EDX-7000/8000 Energy-Dispersive X-ray Fluorescence Spectrometers

SSI-EDX78-0001
EDX-7000/8000
Energy-Dispersive X-ray
Fluorescence Spectrometers
The EDX-7000/8000 series of energy dispersive X-ray fluorescence
spectrometers, incorporating a new high-performance
semiconductor detector, provide excellent sensitivity, resolution,
and throughput for an array of applications, from general
screening analysis to advanced materials research in such fields as
petrochemicals, chemicals, agriculture, and environmental.
Key features include:
No Liquid Nitrogen Required
The high-performance, electronically cooled SDD detector reduces
operating costs and maintenance requirements.
Five Primary Filters & Four Collimators
Usable in any combination, the filters enables highly sensitive analysis of trace elements while the four
different sized collimators reduce scattering with small samples or isolation of measurement area.
Sample
Large Sample Chamber with Small Footprint
Accommodates samples up to a maximum size of
W300 × D275 × approx. H100 mm.
Collimator
High Speed
The high fluorescent X-ray count per unit time (high count
rate) of the SDD detector permits highly precise analysis in a
shorter time.
Primary filter
SDD detector
Sample
X-ray tube
observation
Sample Observation Camera
camera
Working in tandem with the collimators, the camera enables
precise sample positioning while also providing a scale for judging appropriate collimator size. Photos
are also automatically integrated into sample reports.
Easy-to-Use Operating Software
Shimadzu’s EDX-7000/8000 spectrometers use
PCEDX Navi operating software. Featuring a
simple but refined user interface, the software
offers intuitive operation, easy instrument
initialization and startup, and a variety of report
formats, which makes the systems easy to use
for operators of all skill levels, from beginner to
expert. PCEDX-Pro software is also available to
support more advanced research functions.
Applications/Industries
Electrical/electronic materials
• RoHS and halogen screening
• Thin-film analysis for semiconductors, discs, liquid
crystals, and solar cells
Oil and petrochemicals
• Analysis of sulfur in oil
• Analysis of additive elements and mixed elements in
lubricating oil
Automobiles and machinery
• ELV hazardous element screening
• Composition analysis, plating thickness measurement,
and chemical conversion coating film weight
measurement for machine parts
Chemicals
• Analysis of products and organic/inorganic raw
materials
• Analysis of catalysts, pigments, paints, rubber, and
plastics
Ferrous/non-ferrous metals
• Main component analysis and impurity analysis of raw
materials, alloys, solder, and precious metals
• Composition analysis of slag
Environment
• Analysis of soil, effluent, combustion ash, filters, and
fine particulate matter
Mining
• Grade analysis for mineral processing
Ceramics
• Analysis of ceramics, cement, glass, bricks, and clay
Specifications
Pharmaceuticals
• Analysis of residual catalyst during synthesis
• Analysis of impurities and foreign matter in active
pharmaceutical ingredients
Agriculture and foods
• Analysis of soil, fertilizer, and plants
• Analysis of raw ingredients, control of added elements,
and analysis of foreign matter in foods
Measurement principle
X-ray fluorescence spectrometry
Measurement method
Energy dispersion
Target samples
Solids, liquids, powders
Measuring range
11Na to 92U (EDX-7000) 6C to 92U (EDX-8000)
Sample size
W 300 × D 275 × approx.H 100 mm (excluding radiuses)
X-ray Generator
X-ray tube
Rh target
Voltage/Current
4 kV to 50 kV / 1 μA to 1000 μA
Cooling method
Air-cooled (with fan)
Irradiated area
Automatic collimator switching: 1, 3, 5, and 10 mm diameter
Primary filters
Five types (six, including the open position), automatic replacement
Detector
Type
Silicon drift detector (SDD); liquid nitrogen not required (electronic cooling)
Sample Chamber
Measurement atmosphere
Air, vacuum*1, helium (He)*2
Autosampler
12-sample turret
Sample observations
Semiconductor camera
Software
Quantitative analysis
Calibration curve method, correction for coexistent elements, FP method, film FP method,
background FP method
Utilities
Automatic calibration functions (energy calibration, FWHM calibration); Instrument status
monitoring function
Please contact your sales representative for additional specifications and details.
SHIMADZU Corporation
www.shimadzu.com/an/
SHIMADZU SCIENTIFIC INSTRUMENTS
7102 Riverwood Drive, Columbia, MD 21046, USA
Phone: 800-477-1227/410-381-1227
Fax: 410-381-1222
www.ssi.shimadzu.com
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