•
•
•
•
•
•
122
Column1:
o Result: The number of errors should be less than the number of
allowed errors.
Column 2:
o SJ Frequency [UI]: Sinusoidal jitter frequency.
Column 3:
o Failed Jitter[UI]: The amplitude of the jitter that fails the test.
Column 4:
o Passed Jitter[UI]: The amplitude of the jitter that passes the test.
Column 5:
o Min Spec[UI]
Column 6:
o Symbol Errors: Number of errors during the test.
USB Computer Bus
Test Application 4
4.4.2.1.2.2
5G Receiver Short Channel Constant Parameter Stress Test
Purpose and Method:
frequency. The procedure is similar to the receiver compliance test but it measures
the number of symbol errors at a single sinusoidal jitter frequency, by default 4.9
MHz. This procedure is not a compliance test.
Connection Diagram:
Same as for 5G Short Channel Compliance Test.
All the parameters are the same as for 5G Receiver Compliance Test (Long Channel
Test), but with the following difference:
•
Instead of using a signal with the minimum eye height, the maximum
Differential Voltage is set to test the short channel scenario.
Used Calibrations:
Procedure Report:
123
4 USB Computer Bus
Test Application
•
•
124
Column1:
allowed errors.
Column 2:
o Bit Errors: Number of errors during the test.
USB Computer Bus
Test Application 4
4.4.2.1.2.3
5G Receiver Short Channel Jitter Tolerance Test
Purpose and Method:
test.
Connection Diagram:
Same as for 5G Receiver Compliance Test (Short Channel Test).
All the parameter are same as for 5G Receiver Compliance Test (Long Channel Test),
but with the following difference:
•
Instead of using a signal with the minimum eye height the maximum
Used Calibrations:
Procedure Report:
125
4 USB Computer Bus
Test Application
126
USB Computer Bus
Test Application 4
•
•
•
•
•
•
•
4.4.2.1.2.4
Column 1:
o Result: Shows whether the test has passed or failed.
Column 2:
the instrument.
Column 3:
which the DUT introduces errors.Shows the number of failed jitter.
Column 4:
which the DUT introduces no errors.number of passed jitter.
Column 5:
setup.
Column 6:
error.
Column 7:
o Margin [%]: Shows the ratio between the minimum jitter amplitude
passed.
5G Receiver Short Channel Sensitivity Test
Purpose and Method
This test is similar to the 5G Receiver (Long Channel) Sensitivity Test. The difference
is that instead of using a signal with the Eye height variation, it has differential
voltage variation set to test the short channel scenario.
This test searches the minimum differential voltage a DUT can tolerate. The
procedure starts with a differential voltage value of “Start Differential Voltage” and
decreases it with steps of “Differential Voltage Step Size”. The minimum passed value
is the last test point that did not return more errors than specified in the Allowed
Errors parameter. For DUTs which do not support disconnect it is necessary to train
the DUT in every step. This procedure is not a compliance test.
Connection Diagram:
All the parameter are same as for 5G Receiver Sensitivity Test (Long Channel Test),
•
Differential Voltage Variation
•
Start Differential Voltage: The differential Voltage where the test
starts.
•
Differential Voltage Step Size: Span between two consecutive
differential voltage steps.
127
4 USB Computer Bus
Test Application
Used Calibrations:
Procedure Report:
128
USB Computer Bus
Test Application 4
•
•
•
•
Column 1:
o Result: The Min Passed Differential Voltage should be smaller than
the Min Spec.
Column 2:
o Min Passed Differntial Voltage [mV]: The smallest differential
voltage at which the DUT passes the test.
Column 3:
o Min Spec [mV]: The smallest differential voltage at which the DUT
has to pass the test to meet the specifications.
Column 4:
o Margin [%]: Ratio between the Min Passed Jitter and the Min
Spec, expressed as a percentage.
129
4 USB Computer Bus
Test Application
4.4.2.1.2.5
5G Receiver Short Channel Data Rate Deviation Test
Purpose and Method:
The method sets the specified values for differential voltage, jitter, and SSC, and
measures the number of symbol errors for every tested deviation. The test is
successful when all the deviations between -300 ppm and 300 ppm pass the error
test. This method is not a compliance test.
Connection Diagram:
All the parameter are same as for 5G Receiver Data Rate Deviation Test (Long
Channel Test), but with the following difference:
•
Instead of using a signal with the minimum eye height the maximum
Used Calibrations:
Procedure Report:
130
USB Computer Bus
Test Application 4
Figure 4-69: Result Description
131
4 USB Computer Bus
Test Application
•
•
•
•
•
Column 1:
o Result: The deviations inside the range -300 ppm to 300 ppm have to
pass for the overall test result to pass. The other deviations are
informative only.
Column 2:
Column 3:
Column 4:
Column 5:
o Comments: Additional remarks.
4.4.2.1.3 LFPS Tests
The LFPS tests contain the following common parameters:
Repetitions: The number of times to repeat the test sequence.
Send TSEQ after LFPS: Set to True, in case of crystal-less devices, which require
TSEQ pattern after LFPS for their CDR.
Trigger Delay after LFPS: Sets the time between the last LFPS burst sent out by the
pattern generator and the oscilloscope start with acquisition to detect TSEQ sent by
the DUT.
•
•
J-BERT M8020A
4.4.2.1.3.1
5G Receiver LFPS Compliance Test
Purpose and Method:
This test verifies that the DUT recognizes LFPS signaling at the limit of what the spec
allows. The procedure generates a sequence consisting of an LFPS pattern looped 16
times. The sequence is downloaded to the J-BERT and sent to the DUT. The
procedure checks if the DUT responds with TSEQ using a real time oscilloscope. This
is repeated for a set of differential voltage and duty cycle compliance combinations.
Connection Diagram:
132
USB Computer Bus
Test Application 4
Figure 4-70: Connection setup for 5G Receiver LFPS Compliance Test
133
4 USB Computer Bus
Test Application
Specification
•
tPeriod: The period of a single LFPS cycle.
•
tBurst: The period of time LFPS cycles are continuously sent to form a
single LFPS burst.
•
tRepeat: The time between the start of two adjacent LFPS bursts.
The following figure illustrates the concept of tPeriod, tBurst, and tRepeat.
Figure 4-71: LFPS definitions
Used Calibrations:
Procedure Report:
134
USB Computer Bus
Test Application 4
•
•
•
Column 1:
o Result: The test passes if the DUT answers with TSEQ.
Column 2:
o Diff Volt pp [mV]: Differential voltage of the LFPS.
Column 3:
o Duty Cycle [%]: Duty cycle of the LFPS.
135
4 USB Computer Bus
Test Application
4.4.2.1.3.2
5G Receiver LFPS Sensitivity Test
Purpose and Method:
This procedure characterizes the minimum differential LFPS amplitude at which the
DUT still answers to the LFPS signal.
Connection Diagram:
Same as for 5G Receiver LFPS Compliance Test.
•
Start Differential Voltage: The start differential voltage (peak-peak)
of the LFPS bursts.
•
Differential Voltage Step Size: The amount the differential voltage
is decreased by, at each step.
Specification
•
•
tBurst: The period of time LFPS cycles are sent continuously to
form a single LFPS burst.
•
•
Duty Cycle: The duty cycle of the LFPS burst.
Used Calibrations:
Procedure Report:
136
USB Computer Bus
Test Application 4
•
•
•
•
Column 1:
o Result: The test passes if the minimum passed differential voltage
is smaller than or equal to the spec limit.
Column 2:
o Min Passed Diff Volt pp [mV]: Minimum Differential voltage of the
LFPS at which DUT answer with a TSEQ.
Column 3:
o Min Spec [mV]: The minimum spec levels.
Column 4:
o Margin [%]: The margin between the minimum passed differential
voltage and the spec level, expressed as a percentage.
137
4 USB Computer Bus
Test Application
4.4.2.1.3.3
5G Receiver LFPS Duty Cycle Test
Purpose and Method:
This procedure characterizes the LFPS duty cycle range that the DUT detects. The
data generator sends LFPS signals varying the duty cycle in each test step. Each step
is passed if the DUT sends the TSEQ pattern upon detecting the LFPS signal. The
test passes if the DUT could respond to LFPS signals with a duty cycle between 40
and 60%.
Connection Diagram:
Duty Cycle Variation
•
Start Duty Cycle: The duty cycle value for the first step.
•
Stop Duty Cycle: The duty cycle value for the last step.
•
Duty Cycle Step Size: After every step, the duty cycle is increased
by this value.
Specification
•
•
tBurst: The period of time LFPS cycles are continuously sent to
form a single LFPS burst.
•
•
Differential Voltage: The differential voltage (peak - peak) for the
LFPS signal.
Used Calibrations:
Procedure Report:
138
USB Computer Bus
Test Application 4
•
•
•
•
Column1:
o Result
Column 2:
o Duty Cycle [%]
Column 3:
o Min Spec
Column 4:
o Max Spec
139
4 USB Computer Bus
Test Application
4.4.2.1.3.4
5G Receiver LFPS tRepeat Test
Purpose and Method:
This procedure determines whether the DUT responds to LFPS signals with different
tRepeat values.
Connection Diagram:
Specification
•
•
single LFPS burst.
•
Differential Voltage: The differential voltage peak-peak of the LFPS burst.
•
Duty Cycle: The duty cycle within tPeriod.
tRepeat Variation
•
Start tRepeat
•
Stop tRepeat
•
tRepeat Step Size
Used Calibrations:
Procedure Report:
140
USB Computer Bus
Test Application 4
141
4 USB Computer Bus
Test Application
•
•
•
•
Column 1:
o Result
Column 2:
o tRepeat [us]
Column 3:
o Min Spec [us]
Column 4:
o Max Spec [us]
4.4.2.1.4 Power Connections
This section illustrates the power connections and use of test fixtures in the
procedures compliant with the Receiver Specification Version 3.0.
On the Configure DUT window, click "Show Parameters" to display the Test
Parameters window. On the "Test Parameters" window, the "Common" tab enables
you to select a Power Mode. You can select Manual, PowerSwitch, or PowerSupply.
This section describes the required power connections for each of these modes.
4.4.2.1.4.1
Manual
In the Manual mode, the user is responsible for supplying power to the DUT and
power-cycling it. The following two diagrams illustrate the connections between the
DUT and test fixtures for the Device and Host cases.
Device
Figure 4-76 Device test fixtures
Host
142
USB Computer Bus
Test Application 4
Figure 4-77: Host Test Fixtures
4.4.2.1.4.2
Power Switch, Vbus
In the PowerSwitch Mode, you can use either the Vbus or Main Power component to
power up the DUT or enable the DUT's USB bus. The following diagrams illustrate
the power connections for the Device and Host cases.
Device
Figure 4-78: Device test fixtures
4.4.2.1.4.3
Power Switch, Main Power
Device
143
4 USB Computer Bus
Test Application
Host
Figure 4-80: Host test fixtures
4.4.2.1.4.4
Power Supply, Vbus
In the PowerSupply mode, by default, any of these power supply instruments can be
used for auto loopback training: E3631A, E363xA, E364xA, or N67xx. The following
diagrams illustrate the power connections for the Device and Host cases.
Device
144
USB Computer Bus
Test Application 4
4.4.2.1.4.5
Power Supply, Main Power
Device
Host
145
4 USB Computer Bus
Test Application
Rx Specification Version 3.1
Common Receiver Parameters:
Same as for USB Spec Version 3.0. But the following differences exist:
•
On Common Test parameter tab there is a new parameter Type –C-Fixture
(only available if the connector type selected is Type-C). It allows to select:
o USB IF fixture. or
o N7015A: By selecting N7015A fixture , a new parameter, ISI
Channel is displayed.
•
On the Rx Super Speed Plus tab, there is a more parameter “Use Link
Training Suite script”, which is the same as available on the Rx super speed
tab but with the difference that it is selected, by default, and cannot be
disabled. This is because in case of Super Speed Plus, it is mandatory to
use a Link Training Suite script file.
4.4.2.2.1 Long Channel Tests
•
•
•
J-BERT M8020A
4.4.2.2.1.1
146
5G Receiver Compliance Test
USB Computer Bus
Test Application 4
Purpose and Method:
or WarmReset).
Connection Diagram:
Figure 4-84: Connection setup for 5G Receiver1 Comp Test for Super Speed with Long Channel
(J-BERT N4903B, DeGeneration = N4916B)
147
4 USB Computer Bus
Test Application
Figure 4-85: Connection setup for 5G Receiver1 Comp Test for Super Speed with Long Channel
(J-BERT N4903B, DeGeneration = AUX DATA)
148
USB Computer Bus
Test Application 4
Figure 4-86: Connection setup for 5G Receiver Comp Test for Super Speed with Long Channel Test (M8020A)
149
4 USB Computer Bus
Test Application
Figure 4-87: Connection setup for 5G Receiver Comp Test for Super Speed with Long Channel Test (M8020A) using Keysight N7015A Test Fixture
Same as for the 5G Receiver Compliance Test for Spec Version 3.0 with the following
are the differences:
•
Instead of using a signal with the minimum eye height, the differential
voltage is set to test the channel scenario.
•
There are no margin parameters, i.e., Eye Height Margin, Random Jitter
Margin, and Sinusoidal Jitter Margin.
Used Calibrations:
All 5G Calibrations
Procedure Report:
150
USB Computer Bus
Test Application 4
151
4 USB Computer Bus
Test Application
•
•
•
•
•
Column 1:
o
Column 2:
o
Column 3:
o
Column 4:
o
152
SJ Frequency [MHz]: The tested sinusoidal jitter frequency
point.
Failed Jitter [UI]: The amplitude of the jitter that causes the
test to fail.
Passed Jitter [UI]: The amplitude of the jitter that causes the
test to pass.
Column :
o
•
Result: Pass if the number of symbol errors is smaller than or
equal to the Allowed Errors, failed otherwise.
Column 4 :
o
Min Spec [UI]: Minimum sinusoidal jitter amplitude that the
DUT must tolerate.
Symbol Errors: Shows the number of symbol errors.
USB Computer Bus
Test Application 4
4.4.2.2.1.2
5G Receiver Constant Parameter Stress Test
Purpose and Method:
frequency. The procedure is similar to the receiver compliance test but it only
measures the number of symbol errors once, by default at 4.9 MHz sinusoidal jitter.
This procedure is not a compliance test.
Connection Diagram:
The parameters in the Expert mode are the same as for 5G Receiver Constant
Parameter Stress Test for spec version 3.0, but thefollowing are the differences:
•
•
Used Calibrations:
All 5G Calibrations
Procedure Report:
153
4 USB Computer Bus
Test Application
•
•
154
Column 1:
o Result: Shows the test result.
Column 2 :
o Bit Errors: Shows the number of Bit errors.
USB Computer Bus
Test Application 4
4.4.2.2.1.3
5G Receiver Jitter Tolerance Test
Purpose and Method:
jitter frequencies. Starting with the “Min Frequency” the jitter amplitude is increased
with equally spaced steps until the number of measured symbol errors is bigger than
“Allowed Errors”. The test is then repeated for all the remaining SJ frequencies. This
method is not a compliance test.
Connection Diagram:
The parameters in Expert mode are the same as for 5G Receiver Jitter Tolerance Test
for spec version 3.0 but the following are the differences:
•
•
There are no margin parameters, i.e. Eye Height Margin, Random Jitter
Used Calibrations:
All 5G Calibrations
Procedure Report:
155
4 USB Computer Bus
Test Application
156
USB Computer Bus
Test Application 4
•
•
•
•
•
•
•
4.4.2.2.1.4
Column 1:
Column 2 :
the instrument.
Column 3:
Column 4 :
Column 5 :
setup.
Column 6:
o Min Spec[UI]: Shows the minimum jitter amplitude defined by the
error.
Column 7:
o Margin [%]: Shows the ratio between the minimum jitter
amplitude defined by the specification and the maximum jitter
amplitude passed.
5G Receiver Sensitivity Test
Purpose and Method:
This test determines the minimum differential voltage at which DUT does not
generate errors.
Connection Diagram: Same as for 5G Receiver Compliance Test.
The parameters in the Expert mode are the same as for 5G Receiver Sensitivity Test
for spec version 3.0, but the following are some of the differences:
•
Instead of using an eye height variation, it uses the Differential Voltage
Variation as following:
o Start Differential Voltage: The differential amplitude where the test
starts looking for the squelch level.
o Differential Voltage Step Size: Step size used to increase the
differential amplitude.
•
Used Calibrations:
All 5G Calibrations
Procedure Report:
157
4 USB Computer Bus
Test Application
•
•
•
•
158
Column 1:
Column 2 :
o Min Passed Differential Voltage [mV]: Shows the smallest value of
differential voltage at which the DUT passes the test.
Column 3 :
o Min Spec[UI]: The smallest differential voltage at which the DUT
has to pass the test to meet the specifications..
Column 4 :
o Magin: Margin between the Minimum Passed Differential Voltage
and the Min Spec, expressed as a percentage.
USB Computer Bus
Test Application 4
4.4.2.2.1.5
5G Data Rate Deviation Test
Purpose and Method:
The method sets the specified values for differential voltage, jitter, and SSC and
successful when all deviations between -300 ppm and 300 ppm pass the error test.
This method is not a compliance test.
Connection Diagram:
Same as for 5G Compliance Test.
The parameters in the Expert mode are the same as for 5G Receiver Data Rate
Deviation Test for spec version 3.0, but the following are some differences:
•
•
Used Calibrations:
All 5G Calibrations
Procedure Report:
159
4 USB Computer Bus
Test Application
•
•
•
•
•
160
Column 1:
o Result: The deviations inside the range -300 ppm to 300 ppm have
to pass for the the overall test result to pass. The other deviations
are informative only.
Column 2 :
Column 3:
Column 4 :
o Errors: Shows the number of errors during the test.
Column 5:
Comments: Shows additional remarks.
USB Computer Bus
Test Application 4
4.4.2.2.2 Short Channel Tests
•
•
•
J-BERT M8020A
4.4.2.2.2.1
5G Receiver Short Channel Compliance Test
Purpose and Method:
or WarmReset).
Connection Diagram:
161
4 USB Computer Bus
Test Application
Figure 4-93: Connection setup for 5G Receiver 1 Short Channel Comp Test for Super Speed with Short Channel
162
USB Computer Bus
Test Application 4
Figure 4-94: Connection setup for5G Receiver 1 Short Channel Comp Test for Super Speed with Short Channel
163
4 USB Computer Bus
Test Application
Figure 4-95: Connection setup for5G Receiver 1 Short Channel Comp Test for Super Speed with Short Channel (M8020A)
164
USB Computer Bus
Test Application 4
Figure 4-96: Connection setup for 5G Receiver 1 Short Channel Comp Test for Super Speed with Short Channel (M8020A) using Keysight N7015A Test Fixture
Used Calibrations:
All 5G Calibrations
Procedure Report:
165
4 USB Computer Bus
Test Application
166
USB Computer Bus
Test Application 4
•
•
•
•
•
•
4.4.2.2.2.2
Column 1:
allowed errors.
Column 2 :
o SJ Frequency [MHz]: Shows the Sinusoidal Jitter frequency set in
the instrument.
Column 3:
o Failed Jitter: The amplitude of the jitter that fails the test.
Column 4 :
o Passed Jitter: The amplitude of the jitter that passes the test.
Column 5:
o Min Spec[UI]: Minimum sinusoidal jitter amplitude that the DUT
must tolerate.
Column 6:
o Symbol Errors: The number of errors during the test.
5G Receiver Short Channel Constant Parameter Stress Test
Purpose and Method:
Connection Diagram:
Same as for 5G Receiver Constant Parameter Stress Test.
Used Calibrations:
All 5G Calibrations
Procedure Report:
167
4 USB Computer Bus
Test Application
•
•
4.4.2.2.2.3
168
Column 1:
Column 2 :
o Bitl Errors: Shows the number of Bit errors.
5G Receiver Short Channel Jitter Tolerance Test
USB Computer Bus
Test Application 4
Purpose and Method:
jitter frequencies. Starting with the “Min Frequency” the jitter amplitude is increased
with equally spaced steps until the number of measured symbol errors is bigger than
“Allowed Errors”. The test is then repeated for all the remaining SJ frequencies. This
method is not a compliance test.
Connection Diagram:
Same as for 5G Receiver Jitter Tolerance Test.
Used Calibrations:
All 5G Calibrations
Procedure Report:
169
4 USB Computer Bus
Test Application
170
USB Computer Bus
Test Application 4
•
•
•
•
•
•
•
4.4.2.2.2.4
Column 1:
Column 2:
the instrument.
Column 3:
o Min Failed Jitter: Shows the minimum jitter amplitude at which the
DUT introduces errors.Shows the number of failed jitter.
Column 4:
o Max Passed Jitter: Shows the maximum jitter amplitude at which
the DUT introduces no errors.number of passed jitter.
Column 5:
setup.
Column 6:
error.
Column 7:
passed.
5G Receiver Short Channel Sensitivity Test
Purpose and Method:
This test determines the minimum differential voltage at which DUT does not
generate errors.
Connection Diagram:
Same as for 5G Receiver Compliance Test
Same as for 5G Receiver Channel Sensiivity Test.
Used Calibrations:
All 5G Calibrations
Procedure Report:
171
4 USB Computer Bus
Test Application
•
•
•
•
172
Column 1:
the Min Spec.
Column 2:
o Min Passed Differential Voltage [mV]: The smallest differential
voltage at which the DUT passes the test.
Column 3:
o Min Spec [UI]: The smallest differential voltage at which the DUT
Column 4:
USB Computer Bus
Test Application 4
4.4.2.2.2.5
5G Receiver Short Channel Data Rate Deviation Test
Purpose and Method:
The method sets the specified values for differential voltage, jitter, and SSC, and
successful when all the deviations between -300 ppm and 300 ppm pass the error
test. This method is not a compliance test.
Connection Diagram:
Same as for 5G Receiver Data Rate Deviation Test.
Used Calibrations:
All 5G Calibrations
Procedure Report:
173
4 USB Computer Bus
Test Application
174
USB Computer Bus
Test Application 4
•
•
•
•
•
Column 1:
o Result: The deviations inside the range -300 ppm to 300 ppm have
to pass for the the overall test result to pass. The other deviations
are informative only.
Column 2:
Column 3:
Column 4:
Column 5:
o Comments: Additional remarks.
175
4 USB Computer Bus
Test Application
4.4.2.2.3 LFPS Tests
The LFPS tests contain the following common parameters:
Repetitions: The number of times to repeat the test sequence.
Send TSEQ after LFPS: Set to True, in case of crystal-less devices, which require
TSEQ pattern after LFPS for their CDR.
Trigger Delay after LFPS: Sets the time between the last LFPS burst sent out by the
pattern generator and the oscilloscope start with acquisition to detect TSEQ sent by
the DUT.
•
•
J-BERT M8020A
4.4.2.2.3.1
5G Receiver LFPS Compliance Test
Purpose and Method:
This procedure verifies that the DUT recognizes LFPS signling at the limit of what the
spec allows. The procedure generates a sequence consisting of an LFPS pattern
looped 16 times. The sequence is downloaded to the J-BERT and sent to the DUT.
The procedure checks if the DUT responds with TSEQ using a real time oscilloscope.
This is repeated for a set of differential voltage and duty cycle compliance
combinations.
Connection Diagram:
176
USB Computer Bus
Test Application 4
Figure 4-102: Connection setup for 5G Receiver LFPS Compliance Test
177
4 USB Computer Bus
Test Application
Figure 4-103: Connection setup for 5G Receiver LFPS Compliance Test (M8020A)
178
USB Computer Bus
Test Application 4
Figure 4-104: Connection setup for 5G Receiver LFPS Compliance Test (M8020A) using Keysight N7015A Test Fixture
179
4 USB Computer Bus
Test Application
Same as for 5G Receiver LFPS Compliance Test for Spec Version 3.0.
Used Calibrations:
Procedure Report:
•
•
•
180
Column 1:
o Result: The test passes if the DUT answers with TSEQ.
Column 2 :
o Diff Volt pp [mV]: Differential voltage of the LFPS.
Column 3:
o Duty Cycle [%]: Duty cycle of the LFPS.
USB Computer Bus
Test Application 4
4.4.2.2.3.2
5G Receiver LFPS Sensitivity Test
Purpose and Method:
This procedure determines the minimum differential voltage of LFPS burst that the
DUT can recognize.
Connection Diagram:
Same as for 5G Receiver LFPS Sensitivity Test for Spec Version 3.0.
Used Calibrations:
Procedure Report:
181
4 USB Computer Bus
Test Application
•
•
•
•
4.4.2.2.3.3
Column 1:
o Result: The test passes if the minimum passed differential voltage
is smaller than or equal to the spec limit.
Column 2:
o Min Passed Diff Volt pp [mV]: Minimum Differential voltage of the
LFPS at which DUT answer with a TSEQ.
Column 3:
o Min Spec [mV]: The minimum spec levels.
Column 4:
o Margin [%]: The margin between the minimum passed differential
voltage and the spec level, expressed as a percentage.
5G Receiver LFPS Duty Cycle Test
Purpose and Method:
This procedure determines the minimum and maximum duty cycle of the LFPS burst
that the DUT can recognize. The data generator sends LFPS signals varying the duty
cycle in each test step. Each step is passed if the DUT sends the TSEQ pattern upon
detecting the LFPS signal. The test passes if the DUT could respond to LFPS signals
with a duty cycle between 40 and 60%.
Connection Diagram:
Same as for 5G Receiver LFPS Duty Cycle Test for Spec Version 3.0
Used Calibrations:
Procedure Report:
182
USB Computer Bus
Test Application 4
•
•
•
•
Column 1:
o Result
Column 2:
o Duty Cycle [%]
Column 3:
o Min Spec [%]
Column 4:
o Max Spec [%]
183
4 USB Computer Bus
Test Application
4.4.2.2.3.4
5G Receiver LFPS tRepeat Test
Purpose and Method:
This procedure determines whether the DUT responds to LFPS signals with different
tRepeat values.
Connection Diagram:
Specification
•
•
single LFPS burst.
•
Differential Voltage: The differential voltage peak-peak of the LFPS burst.
•
Duty Cycle: The duty cycle within tPeriod.
tRepeat Variation
•
Start tRepeat
•
Stop tRepeat
•
tRepeat Step Size
Used Calibrations:
Procedure Report:
184
USB Computer Bus
Test Application 4
185
4 USB Computer Bus
Test Application
•
•
•
•
Column 1:
o Result
Column 2:
o tRepeat [us]
Column 3:
o Min Spec [us]
Column 4:
o Max Spec [us]
4.4.2.2.4 Power Connections
This section illustrates the power connections and use of test fixtures in the
procedures compliant with the Receiver Specification Version 3.1.
On the Configure DUT window, click "Show Parameters" to display the Test
Parameters window. On the "Test Parameters" window, the "Common" tab enables
you to select a Power Mode. You can select Manual, PowerSwitch, or PowerSupply.
This section describes the required power connections for each of these modes.
4.4.2.2.4.1
Manual
In the Manual mode, the user is responsible for supplying power to the DUT and
power-cycling it. The following two diagrams illustrate the connections between the
DUT and test fixtures for the Device and Host cases.
Device
Figure 4-109 Device test fixtures
Host
186
USB Computer Bus
Test Application 4
4.4.2.2.4.2
Power Switch, Vbus
In the PowerSwitch Mode, you can use either the Vbus or Main Power component to
power up the DUT or enable the DUT's USB bus. The following diagrams illustrate
the power connections for the Device and Host cases.
Device
187
4 USB Computer Bus
Test Application
4.4.2.2.4.3
Power Switch, Main Power
In the PowerSupply mode, by default, any of these power supply instruments can be
used for auto loopback training: E3631A, E363xA, E364xA, or N67xx. The following
diagrams illustrate the power connections for the Device and Host cases.
Device
Host
188
USB Computer Bus
Test Application 4
4.4.2.2.4.4
Power Supply, Vbus
Device
4.4.2.2.4.5
Power Supply, Main Power
Device
189
4 USB Computer Bus
Test Application
Host
190
USB Computer Bus
Test Application 4
4.5
Super Speed Plus Module Procedure Description
•
•
J-BERT M8020A
4.5.1 Calibration
4.5.1.1.1 10G Pre-Shoot Calibration
Purpose and Method:
This procedure calibrates the pre-shoot by performing a sweep of several pre-shoot
settings. The pattern generator first sends the equalization pattern to the
oscilloscope. The pre-shoot is set from 0 to 6 dB with 1 dB steps. The real values are
measured with the oscilloscope.
Connection Diagram:
Figure 4-117: Connection setup for pre-shoot calibration (J-BERT N4903B, DeGeneration = N4916)
191
4 USB Computer Bus
Test Application
Figure 4-118: Connection setup for pre-shoot calibration (M8020A)
Used Calibrations:
None
Procedure Report:
192
USB Computer Bus
Test Application 4
•
•
Column 1:
o
Column 2
o
Set Pre-Shoot [dB]: Shows the Pre-Shoot value, set in the
instrument.
Measured Pre-Shoot [dB]: Shows the measured Pre-Shoot.
193
4 USB Computer Bus
Test Application
4.5.1.1.2 10G De-Emphasis Calibration
Purpose and Method:
This procedure calibrates the de-emphasis by performing a sweep of several deemphasis settings. The pattern generator first sends the equalization pattern to the
oscilloscope. The de-emphasis is set from -6 to 0 dB with 1 dB steps. The real values
are measured with the oscilloscope.
Connection Diagram:
Same as for 10G Pre-Shoot Calibration.
Used Calibrations:
10G Pre-Shoot Calibration
Procedure Report:
194
USB Computer Bus
Test Application 4
•
•
Column 1:
o
Column 2:
o
Set De-Emphasis [dB]: Shows the de-emphasis value, set in
the instrument.
Measurd De-Emphasis [dB]: Shows the measured deemphasis for each voltage point.
195
4 USB Computer Bus
Test Application
4.5.1.1.3 10G Generator Output Voltage Calibration
Purpose and Method:
This procedure calibrates the differential voltage. In this procedure, the pre-shoot is
first set to 2.2 dB using the pre-shoot calibration. Next, three different de-emphasis
levels, 0 dB, -3dB, and -6 dB are set using the de-emphasis calibration. The
generator output voltage levels are set to 900 mV and 700 mV, respectively. Finally,
the two different voltage levels are measured with the oscillosope.
Connection Diagram:
Same as 10G Pre-Shoot Calibration
Used Calibrations:
10G Pre-Shoot Calibration
10G De-Emphasis Calibration
Procedure Report:
196
USB Computer Bus
Test Application 4
Figure 4-121 Result Description
•
•
Column 1:
o
Set Generator Voltage: Shows the generator voltage value,
set in the instrument.
Column 2, 3, & 4:
o Voltage x[dB] de-emphasis [mv]: Shows the measured
voltage.
197
4 USB Computer Bus
Test Application
4.5.1.1.4 10G Random Jitter Calibration
Purpose and Method:
This procedure calibrates the random jitter (RJ) directly at the generator output. The
data generator sends the CP10 compliance pattern. It sets a total of 10 RJ values
from 0 to 5 ps. These values are in the steps of 0.25 ps from 0 to 1 ps, and then from
1 to 2 ps with 1.5 ps as the intermediate step, and finally from 2 to 5 ps, in the steps
of 1 ps (values set as 2 ps, 3 ps, 4 ps, and 5 ps). The jitter is measured with a real
time oscilloscope using SigTest.
Connection Diagram:
Number of Averages: Number of waveforms that will be acquired for SigTest
calculations.
Used Calibrations:
None
Procedure Report:
198
USB Computer Bus
Test Application 4
•
•
Column 1:
o
Column 2,:
o
Set Random Jitter: Shows the random jitter amplitude set in
the instrument.
Measured RJ [ps]: Shows the measured random jitter
amplitude.
199
4 USB Computer Bus
Test Application
4.5.1.1.5 10G LF Sinusoidal Jitter Calibration
Purpose and Method:
This procedure calibrates the low frequency sinusoidal jitter directly at the generator
output. This procedure calibrates the sinusoidal jitter for low frequencies (from 200
KHz to 4 MHz). The data generator sends the CP9 compliance pattern during this
calibration.
The procedure makes a sinusoidal jitter sweep in five different frequencies. It checks
that the measured jitter amplitude values are consistent across jitter frequencies.
Deviations bigger than 2.5 % between the measured jitter amplitudes for the same
set jitter amplitude with different frequencies are not allowed. In case of a bigger
deviation, the point is re-measured up to three times. The sinusoidal jitter is
measured with the oscilloscope using the SigTest software. SigTest is the standard
method to measure Eye Height and Jitter. It is the only valid option for compliance
testing.
Connection Diagram:
Used Calibrations:
None
Procedure Report:
200
USB Computer Bus
Test Application 4
•
•
Column 1:
o Set Jitter: Shows the jitter amplitude set in the instrument.
Column 2, 3, 4, 5 & 6 :
o SJ (x MHz) [ps]: Shows the measured jitter.
201
4 USB Computer Bus
Test Application
4.5.1.1.6 10G HF Sinusoidal Jitter Calibration
Purpose and Method:
This procedure calibrates the low frequency sinusoidal jitter directly at the generator
output. This procedure calibrates the sinusoidal jitter for low frequencies (from 10
MHz to 100 MHz). The data generator sends the CP9 compliance pattern during this
calibration.
The procedure makes a sinusoidal jitter sweep in three different frequencies. It
checks that the measured jitter amplitude values are consistent across jitter
frequencies. Deviations bigger than 5 % between the measured jitter amplitudes for
the same set jitter amplitude with different frequencies are not allowed. In case of a
bigger deviation, the point is re-measured up to three times. The sinusoidal jitter is
measured with the oscilloscope using the SigTest software. SigTest is the standard
method to measure Eye Height and Jitter. It is the only valid option for compliance
testing.
Connection Diagram:
Same as for 10G LF Sinusoidal Jitter Calibration.
Used Calibrations:
None
Procedure Report:
202
USB Computer Bus
Test Application 4
•
•
Column 1:
o
Set Sinusoidal Jitter [ps]: Shows the sinusoidal jitter
amplitude set in the instrument.
Column 2, 3, & 4,:
o SJ (x MHz) [ps]: Shows the measured sinusoidal jitter
amplitude.
203
4 USB Computer Bus
Test Application
Long Channel
All the calibrations in this section are performed using a calibration channel.
4.5.1.2.1 10G Compliance Load Board Selection
Purpose and Method:
In this procedure, the data generator sends the CP9 compliance pattern. The
procedure measures the eye height with nominal stress settings (refer to the noneditable parameters for this test) of all three CLBs to determine the right CLB that
will be used for further calibrations and Rx tests. The software selects the CLB with
which the measured eye height is closest to 70 mV.
Connection diagram:
204
USB Computer Bus
Test Application 4
Figure 4-125: Connection Setup for 10G Compliance Load Board Selection (J-BERT N4903B, DeGeneration = N4916B)
205
4 USB Computer Bus
Test Application
Figure 4-126: Connection Setup for 10G Compliance Load Board Selection (M8020A)
206
USB Computer Bus
Test Application 4
Non-editable
•
SSC Deviation
•
Pre- Shoot
•
De-Emphasis: The de-emphasis of the data signal
•
Differential Voltage: The differential voltage (peak - peak) for the signal.
•
Random Jitter: The amount of random jitter (peak peak) added to the test
signal.
•
Sinusoidal Jitter: Sinusoidal jitter used for this test.
Editable:
Number of Averages: Number of waveforms that will be acquired for SigTest
calculations.
Used Calibrations:
All previous calibrations
Procedure Report:
Figure 4-127: Result Description
•
•
Column 1:
o
Column 2,:
o
CLB Length (inch): Shows the CLB length set in the
instrument.
Measured Eye Height [mV]: Shows the measured eye height
for each corresponding CLB length.
207
4 USB Computer Bus
Test Application
4.5.1.2.2 10G Eye Width Pre Calibration
Purpose and Method:
procedure calibrates the eye-width by sweeping over several de-emphasis settings
to discover the de-emphasis setting which makes the eye-width closest to the target
specification value.
Connection diagram:
Same as for 10G Compliance Load Board Selection.
Parameters in Expert Mode: Same as for 10G Compliance Load Board Selection.
Used Calibrations:
Procedure Report:
•
•
208
Column 1:
o
Column 2:
o
Set De-Emphasis: Shows the de-emphasis value, set in the
instrument.
Measured Eye Width [ps]: Shows the measured Eye Width for
each voltage point.
USB Computer Bus
Test Application 4
•
•
Column 1:
o
Column 2:
o
Set De-Emphasis: Shows the de-emphasis value, set in the
instrument.
Measured Eye Height [mV]: Shows the measured Eye Height
for each voltage point.
4.5.1.2.3 10G Eye Height and Width Calibration
Purpose and Method:
procedure measures the eye height and eye width with respect to diiferential voltage
and sinusoidal jitter. The calibration data is used to generate a stress Rx eye with a
defined eye height and width.
Connection Diagram:
Same as for 10G Eye Width Pre Calibration.
Same as for 10G Compliance Load Board Selection.
Used Calibrations:
Procedure Report:
209
4 USB Computer Bus
Test Application
10G Eye Height
Calibration
•
•
10G Eye Width
Calibration
•
•
210
Column 1:
o
Set SJ {ps}: Shows the de-emphasis value, set in the
instrument.
Column 2 & 3:
o Eye Height [x ps] [mV]: Shows the measured Eye Height for
each voltage point
Column 1:
o
Set SJ {ps}: Shows the de-emphasis value, set in the
instrument.
Column 2 & 3:
o Eye Width [x ps]: Shows the measured Eye Width for each
voltage point.
USB Computer Bus
Test Application 4
4.5.1.2.4 10G Compliance Eye Calibration
Purpose and Method:
procedure calibrates eye height and eye width according to the test specification,
using sinusoidal jitter to adjust the eye width. The measurements are done on the
scope using the SigTest software.
Connection Diagram:
Same as for 10G Eye Height and Width Calibration and
•
Max Number of Search Steps: The maximum number of steps after the
search for optimum Vdiff and SJ values is aborted.
Used Calibrations:
Procedure Report:
211
4 USB Computer Bus
Test Application
•
•
•
•
Column 1:
o
Vdiff [mV]
Column 2:
o
SJ [ps]: Sinusoidal jitter.
Column 3:
o
Eye-Height [mV]: Shows the measured Eye Height.
Column 4:
o
Eye-Width [mV]: Shows the measured Eye Width.
4.5.1.2.5 10G Compliance Eye Verification
Purpose and Method:
This test checks if it is possible to meet the eye height specification with the current
oscilloscope and random jitter and sinusoidal jitter are set to the values specified in
the USB Compliance Test Specification. The differential output voltage amplitude is
set to the specified value plus a small margin defined with the “Eye Height Margin”
parameter. The eye height is measured with the oscilloscope using SigTest.
Connection Diagram:
Parameters in Expert Mode: Same as for 10G Compliance Load Board Selection and
•
CLB Trace Length: The specified Compliance Load Board (CLB) trace length
causes the receiver eye height to be closest to the target eye height
specified.
Used Calibrations:
Procedure Report:
212
USB Computer Bus
Test Application 4
•
•
•
•
•
•
•
Column 1:
o
Result: Shows the test result.
Column 2:
o
Measured Eye Height [mV].
Column 3:
o
Min Eye Height [mV].
Column 4:
o
Max Eye Height [mV]..
Column 5:
o
Measured Eye Width [mV].
Column 6:
o
Min Eye Width [mV].
Column 7:
o
Max Eye Width [mV].
213
4 USB Computer Bus
Test Application
4.5.2 Receiver
Long Channel Tests
In the following section, for connectors Type-C and Tethered Type-C, the receiver
tests are duplicated for each lane. The abbreviations “Rx1” and “Rx2” are added to
each procedure name in the software, meaning lane 1 and lane 2, respectively.
Please note that both lanes must be tested for a valid compliance test.
4.5.2.1.1 10G Compliance Test
Purpose and Method:
or WarmReset).
Connection diagram:
214
USB Computer Bus
Test Application 4
Figure 4-132: Connection setup for 10GReceiver1 Comp. Test for Super Speed plus with Long Channel
Super Speed Plus is not available with (J-BERT N4903B, DeGeneration = AUX DATA
215
4 USB Computer Bus
Test Application
Figure 4-133: Connection setup for 10GReceiver1 Comp. Test for Super Speed plus with Long Channel (M8020A)
216
USB Computer Bus
Test Application 4
Figure 4-134: Connection setup for 10G Receiver Comp. Test for Super Speed plus with Long Channel (M8020A) using Keysight N7015A Test Fixture
217
4 USB Computer Bus
Test Application
Loopback Training
•
Retrain at each Jitter Frequency: If false, the DUT is trained into
loopback only at the beginning of the test. If true, it is trained into
loopback for each sinusoidal jitter frequency.
•
Train with Jitter: If true, random and sinusoidal jitter are added to
Specification (Non-editable parameters)
•
Target Eye Height
•
Target Eye Width
•
Eye Height: The differential voltage amplitude of the data signal.
•
Eye Width
•
Pre-Shoot: Pre-shoot used for calibrations and receiver tests.
•
De-Emphasis: The de-emphasis of the data signal.
•
signal.
•
the test signal.
•
SJ Reduction for Eye-Width Adjusment: Amount of sinusoidal jitter
at the frequency specified that is subtracted for eye-width
adjustment.
•
Second Tone SJ for Eye-Width Adjusment: Amount of sinusoidal
jitter at 87 MHz that is added for eye width adjustment.
•
SSC Deviation
BER Setup
•
•
•
BER Test Duration: Duration of the BER test for one SJ point.
measurement.
Relax Time: The time between the jitter is changed and the
Used Calibrations:
All 10G Calibrations
Procedure Report:
218
USB Computer Bus
Test Application 4
219
4 USB Computer Bus
Test Application
•
•
•
•
•
•
•
220
Column 1:
Column 2 :
o SJ Frequency [MHz]: Shows the Sinusoidal Jitter set in the
instrument.
Column 3:
o Failed Adjusted SJ[ps]: Shows the number of failed jitter.
Column 4 :
o Passed Adjusted SJ[ps]: Shows the number of passed jitter.
Column 5:
o Min Spec[UI]: Shows the min Spec required.
Column 6:
o Nominal SJ[ps]
Column 7:
o Errors: Shows the number of errors.
USB Computer Bus
Test Application 4
4.5.2.1.2 10G Constant Parameter Stress Test
Purpose and Method:
Connection Diagram:
Loopback Training
•
Retrain at each Jitter Frequency: If false the DUT is trained into
loopback only at the beginning. If true it is trained into loopback
•
Train with Jitter: If true random and sinusoidal jitter are added to
Specification
•
Pre-Shoot.
•
De-Emphasis: The de-emphasis of the data signal
•
signal.
•
the test signal.
•
Nominl SJ.
•
Sinusoidal Jitter Frequency.
•
SJ Reduction for Eye-Width Adjusment.
•
Second Tone SJ for Eye-Width Adjusment.
•
SSC Deviation
•
Adjusted SJ (Non-editable)
BER Setup
•
test.
•
measurement.
•
Relax time for BER Measurement: Time span between when the
jitter is enabled and the start of the BER test.
Used Calibrations:
Procedure Report:
221
4 USB Computer Bus
Test Application
222
USB Computer Bus
Test Application 4
•
•
•
•
•
•
•
•
•
•
Column 1:
o Result
Column 2 :
o Pre-Shoot [dB]
Column 3:
o De-Emphasis [dB]
Column 4 :
o Differential Voltage [mV]
Column 5:
o Random Jitter [ps]
Column 6:
o Nominal SJ [ps]
Column 7:
o SJ Frequency [MHz]
Column 8:
o Adjusted SJ [ps]
Column 9:
o Second Tone SJ [ps]
Column 10:
o Errors
223
4 USB Computer Bus
Test Application
4.5.2.1.3 10G Jitter Tolerance Test
Purpose and Method:
test.
Connection Diagram:
Loopback Training
•
•
Sinusoidal Jitter Variation
•
Number of Jitter Steps
•
Frequency Mode: Specifies the distribution of the frequency
points to test. It can be:
o Compliance Frequencies: Only the jitter frequencies from
the compliance test.
o Equally Spaced Frequencies. Between a minimum and a
maximum frequency the frequency points are distributed
equally (linear or logarithmic).
o User Defined Frequencies: The user can define a list of
frequencies.
o Single Frequency: Only one frequency is tested
•
224
Show Min. Failed Points: If True, the minimum sinusoidal jitter
amplitude at which the BER test failed is included in the results
graph.
USB Computer Bus
Test Application 4
Specification
•
•
•
•
•
•
•
•
•
•
•
Target Eye Height: The calibration is performed to achieve this
target eye height.
Target Eye Width: The calibration is performed to achieve this
target eye width.
Eye Height: The differential voltage amplitude of the data signal.
Eye Width: Eye width that is obtained after the calibration.
Pre-Shoot: Pre-shoot used for calibration and receiver tests.
signal.
the test signal.
at the frequency specified that is subtracted for eye width
adjustment.
SSC Deviation.
BER Setup
•
•
test.
Used Calibrations:
Procedure Report:
225
4 USB Computer Bus
Test Application
Figure 4-137 Result description
226
USB Computer Bus
Test Application 4
•
•
•
•
•
•
•
Column 1:
Column 2 :
the instrument.
Column 3:
o Min Failed Jitter [ps]: Shows the minimum jitter amplitude at
which the DUT introduces errors.Shows the number of failed jitter.
Column 4 :
o Max Passed Jitter [ps]: Shows the maximum jitter amplitude at
Column 5 :
Jitter Capability Test Setup [ps]: Shows the maximum jitter amplitude that
can be set depending on the current hardware setup.Column 6 :
o Min Spec[ps]: Shows the minimum jitter amplitude defined by the
error.
Column 7 :
o Margin [%]:Shows the ratio between the minimum jitter amplitude
passed.
227
4 USB Computer Bus
Test Application
4.5.2.1.4 10G Sensitivity Test
Purpose and Method:
compliance test.
Connection Diagram:
Loopback Training
•
Eye Height Variation
•
Start Eye Height: The eye height (transitions bits) where the test
starts.
•
Eye Height Step Size: The amount the eye height is decreased by
one step to search the Min passed Eye Height.
Specification (Non-editable parameters)
•
•
•
the test signal.
•
Nominal SJ: Sinusoidal jitter amplitude at the frequency specified
that will be set to achieve the target eye-width.
•
Sinusoidal Jitter Frequency: Sinusoidal jitter frequency that will be
set to achieve the target eye-width.
•
at the frequency specified that is subtracted for eye width
adjustment.
•
jitter at 87 MHz that is added for eye width adjustment. SSC
Deviation
•
Adjusted SJ
BER Setup
•
•
test.
Relax Time for BER Measurement: The time between the jitter is
changed and the beginning of the measurement.
Used Calibrations:
Procedure Report:
228
USB Computer Bus
Test Application 4
•
•
•
•
Column 1:
o Result: The Minimum Passed Eye Height should be smaller than
the Minimum Spec.
Column 2 :
o Min Passed Eye Height [mV]: The smallest eye height at which the
DUT passes the test.
Column 3 :
o Min Spec[mV]: The smallest eye height at which the DUT has to
pass the test to meet the specifications.
Column 4 :
o Margin [%]:Margin between the Minimum Passed Eye Height and
the Min Spec, expressed as a percentage.
229
4 USB Computer Bus
Test Application
Short Channel Test
The Short Channel tests are similar to the Long Channel tests. The difference
between them lies in the test channel that is used.
4.5.2.2.1 10G Short Channel Compliance Test
Purpose and Method:
or WarmReset).
Connection diagram
230
USB Computer Bus
Test Application 4
Figure 4-139: Connection setup for 10GReceiver1 Short Channel Comp. Test for Super Speed plus with Long Channel
231
4 USB Computer Bus
Test Application
Figure 4-140: Connection setup for 10GReceiver1 Short Channel Comp. Test for Super Speed plus with Long Channel (M8020A)
232
USB Computer Bus
Test Application 4
Figure 4-141: Connection setup for 10G Receiver1 Short Channel Comp. Test for Super Speed plus with Long Channel (M8020A) using Keysight N7015A Test
Fixture
233
4 USB Computer Bus
Test Application
Loopback Training
•
•
Specification
•
•
•
•
•
•
•
signal.
the test signal.
at the frequency specified that is subtracted for eye-width
adjustment.
SSC Deviation
BER Setup
•
•
•
BER Test Duration: Duration of the BER test for one SJ point.
measurement.
Used Calibrations:
Procedure Report:
234
USB Computer Bus
Test Application 4
235
4 USB Computer Bus
Test Application
•
•
•
•
•
•
•
Column 1:
Column 2:
o SJ Frequency [MHz]: Shows the Sinusoidal Jitter frequency set in
the instrument.
Column 3:
o Failed Adjusted SJ [ps]: Shows the jitter amplitude which caused
the DUT to introduce errors.
Column 4 :
o Passed Adjusted SJ [ps]: Shows the jitter amplitude at which the
DUT still worked without introducing errors.
Column 5:
o Min Spec [ps]: Shows the min Spec required.
Column 6:
o Nominal SJ [ps]: Nominal sinusoidal jitter that is used in the test.
Column 7:
o Errors: Shows the number of errors.
4.5.2.2.2 10G Short Channel Constant Parameter Stress Test
Purpose and Method:
frequency.
Connection Diagram:
Same as for 10G Long Channel Constant Parameter Stress Test.
Used Calibrations:
Procedure Report:
236
USB Computer Bus
Test Application 4
237
4 USB Computer Bus
Test Application
•
•
•
•
•
•
•
•
•
•
238
Column 1:
o Result
Column 2 :
o Pre-Shoot [dB]
Column 3:
o De-Emphasis [dB]
Column 4 :
o Differntial Voltage [mV]
Column 5:
o Random Jitter [ps]
Column 6 :
o Nominal SJ [ps]:
Column 7 :
o SJ Frequency [MHz]
Column 8 :
o Adjusted SJ [ps]
Column 9:
o Second Tone SJ [ps]
Column 10 :
o Errors
USB Computer Bus
Test Application 4
4.5.2.2.3 10G Short Channel Jitter Tolerance Test
Purpose and Method:
test.
Connection Diagram:
Same as for 10G Compliance Test
Same as for 10G Long Channel Jitter Tolerance Test except for the following
parameters that are not included:
•
Target Eye-Height
•
Target Eye-Width
•
Eye-Height
•
Eye-Width
Used Calibrations:
Procedure Report:
239
4 USB Computer Bus
Test Application
240
USB Computer Bus
Test Application 4
•
•
•
•
•
•
•
Column 1:
Column 2:
the instrument.
Column 3:
o Min Failed Jitter [ps]: Shows the minimum jitter amplitude at
Column 4:
o Max Passed Jitter [ps]: Shows the maximum jitter amplitude at
which the DUT introduces no errors.
Column 5:
o Jitter Capability Test Setup [ps]: Shows the maximum jitter
setup.
Column 6:
o Min Spec [ps]: Shows the minimum jitter amplitude defined by the
error.
Column 7:
passed.
241
4 USB Computer Bus
Test Application
4.5.2.2.4 10G Short Channel Sensitivity Test
Purpose and Method:
compliance test.
Connection Diagram:
All the parameter are same as for 5G Receiver Sensitivity Test (Long Channel Test),
•
Instead of using a signal with the Eye height variation, it has differential
voltage variation set to test the short channel scenario.
•
•
Start Differential Voltage: The differential Voltage where the test
starts.
•
Differential Voltage Step Size: Span between two consecutive
differential voltage steps.
Used Calibrations:
Procedure Report:
242
USB Computer Bus
Test Application 4
•
•
•
•
Column 1:
the Min Spec.
Column 2 :
Min Passed Differntial Voltage [mV]: The smallest differential voltage at
which the DUT passes the test.Column 3 :
o Min Spec [mV]: The smallest differential voltage at which the DUT
Column 4 :
243
4
Troubleshooting and Support
5
Troubleshooting and
Support
5.1
5.1
Log List and File
Log List and File
In case of problems, the Log List can often help in identifying the root cause. To
display the Log List, click the Log List icon on the toolbar. The log file can be
accessed by right-clicking within the Log List section as shown in Figure 5-1. Note
that all log information is lost when the N5990A application is terminated unless the
log file is saved.
Figure 5-1: ValiFrame N5990A log list and file
244
Troubleshooting and Support 4
•
In case of persisting problems with an application, send the Log File with
the problem description to [email protected].
245
Appendix
6
6.1
6
Appendix
6.1
Data Structure and Backup
6.2
Remote Interface
6.3
6.4
IBerReader
Data Structure and Backup
6.1.1 ValiFrame Data Structure
All ValiFrame internal data is saved in the application data folder:
"Documents and Settings\All Users\Application Data\BitifEye \ValiFrame" for
Windows XP or "ProgramData\BitifEye\ValiFrame" for Windows 7.
Windows hides the system folders, by default. To make the application data folder
visible, the "Hidden Files and Folders" setting needs to be set to "Show hidden files
and folders" in the Windows File Explorer > View Settings.
The ValiFrame application data folder contains the following folders:
•
•
•
•
•
•
Images
Settings
Pattern
Properties
Calibrations
Tmp
Images
The "Images" folder contains the connection diagram images.
247
6
Appendix
Settings
The “Settings” folder contains the default settings file for the instrument and .vset file
which contains the changes to the default registry entries. For each application, a
sub folder is created and a ValiFrame.vset file is created in this sub folder as soon as
any ValiFrame setting is changed from its default. The settings files contain, for
example, the instrument connection setup.
Pattern
The Pattern folder contains the test pattern files. These are text files which contain
the pattern in hexadecimal format.
Calibrations
The calibration data is stored in the “Calibrations” folder. For each calibration
procedure at least one calibration file is stored. These files are text files and can be
imported into MS Excel or displayed with the HTML viewer.
Tmp
All temporary files are created in the Tmp folder. The sub folder "Results" contains
the final result of each calibration and test procedure. This is a safety feature and
these files are used for recovery in case the user forgot to save them.
248
Appendix
6
6.1.2 ValiFrame Backup
Use the ValiFrame application data folder to save calibration data, modified test
pattern or settings for backup or transfer to another PC.
The files in the folders, “Images” and “Pattern” will be generated or if they already
exist, be overwritten during a ValiFrame installation. In the “Settings” folder, all
instrument settings are overwritten by the installation except the .vset files. In the
“Calibration” folder, all files are generated by the calibration procedures and will not
be overwritten by the installation. To compare or archive the calibration data, backup
the “Calibration” folder.
6.2
Remote Interface
6.2.1 Introduction
The N5990A ValiFrame remote interface allows ValiFrame functionality (such as test
setup information, calibration, and test procedures, and results) to be accessed from
external programming environments, for example MS.NET/C#, VEE, LabView,
TestExec SL, or TestStand. The remote interface can thus be used to control N5990A
by external software. In typical use, a top-level external test sequencer takes
advantage of ValiFrame functionality.
If ValiFrame is to be used as a top-level test sequencer, the control of external
software is achieved with N5990A opt. 500, User Programming.
249
6
Appendix
6.2.2 Interface Description
The ValiFrame functionality is accessible via ValiFrameRemote.dll. It contains a class
ValiFrameRemote in the BitifEye.ValiFrame.ValiFrameRemote namespace (see Figure
6-1). Its use is illustrated by the ValiFrameRemoteTester application. The source code
and the Visual Studio solution of this example are available on the BitifEye support
webpage. Using this interface requires that the ValiFrame dlls are either in the same
folder or the Windows Path variable contains the folder in which these dlls are
located.
250
Appendix
6
Figure 6-1: Members of the ValiFrameRemote class
251
6
Appendix
6.2.3 Using the Remote Interface
1.
2.
3.
4.
5.
6.
Add the ValiFrameRemote.dll as a reference to the project.
Create an instance of the ValiFrameRemote class.
Call SetConfigurationFile(string filename), if it is needed. It is required only
when the station configuration file generated by the station configurator is
not to be used. This file format is same as the files generated by the station
configurator, which can be found in the Valiframe Application data folder
(Windows XP: C:\documents and settings\all users\application
data\bitifeye\valiframe\settings\<application name>\ValiFrame.vset, or
Windows 7: c:\programdata\bitifeye\valiframe\settings\<application
name>\ValiFrame.vset). The station configuration files contain just the
differences to the registry. Refer to Figure 6-2 for more details.
By calling InitApplication(string applicationName), the instruments of the
selected Test Station (see section 3.1) are connected and initialized.
Call either ConfigureApplication() or LoadProject(string filename) to
initialize the DUT properties and test procedures. The project file can be
generated with the ValiFrame User Interface and it contains the DUT
properties, the selected test procedures and the properties of each test
procedure.
Calling Configure Application() prompts a dialog for setting the DUT
properties.
The number and type of available test procedures can depend on the DUT
properties.
7.
Get the list of available procedures with GetProcedures(out int[]
procedureIds, out string[] procedureNames[]).
8. Select procedures individually with SelectProcedures(int[] procedureIds) or
combined with Run(int[] procedureIds, out stringxmlResult).
9. Execute selected procedures by calling any of the Run functions given
below:
10. The Run(out string[]xmlResults) executes all selected procedures. The
results of all procedures executed are returned at the end of the execution
of all selected procedures.
The RunProcedure(int id, out string xmlResult) executes a single procedure
and returns the result in an xml formatted string.
The RunProcedures(int[] procedureIds, out string[] xmlResults) executes
the list of procedures given in the procedureIds array.
The StartRun() function returns immediately. It is mainly used for
event-driven programming. In this case the events StatusChanged()
and ProcedureCompleted() can be used to determine the actual status of
ProcedureCompleted() event
the ValiFrame sequencer and read the results. The
provides the ID and the xmlResult of the procedure completed. After the run the
xmlResults are also
available via the Result property.
?xml version="1.0" encoding="utf-8" standalone="yes"?>
<Folder name="ValiFrame">
<Folder name="Stations">
<Folder name="USB Station">
<Folder name="Instruments">
<Folder name="Instrument6">
<Property name="Offline">True</Property>
252
Appendix
6
<Property name="Address">TCPIP0::192.168.0.133::inst0::INSTR</Property>
<Property name="Timeout">00:01:00</Property>
<Property name="Description">M8020A J-BERT with integrated jitter
sources for SER tests</Property>
<Property name="Dll">VFAgM8000.dll</Property>
</Folder>
<Property name="Address">192.168.0.104</Property>
<Property name="Description">USB 3.0 Tx application running on realtimescope</Property>
<Property name="Dll">VFAgU7243A.dll</Property>
</Folder>
<Property name="Address">192.168.0.104</Property>
<Property name="Description">USB 2.0 Tx application running on realtimescope</Property>
<Property name="Dll">VFAgN5416A.dll</Property>
</Folder>
<Property name="Address">GPIB0::13::INSTR</Property>
<Property name="Description">Powersupply for automated loopback
training</Property>
<Property name="Dll">VFAgE363xA.dll</Property>
</Folder>
<Property name="Address">192.168.0.104;username;password</Property>
<Property name="Description">Main power switch</Property>
<Property name="Dll">VFSynaccessNP.dll</Property>
</Folder>
</Folder>
<Folder name="Properties">
<Property name="Station Name">USB Station</Property>
<Property name="User Name">Unknown User</Property>
<Property name="User Label">
</Property>
<Property name="Use Graphics">True</Property>
<Property name="Asynchronous Graphics">False</Property>
<Property name="Show All Instruments">False</Property>
<Property name="System Configuration">Unknown</Property>
<Property name="De Emphasis Generation">N4916</Property>
<Property name="Generator Type">JBERT B</Property>
<Property name="Power Supply Type">None</Property>
<Property name="Power Switch Type">SynaccessNP</Property>
<Property name="Tx Usb Application">U7243A Usb</Property>
<Property name="Use Serial Bus Switch">False</Property>
</Folder>
<Folder name="Children" />
<Property name="Software Version">ValiFrame 1.0</Property>
</Folder>
</Folder>
<Folder name="Database">
<Folder name="Properties">
<Property name="ApplicationServerHostname">127.0.0.1:8082</Property>
</Folder>
</Folder>
</Folder>
Figure 6-2: Example of a station configuration file
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If the ValiFrame sequencer is called via a .NET GUI (System.Windows.Forms.Form),
the current status, the available procedures, and the procedure selection can be
shown and modified by passing a TreeView control via the ProductPreTreeView
property to the ValiFrame sequencer prior to the InitApplication() call. In this case,
the TreeView control directly shows which procedures were selected as well as the
procedure currently being processed during the run. At the end of each run, the
pass/fail result is given. Refer to the ValiFrameRemoteTester source code for more
details.
The log entries generated by the ValiFrame sequencer can be accessed via the
LogChanged() event. Each time the sequencer generates a log entry this event will
be broadcast. It is recommended that the user monitors this event and tracks the log
changes to identify problems during execution.
The procedures requiring interaction with the user will pop up dialog panels. For
example, each time a new connection between an instrument and the DUT is
necessary, the procedure will start to display pop-up windows with the required
connections. The dialog can be suppressed by attaching to the
ConnectionChangeRequired() event. In some cases, internal dialogs or message
boxes are also shown. For full automation without any user interaction, events must
be defined and implemented such that the controlling environment can react to all
dialog and message boxes without user input. Currently, how to handle these dialogs
has to be decided case by case.
6.2.4 Results Format
Each Procedure Run will produce an xml-formatted result string, which can be
accessed via the out parameters of the Run() functions or the Results property of the
ValiFrameRemote class. The result string starts with a summary, which contains the
procedure name, ID, result, and the time stamp of the procedure run (Figure 6-3):
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6
<?xml version="1.0" encoding="utf-16"?>
<Test Results>
<Summary>
<ProcedureName>Jitter Tolerance Test 2 MHz SJ RBR Lane 0</ProcedureName>
<ProcedureID>400008</ProcedureID>
<Result>Passed</Result>
<DateTime>4/30/2009 11:29:14 AM</DateTime>
</Summary>
<DocumentElement>
<Parameters>
<Name>Number of Lanes</Name>
<Value>1</Value>
</Parameters>
<Parameters>
<Name>Spec. Version</Name>
<Value>1.1</Value>
</Parameters>
<Parameters>
<Name>ISI Amplitude</Name>
<Value>570 mUI</Value>
</Parameters>
<Parameters>
<Name>Step Mode</Name>
<Value>False</Value>
</Parameters>
<Parameters>
<Name>Parade DP621 Device</Name>
<Value>False</Value>
</Parameters>
</DocumentElement>
<Data>
<ColumnHeader>|Result|Jitter Freq.|Sin.-Jitter Amp.|Number of Errors|Min Spec|Max
Spec|Details|</ColumnHeader>
<Values>|pass|2000000|0.981|2|0|1000||</Values>
</Data>
</Test Results>
Figure 6-3: Result string format
The following part contains the list of parameters. These parameters may be changed
via the project file or the remote interface. The last part contains the test data. It
starts with the column header, followed by one or more data rows. The format is
similar to what is obtained in the Excel output if the same procedure is run via the
ValiFrame user interface. Each column name/value is separated by the pipe symbol
'|'.
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6.3
Often parameters such as temperatures or supply voltages need to be varied
systematically. A simple example would be repeating tests over a temperature range
from –10 to 30 °C to verify an operating temperature range. In this case, after the
tests have been run at –10 °C, the temperature of the climate chamber is increased
by the selected temperature step width, for example, 1°C. The tests are then
repeated at –9 °C. After the test execution, the temperature is incremented again and
the tests are rerun repeatedly until they are finally run at 30 °C. This repetitive
process is called looping. In this example, the temperature within a climate chamber
is the loop parameter. While the loop is executed, the test results have to be
documented for each loop parameter value. In practice, multiple loop levels might be
required, as shown in Figure 6-4.
Figure 6-4: Temperature and voltage sweeps using N5990A sequencer
As the loop parameters are typically customer-specific, N5990A permits a list of loop
parameters to be specified. N5990A supports:
1.
Looping over user-specified parameters or run tests with a single parameter
value.
2.
Defining a set of loop parameters and for each parameter a range of test
points.
3.
Using custom drivers to control instruments that are not part of the
ValiFrame Test Station (see section 3.1, Test Station Selection and
Configuration), e.g. climate chambers, ovens, and power supplies.
4.
Saving the results of each test together with the actual loop parameter
value independently of the results from the other runs.
5.
An overview of each run after the end of the test execution.
These features are provided by an interface called IVFEnvironmentalControl.
The definition of this interface is:
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Appendix
6
namespace BitifEye.ValiFrame.Instruments
{
public interface IVFEnvironmentalControl
{
string UserLabel { get; }
void Connect();
void Disconnect();
string[] GetParameterList();
string[] GetParameterValues();
void Init();
bool SetNextValue();
void SetToDefault();
}
}
The interface has to be implemented by a class EnvironmentalControl in a .NET dll
named EnvironmentalControl.dll, which then needs to be copied into the ValiFrame
Program Files Folder. ValiFrame will load this dll and call the function of the Interface
in the following order:
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Appendix
6.3.1 Connect()
At startup of ValiFrame allows the implementation to load the instrument drivers and
connect to them.
6.3.2 SetToDefault()
After the Connect() call, the implementation should set all instruments with initial
values to set default values. It is recommended that the sequence is stated with
nominal values to ensure that the test setup is done properly. With this setting, the
first run will be done and the Init() call will not overwrite the values.
6.3.3 Init()
The function is used to initialize the instruments with start values at the beginning of
test sequence.
6.3.4 GetParameterList() and GetParameterValues()
These functions are used to get the parameter names and values lists and put them
into the result output of each test procedure.
6.3.5 SetNextValue()
If this function returns true at the end of each run over the selected test procedures,
ValiFrame will run the selected tests again. This function should get the next
parameter set, set the controlling instruments, and return true if a new set of
parameters is available.
Example
For a sweep over temperature starts at 20 °C, increasing the temperature by 2 °C at
each run, and ending at 40 °C, the function should increase the temperature of the
chamber and return true if 40 °C is not reached. If the next step is greater than 40 °C,
this function should return false. ValiFrame will end the test sequence in this case.
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Appendix
6
6.3.6 Disconnect()
It is called at the closing of ValiFrame. The driver should set the instruments to
default values and disconnect from the instruments. An example project is available
on the BitifEye webpage.
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Appendix
6.4
IBerReader
ValiFrame cannot integrate all possible instruments and custom interfaces to
communicate with the DUT. To overcome this problem, the customer can provide
a .NET DLL which implements the IBerReader interface. This DLL is used by
ValiFrame, and invoked during the test; the DLL then takes care of the instrument or
DUT communication.
To use this feature in ValiFrame USB, go to Configure DUT > Show Parameters dialog
and change the property BER Reader to "Custom BER Reader." This option will only
be available if the dll with the name UsbCustomBerReader.dll is there in its
installation folder.
USB-specific calling conventions:
•
Connect(string)
The string parameter is an empty string by default. It can be changed by
setting the "Address" property in the Confugure DUT > Show Parameters
dialog. This is used to do general initialization or start external programs if it
is required.
•
Disconnect()
This method will be called every time a test run is finished (after all selected
tests are done, not after each individual test).
It is used to clean up or shut down external programs if applicable.
•
Init(string)
This will be called when the DUT needs to be put into a specific state. In
the USB case, the unique option is "5Gb/s".
260
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6
6.4.1 IBerReader Interface
using System;
using System.Collections.Generic;
using System.Text;
namespace BerReader
{
public interface IberReader
{
/// <summary>
/// This method is called to connect to your error reader.
/// </summary>
/// <param name="address">The address string can be used by your
implementation
/// to configure the connection to the BerReader interface</param>
void Connect(string address);
/// <summary>
/// This method is called to close the connection
/// </summary>
void Disconnect();
/// <summary>
/// This method will be called prior the individual tests to tell
the device
/// what mode is tested. This can be used to load appropriate
/// setups.
/// </summary>
/// <param name="mode">configuration mode in which the DUT will be
tested. The mode must be “5Gb/s” or “10Gb/s”</param>
void Init(string mode);
/// <summary>
/// Is called at the beginning of the error measurement and allows
/// a reset for the DUT to be implemented.
/// </summary>
void ResetDut();
/// <summary>
/// Starts the counters. This method MUST reset all counters!
/// </summary>
void Start();
/// <summary>
/// Stop the DUT to read out the counters (see
/// GetReadCounterWithoutStopSupported()).
/// </summary>
void Stop();
/// <summary>
/// This method returns counters, the 1st counting the bits/frames/lines
/// or bursts and the 2nd one counting the errors detected by the
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Appendix
BerReader.
/// The automation software will compute the BER using the following
/// equation BER=errorCounter/bitCounter. In the case bitCounter = 0 even
when
/// the stimulus is sending data, this is also interpreted as fail.
/// </summary>
/// <param name="bitCounter"> Contains the number of bits which are
received
/// by the DUT. If it is not possible to count bits the value can also
contain
/// frames, or bursts. It is just a matter of the value defined as target
BER.
/// If it is not possible to get the number of bits/frames/bursts then
the
/// method can return a value of -1 and the automation software can
compute
/// the number of bits from the data rate and the runtime.</param>
/// <param name="errorCounter"> Total number of errors since the last
start.
/// </param>
void GetCounter(out double bitCounter, out double errorCounter);
/// <summary>
/// This method returns a Boolean value indicating whether the device
/// supports reading the counters while it is running. If this method
/// returns false, the device needs to be stopped to read the counters.
/// In this case the automation software will stop data transmission
/// before calling the GetCounter() function, and re-start data
transmission
/// again after reading the counter values.
/// </summary>
/// <returns> false if device needs to be stopped before reading the
counters,
/// true if the counters can be read on the fly.</returns>
bool GetReadCounterWithoutStopSupported();
/// <summary>
/// This property returns a number to multiply the value delivered by the
/// bitCounter in the GetCounter() function.
/// </summary>
Double NumberOfBitsPerFrame {set; get;};
/// This property returns the number of payload
/// bits in a frame used for the detection of the BER.
/// If i.e. the errorCounter in the GetCounter() function is just the
/// checksum error then this parameter is the number of the payload.
/// </summary>
double NumberOfCountedBitsPerFrame {set; get;};
}
}
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Appendix
6.5
6
Main Power Switch Control
Intended to power on/off automatically the DUT and run the loopback training
without user interaction.
The Main Power Switch Control can be selected as:
•
Manual
•
Netlo 230B. It is a PDU (Power Distribution Unit) that integrates one 230 V
input and four 230 V outlets which allow to connect virtually any 230 V
powered device)
•
SynaccessNP
If it is selected as Manual, the DUT has to be power cycle manually. A dialog asking
for power cycling the DUT, pops-up in the initialisation of each receiver test
procedure (See Figure 6-5).
Figure 6-5: Manual Power Cycle Dialog
The number of user interactions for Manual option is equal to the number of times
that the DUT need to be trained into loopback.
When it is selected as Netlo230B or SynaccsessNP, the DUT is power cycle
automatically. A dialog asking to check the connection between the power supply
and the power switch, pops-up in the first receiver test procedure executed (See
Figure 6-6).
Figure 6-6: Automatic Power Cycle Dialog
In this case, the number of user interactions (related with the power cycle) is one,
independently of the number of Rx tests and the number of times that a retraining is
required.
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Appendix
Some properties related with the remote controllable power switch can be selected
in the Parameters Dialog (See Figure 6-7).
Figure 6-7: Power Switch Parameters (I)
264
Appendix
6
The same properties can be selected in the Parameters Panel of the Main Windows
(See Figure 6-7).
Figure 6-8: Power Switch Parameters (II)
These configurable properties are:
•
Channel: This sets the channel number of the power switch channel which
is connected to the DUT.
•
On-Off Duration: This is the duration between turning the DUT off and then
turning it on again.
•
Setting Time: This is the wait time after the DUT is turned on and before the
test continues with loopback training.
Max Retries for LB Training: Maximum number of times that ValiFrame will
try to train the DUT into loopback mode. If it is not possible within these
tries the test will be aborted automatically. When Power Switch Automation
is unselected, ValiFrame asks the user to retry every time loopback fails.
•
265
This information is subject to change without notice.
© Keysight Technologies 2015
Edition 5.0, July 2016
www.keysight.com

N5990A User Guide for USB

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