EMPYREAN: THE WORLD OF X-RAY DIFFRACTION IS NO

Intensity [counts]
100M
Intensity [counts]
The world of
X-ray diffraction
is no longer flat
Intensity [counts]
EMPYREAN
10M
1M
2000
4000
1000
3000
0
FWHM = 0.026 °2θ
21
21.20
21.40
21.60
Position 2Theta [deg.] (Copper Cu))
100K
2000
10K
1K
1000
100
0
10
-6000
-4000
-2000
0
2000
4000 20
30 40
6000
Omega/2Theta [s]
50
60
70
80
90
100 110 120 130 140
Position 2Theta [deg.] (Copper (Cu))
The Analytical X-ray Company
1
PANALYTICAL
Pioneering X-ray diffraction
The new Empyrean
from PANalytical
Introduction of
PIXcel3D
PANalytical, formerly known as Philips Analytical, has a rich
history of innovation in X-ray analysis.
Truly innovative, daringly different,
Empyrean brings the idea of a
perfect XRD platform to life
2010
Introduction of the PIXcel detector,
based on Medipix2 technology
The only XRD platform that does it all
2006
X’Pert PRO MPD.
PreFIX for powder diffraction
In developing Empyrean, PANalytical
has redesigned many of the key parts of
the XRD platform from the ground up.
1999
X’Pert MPD, the first
multi-purpose powder
diffractometer with
flip-focus tube
2001
1993
First goniometer, based
on Direct Optical Position
Sensing (DOPS)
1995 Invention of
PreFIX optics.
Introduction of
X'Pert MRD
1990
PW1050 X-ray diffractometer
and PW1520, the world's first
commercially available X-ray
fluorescence spectrometer
1954
1990
First thin film
diffractometer with
four-bounce (Bartels)
monochromator
1983
APD1700: first complete
analytical software suite
First X-ray diffractometer
with Geiger-Müller
counter tube
1945
Philips starts
to repair and
manufacture X-ray
tubes in Eindhoven
1917
2
1948
Introduction of the
X’Celerator detector, the
world’s first solid state
1D detector
The world’s first
commercially
available X-ray
diffractometer
The X-ray source, the goniometer, the
sample stages and the detection system
are all brand-new. Such innovation
comes to the market just once in a generation and sets the benchmark for others to follow. Empyrean not only meets
the high expectations of scientists and
XRD experts today, but will continue to
do so as research themes evolve. The
world of materials science is constantly
changing and the life of a high performance diffractometer is much longer
than the typical horizon of any research
project. With Empyrean, you are ready
for anything the future holds.
What’s in a name?
The term Empyrean is derived
from Aristotelian cosmology (384
-322 B.C.) in which spherical earth
was surrounded by concentric
celestial spheres containing the
moon and known planets1. The
highest sphere, later referred to as
Empyrean in the Middle Ages, is
represented by the element ‘fire’.
The Empyrean XRD system is the
product of the fire of innovation,
and is truly above all others,
capable of the most analytical
applications on a single XRD
platform.
1.
G. E. R. Lloyd, Aristotle: The Growth and Structure of his
Thought, Cambridge: Cambridge Univ. Pr., 1968, pp. 133-139,
ISBN 0-521-09456-9.
One platform, one instrument,
no compromise in data quality
whatever the application
The widest sample range
The highest performance
goniometer
Exceptional tube performance
Proven PreFIX pre-aligned
optics
The widest range of sample
stages and non-ambient
environments
Easy access for fast
reconfiguration
4
Sample types
6
Powders
8
Thin films
10
Nanomaterials
12
Solid objects
14
Innovation in
every area
16
Unmatched 2D detector
dynamic range, linearity and
resolution
PIXcel3D cutting-edge technology
The world’s first 3D detector
Partnership with PANalytical
- ultimate commitment
18
Flexible, high-performance
software packages
Established PANalytical
support
3
EMPYREAN
The only XRD platform that does it all
4
Analytical question
Application
Example
configuration
Typical result
• What is in my sample? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Phase identification
• In which ratios? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Phase quantification
• What is the amorphous content? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Crystallinity determination
• What is the crystal structure? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Structure determination and refinement
• Can I see preferred orientation?- - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Direct visualization of Debye rings
• What is in my well plates? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• High-throughput screening (HTS)
• Influence of temperature, pressure, humidity? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Behavior under non-ambient conditions
• What is in my layer(s)? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Phase identification (and depth profiling)
• What is the layer thickness, roughness and density? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• X-ray reflectometry
• Is there residual stress?- - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Thin film stress analysis
• Is there preferential growth? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Texture analysis
• Can I get information about in-plane reflections? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• In-plane diffraction
• Is the layer (hetero)epitaxial? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Epitaxy analysis
• Is the layer strained or relaxed? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Reciprocal space mapping
• Influence of temperature? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Behavior under non-ambient conditions
• What is in my nano-powder? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Phase identification
• What is the particle size distribution and specific surface? - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Small angle X-ray scattering (SAXS)
0.15
• What is the average crystallite size and defect density? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Crystallite size and micro-strain analysis
0.10
• Are my powders truly crystalline?- - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Amorphous content determination
• Is my sample amorphous or nano-crystalline ? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Pair distribution function (PDF) analysis
• How do my samples crystallize? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• In situ crystallization analysis
• Influence of temperature, pressure, humidity? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Behavior under non-ambient conditions
• Can I evaluate the internal (micro-) structure of my sample? - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Computed tomography (CT)
• What is in my sample? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Phase identification (also in transmission
geometry)
• What is in that spot? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Micro diffraction
• Did machining induce preferred orientation? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Texture analysis
• Is residual stress present? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Stress analysis
• Influence of temperature, pressure, humidity? - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
• Behaviour under non-ambient conditions
Dv (R)
Sample type
Empyrean delivers the best quality data, whatever
your sample type and experience
5 nm
8 nm
14 nm
0.05
0
0
5
10
15
20
R [nm]
5
EMPYREAN
Powders – data that speaks for itself
Full pattern quantification
Rietveld standardless quantitative
analysis has become an important
method for characterizing complex
mixtures.
Empyrean offers you a
platform to measure and
identify the most complex
phase mixtures. The
sensitivity of the instrument
and the power of the
software to deal with
overlapping patterns is
unmatched.
Empyrean has the highest
angular resolution of
any laboratory powder
diffractometer and delivers
data closest to synchrotron
quality.
Empyrean offers the widest
range of non-ambient
environments, under full
control of the instrument
software.
Empyrean is ideal for
teaching purposes. It offers
all relevant diffraction
geometries (reflection,
transmission, capillary, microdiffraction, Debye-Scherrer)
and is supported by the most
comprehensive set of worked
examples.
Direct visualization of Debye rings
a)
b)
Non-ambient analysis
c)
Every Empyrean equipped with a PIXcel3D detector is
capable of 2D diffraction. 2D diffraction patterns show
if a sample is fine-grained enough to produce the solid
Debye rings characteristic of a randomly oriented sample
(a), or is medium to coarse-grained, producing spotty
Debye rings (b and c).
Temperature [ °C]
The analysis of powders and polycrystalline materials is
probably the most common application of XRD.
Structure determination and refinement
100
80 °C
80
60
40
20
Color-coded display
of samples on a well
plate with similar
composition or
mixtures
Transmission diffraction
0
0
50
95
Relative humidity [%rH]
Intensity [counts]
High-throughput
screening
Charge-flipping is a fast ab initio structure solution method
Developed for single crystal data in 2004, it was extended
for powder diffraction measurements later and is now used
successfully for both small and large, inorganic and organic
structures.
A difference Fourier map offers an alternative way to locate
(heavy) atoms in an unknown structure.
Both methods provide a 3-dimensional electron density map
for evaluation.
70000
60000
50000
RH = 80 %rH; Again a phase change
40000
RH = 60 %rH; Recystallized
30000
RH = 40 %rH; Recrystallization into another phase
20000
RH = 20 %rH; Amorphous
10000
RH = 1 %rH; Anhydrate + Dihydrate + Amorphous content
Intensity [counts]
0
5
10
6
1st
105
2nd
104
1st (d
2nd
3rd
4th 5th
0.1
6th
th
7th 8
9
10th
11th
103
0.5
1.0
0.2
0.3
th
1.5
12th
13th
14th
2.0
2Theta [deg.]
6
10
12
14
16
18
20
22
24
26
28
2Theta [deg.]
= 650 Å)
104
8
Low-angle diffraction from dry rat tail tendon collagen fibers
as a function of their orientation.
When the fiber axis is oriented perpendicular to the incident
beam (dark blue line) equidistant meridional reflections due
to the characteristic collagen molecule arrangement along
the fiber axis can be clearly observed. The data shown in the
insert was taken by using a hybrid monochromator for best
low-angle resolution. The first diffraction peak, corresponding
to a Bragg spacing of 650 Å, is readily resolved. When the
fiber is oriented in parallel to the incident beam (equatorial
orientation), no such peaks are observed (light blue line).
α α- Trehalose-dihydrate measured at 80°C in an Anton Paar CHC plus+
α,
temperature-controlled humidity chamber: with increasing relative
humidity several phase transitions can be observed.
The upper graph shows the temperature-controlled humidity range that
can be used with the system.
Structure solution of fayalite by a difference Fourier map - known structure
is overlayed.
7
EMPYREAN
Thin films – data that speaks for itself
Fe4 N, Fe3N
Fe3 N
Fe4 N
30
40
60
70
80
250
0
0
2
4
6
8
10
-500
Fe4 N
Fe3 N
Fe3 N
Fe4 N
Fe3 N
Fe3 N
50
Fe3 N
Fe4 N
10000
0
500
-250
Fe3 N
Empyrean is the perfect analysis tool
to place next to your layer growth
equipment.The new Empyrean cradles
allow you to fully map wafers and wafer
fragments up to 2 inches, and handle up
to 4-inch wafers.
20000
Fe3 N
Fe4 N
Comparison of
the rocking curve
performance of
different incident
beam monochromators
on a periodic
epitaxial multilayer
around the InP (004)
reflection. Differences
in resolution and
intensities are obvious.
A range of modules
is available that offer
a range of angular
resolutions matching
any analytical need.
Stress [MPa]
Phase identifications, stress analysis and depth profiling
Fe4 N
Epitaxy analysis
Intensity [coutns]
Diffractometers for the analysis of
thin films have typically been highly
specialized for this purpose. Now,
with Empyrean, the demand for highresolution epitaxy analysis has been
combined with the advantages of a
multi-purpose vertical diffractometer to
offer you the largest range of analyses
on one system.
-750
90 100 110 120 130 140
Position 2Theta [deg.] (Cobalt (Co))
-1000
Grazing incidence angle [deg.]
Analysis of a
polycrystalline Fe3N/
Fe4N coating on
steel. The stress
measurement was
performed in grazing
incidence. Repeated
measurement with
different grazing
incidence angles
allow to probe for the
possible existence of a
stress gradient.
Reflectometry and texture analysis
Empyrean offers it all:
• quality inspection of incoming
(powdered) materials and
substrates
Reciprocal
space
mapping
• depth profiling using grazing
incidence geometry
• analysis of the thickness and
roughness of single- or multilayer systems with X-ray
reflectometry (XRR)
• orientation analysis of
polycrystalline layers
• in-plane diffraction
• determination of residual stresses
in layers and coatings
• epitaxy analysis using rocking
curves and reciprocal space maps
8
Fast reciprocal space map on a Si/SiGe sample measured with a scanning
PIXcel detector. Speed gain about a factor of 10 compared to usual setup
NbAl thin film multilayers grown
on sapphire and silicon substrates
show fiber texture. Reflectivity
and wide angle scanning provide
information in just 5 minutes.
Reflectivity gives data about
multilayer thickness and interface
roughness. Wide angle scanning can
be supported with texture studies
using pole figures and or 2theta/
omega scans at different omega
offsets. Note that the Nb(121)
reflection, for example, is absent
from the symmetric scan but can be
observed with omega offset of 30°.
A pole figure shows the Nb(121)
reflection as a ring also illustrating
that the film orientation is
random in-plane.
9
EMPYREAN
Nanomaterials – data that speaks for itself
Pair distribution function (PDF) analysis
Qmax=21Å-1 (Ag)
For the analysis of nanoparticle size,
shape, specific surface area or dilute
dispersions, EasySAXS, PANalytical’s
small angle X-ray scattering (SAXS)
application, is designed for ease of use.
The size of crystalline domains within
nanomaterials can be obtained from the
line profile analysis within HighScore
(Plus). Structure analysis of amorphous
or nano-crystalline materials can be
undertaken with pair distribution
function (PDF) analysis.
The large range of non-ambient
environments available for the
Empyrean can also be used beneficially
for synthesizing and characterizing
nano-materials. For example, the
sintering of nano-particles as a function
of temperature, be it in air, vacuum or
other gasses, can be observed. Catalytic
activity, under gas pressures up to
100 bar, can be studied. For all these
applications Empyrean allows users to
pick and place the right PreFIX X-ray
components to give the best results.
In situ crystallization
monitoring
Intensity
SAXS
Qmax=17Å-1 (Mo)
XRD
Combined XRD and SAXS
measurement on nano-titania.
Besides anatase, the phase analysis
indicates low amounts of rutile in
the material (small peaks marked by
arrows). The very broad diffraction
peaks of the anatase phase indicate
a small crystallite size, as can be
expected for a nanopowder sample.
The SAXS signal can be used for
the determination of the size
distribution of the nanoparticles
95 % anatase
5 % rutile
108
106
104
0
10
20
30
40
50
60
70
80
2 Theta [deg.]
Qmax=7Å-1 (Cu)
40
PDF analysis is preferably performed with high-energy radiation. Every
Empyrean supports the use of Mo or even Ag radiation, with slit optics
or dedicated mirror optics. The graphs show that the use of longerwavelength radiation significantly reduces the quality of the experimental
PDF. Results obtained with Ag radiation on Empyrean compare very well
with beam line experiments.
Analysis of multi-modal size distribution with SAXS
Volume distribution Dv (R)
The unique properties of nanometer
sized materials have inspired the
research community for the last decade.
Phase identification and Small-Angle X-ray Scattering (SAXS)
Crystallite size and microstrain analysis
5 nm
0.15
8 nm
0.10
14 nm
PANalyticals EasySAXS software
allows the analysis of multi-modal
size distributions without a priori
assumptions about the type of
distribution. Here a tri-modal
particle size distribution of a dilute
silica dispersion
0.05
0
0
5
10
15
20
Particle radius R [nm]
Intensity [cps]
Empyrean supports many X-ray
techniques for the analysis of
nanomaterials, whether for thin films,
powdered substances or slurries.
120000
[210]
pH 6 - 50 h
pH 6 - 40 h
pH 6 - 30 h
pH 6 - 20 h
pH 6 - 10 h
100000
80000
[002]
60000
On-line investigation of DL-alanine
crystallization at pH 6 measured in
a slurry flow cell installed on the
Empyrean.
After a starting crystal growth with
pronounced peaks at the [311] and
[002] reflections, the crystals starts to
grow stronger in the [210] direction
after around 38 hours.
10
40000
20000
0
14
16
18
20
22
24
26
28
30
2Theta [deg.]
Information on the microstructure of crystalline materials (crystallite size and microstrain; also known
as size-strain analysis) is obtained from the width and the shape of X-ray diffraction peak profiles.
HighScore (Plus) can calculate size and strain information for each diffraction peak.
The screen shot also shows the Williamson-Hall plot giving the average size and strain results.
11
EMPYREAN
Empyrean can handle all of these
samples.
For the phase identification of rough
and irregularly shaped objects,
parallel beam geometry is often used.
PANalytical’s philosophy for this
geometry is consistent with all our setups - optimize, not compromise.
Empyrean can also analyze large and
heavy samples up to 10 kg, a unique
capability for a flexible multi-purpose
X-ray system. The 3-axes Empyrean
cradle allows you to mount components
of up to 2 kg, and perform preferred
orientation (texture) and residual stress
using the chi-tilt or omega-tilt method.
A further unique possibility with
Empyrean is to see inside small solid
objects without having to cut them.
Computed tomography (CT) analysis
determines the area of interest for
subsequent X-ray diffraction analysis, or
can be used to check for the presence of
pores.
CT can be used to visualize the
fabric, defects and inclusions
of a sample. The density of the
sample can be obtained and
differences can be calculated.
This provides a valuable new
tool for researchers and gives
new possibilities for the interpretation
of the XRD data. Especially the
combination from 1D and 2D diffraction
information with 3D–CT supplies the
first time a complete picture of the
sample.
In this example two concrete samples with different properties are shown. The X-ray patterns
on the right show a clear presence of Portlandite and a reduced amount of calcite in the upper
sample (prepared with glass). The other sample shows a significantly lower amount of Portlandite
and an increased amount of calcite (sample prepared without glass). This can be explained by
the microstructure that is visualized by CT: The upper sample shows a more dense microstructure
inhibiting carbonatization whereas the other sample shows more pores and cracks that allow for a
stronger carbonatization – affecting the long term stability.
40000
With glass
Quartz
22500
10000
Calcite
2500
Portlandite
Stress analysis
18
19
20
21
22
23
24
26
27
28
29
30
2Theta [deg.]
40000
Without glass
Quartz
22500
10000
Calcite
2500
Portlandite
18
19
20
21
22
23
24
25
26
27
28
29
Stress measurement was
made on an inner ball
bearing ring probing the
bottom of the raceway. The
graph shows the sin2ψ plot
of the data determined in
raceway direction.
30
2Theta [deg.]
Radiography, computed tomography and microdiffraction
Empyrean offers unrivalled possibilities
for non-destructive analysis on natural
or historical objects.
As example we analyzed a river shell
combining CT and XRD data:
The radiograph on the right side
exhibits some voids in the shell that
are not visible from the outside. The
CT reconstruction of the shell (middle)
allows in addition slicing the shell in
planes and analyzing the structure
in more detail. At the position of the
arrow (connection of the shell muscle) –
also marked in the picture by the green
spot - an analysis of the aragonite phase
orientation has been performed:
The strong preferred orientation of
the aragonite is easily visible in the 2D
diffractograms measured with small
variation in the orientation of the shell
(three arrows).
25
2Theta [deg.]
Examples are widespread:
• geological samples
• pharmaceutical tablets
• engineered components such as ball
bearings, joints and axles
Computed tomography and phase identification
Intensity [counts]
Sometimes samples must be analyzed
without any sample preparation.
Intensity [counts]
Solid objects – data that speaks for itself
124.2
Stress: -470.1 ± 34.0 MPa
Phi = 0.0°
124.0
123.8
123.6
123.4
123.2
0.0
0.1
0.2
0.3
0.4
0.5
0.6
sin2 [Psi]
Texture analysis
Texture analysis of aluminium
processed by equal channel
angular pressing (ECAP) – an
effective method to reduce
grain size and enhance
mechanical properties of
metals and alloys.
Typical ECAP-processed sample and pole figures determined
for three different reflections
12
13
EMPYREAN
Cutting-edge technology
in every aspect
Universal PreFIX
The Empyrean system is
equipped with universal PreFIX
optics, stages and accessories,
PANalyticals proven proprietary
kinematic mounting concept for
Pre-aligned Fast Interchangeable
X-ray modules. The robust
hardened tool steel mounts allow a
reproducible positioning of optics
and stages in three dimensions with
microns precision eliminating any
need for re-alignment.
2
4
The world’s most accurate high-resolution
goniometer
Step size 0.0001°, 2θ linearity ±0.01°.
9
1
Intensity [counts]
In order to make the ultimate X-ray
diffractometer for powders, thin films,
nanomaterials and 3D objects, all
essential components have been newly
developed by our experienced R&D
team.
Wide opening cabinet
gives easy access to the
experimental area
8
8
PANalytical’s
Empyrean
Tubes:: robust
exchange of
tube focus
position and
largest variety
of tube anode
materials
9
3
FWHM = 0.026 °2θ
1000
1
4
7
0
21
21.20
21.40
21.60
Position [°2Theta] (Copper (Cu))
The unique PiXcel3D detector,
co-developed with CERN and
other leading European scientific
institutes - more on next pages
3
Empyrean sets the new bar for laboratory X-ray system resolution,
with a FWHM of 0.026 degrees 2-theta for the first reflection of NIST
SRM660a LaB6.
5
6
"We combined longtime experience
and the latest
technology to make
a high-performance
workhorse with
ultimate flexibility
for today's and
future applications".
7
Meets all relevant
world wide regulations
regulations,
for X-ray, electrical and
mechanical safety
5
Comprehensive software
suite for data collection and
analysis. Supports multiple users,
unattended and remote operation,
and automatic data collection,
analysis and reporting.
7
14
LaB6 standard Empyrean
LaB6 Alpha-1 Empyrean
2
New, unique sample stages
• Compact 5-axes ¼-circle cradle
• Compact 3-axes ¼-circle cradle,
capable of holding samples up to 2 kg
• CT sample spinner stage
• Computer-controlled height
alignment and temperaturecompensating stage for non-ambient
chambers
• All sample stages are interchangeable
in minutes
• All large stages and non-ambient
chambers can be completely removed
from the system – without powerdown
2000
19” rack
mounts
for nonambient
controllers
and
integrated
vacuum
system
6
Enclosure is
on wheels for
easy installation and
relocation
7
A heart with a brain
The heart of the Empyrean is a new revolutionary highresolution goniometer evolving upon a long PANalytical
tradition in precision goniometers. It makes use of the
next generation of Direct Optical Encoding System
(DOPS2), featuring precisely aligned Haidenhain encoders
and Path Tracking Technology (PTT) for continuous
advanced motion control based on Digital Signal
Processing (DSP). Due to this advanced motion control
the goniometer offers highest resolution and differential
accuracy and positions its arms faster and more precisely
than ever before.
15
PIXcel3D cutting edge
technology
PIXcel and PIXcel3D
advantages
The point detector with the
highest dynamic range, highest
maximum count rate and lowest
background
Typical applications
Intensity [counts]
Detector mode
A strong partnership
with CERN
100M
10M
1M
100K
10K
0D mode: All pixels are added up to give
one intensity value as a function of time
1K
100
10
-6000
-4000
-2000
0
2000
4000
6000
The line detector with the highest
dynamic range and the smallest
strip size
Intensity [counts]
The introduction of PIXcel3D adds a
new dimension to XRD analysis. This
unique photon counting detector is
the most advanced in the world. The
combination of high spatial resolution
with no point spread function, highest
dynamic range and low noise sets a new
standard of performance. In addition,
the 2D scanning possibilities of this
detector make it the most versatile
ever to be available on a commercial
diffractometer.
Intensity [counts]
Omega/2Theta [s]
Rocking curve on
epitaxial layer
structure without
the need for a beam
attenuator
2000
4000
1000
3000
0
FWHM = 0.026 °2θ
21
21.20
21.40
21.60
Position 2Theta [deg.] (Copper Cu))
2000
1D mode: All pixels in one column are
added up to form a position-sensitive
detector in one direction
1000
0
20
30
40
50
60
70
80
90
PIXcel3D is the result of PANalytical’s partnership in the
Medipix2 collaboration – a consortium of more than 16
leading particle physics research institutes across Europe,
headed by CERN. As state-of-the-art detector developments
have become more complex, only the largest groups active
in fundamental research can deal with the planning and
investment involved.
100 110 120 130 140
Position 2Theta [deg.] (Copper (Cu))
LaB6 measurement
in Bragg-Brentano
geometry and with
alpha-1 Johansson
monochromator
PANalytical is an industrial partner
to this collaboration and has secured
the exclusive rights to commercialize
the resulting technology for analytical
X-ray applications, putting you at the
forefront of detector developments for
many years to come.
The area detector combining the
advantages of highest spatial
resolution, high dynamic range
per pixel and low noise - not
requiring any calibration
2D mode*: All pixels are read out
independently: direct observation of the
X-ray image
Compact,
smart and
powerful
2D XRD …
and more
2D pattern of
coarse aspirin
The computed tomography
detector with the smallest
pixel size and the highest
dynamic range
3D mode*: All pixcels are read out
independently: many 2D images are combined to
reconstruct the voxels of the object: computed
tomography
“The Medipix2 chip technology, combines high spatial
resolution, high dynamic range and low noise. The
Medipix2 Collaboration is happy that this leading-edge
technology is being exploited by PANalytical for
materials analysis.”
M. Campbell, Spokesman, Medipix2 Collaboration
CT reconstruction
of pharmaceutical
capsules in the
original blister
package, virtual
dissection
“PANalytical adopted the technology early and has been
an invaluable Technology Transfer partner for CERN and
the Collaboration.”
B. Denis, CERN Technology Transfer
* only available on PIXcel3D
16
17
Partnership with PANalytical
- ultimate commitment
Your decision to invest in Empyrean marks the beginning of a relationship that
will last for many years. A critical goal in our development of Empyrean was to
do more than provide a solid platform for each user to build their perfect XRD
system. Together with our technical specialists and applications scientists, each
diffractometer will be developed into the perfect instrument for your analysis
needs. Your input guides our development efforts, and jointly we will get the
most information out of your challenging materials.
PANalytical’s track record of adding new
technology and new applications to
existing systems is unrivalled, thanks to
consequent use of PreFIX modules over
many years. Empyrean will build on this
heritage.
Expert to
expert
Training courses, instrument
familiarization sessions, application
workshops and remote learning
channels provide important information
for new and existing users. PANalytical
facilities around the world deliver
these, alongside more general
scientific meetings on a variety of X-ray
diffraction and scattering topics.
Extending your capabilities
This page shows a few examples of
the technologies we are working on
for further expansion of Empyrean's
capabilities:
In the know
• Multi-segment, solid-state pixel
detectors
• Evacuated beam path for SAXS
measurements on diluted samples
• Microfocus X-ray sources and optics
Microfocus X-ray source
PANalytical customers know
Almost 80 % of the world's
top 50 universities* are
customers and development
partners of PANalytical.
*www.usnews.com/articles/
education/worlds-bestuniversities/2009/10/20/worlds-bestuniversities-top-200.html
Artist‘s impression of evacuated beam path - SAXS
Assembly of four PIXcel3D detectors (Quad)
18
19
PANalytical
PANalytical is the world’s leading supplier of analytical instrumentation and
software for X-ray diffraction (XRD) and X-ray fluorescence spectrometry (XRF),
with more than half a century of experience. The materials characterization
equipment is used for scientific research and development, for industrial process
control applications and for semiconductor metrology.
PANalytical, founded in 1948 as part of Philips, employs around 900 people
worldwide. Its headquarters are in Almelo, the Netherlands. Fully equipped
application laboratories are established in Japan, China, the USA, and the
Netherlands. PANalytical’s research activities are based in Almelo (NL) and on
the campus of the University of Sussex in Brighton (UK). Supply and competence
centers are located on two sites in the Netherlands: Almelo (development and
production of X-ray instruments) and Eindhoven (development and production
of X-ray tubes). A sales and service network in more than 60 countries ensures
unrivalled levels of customer support.
The company is certified in accordance with ISO 9001:2000 and ISO 14001.
The product portfolio includes a broad range of XRD and XRF systems and software
widely used for the analysis and materials characterization of products such as
cement, metals and steel, nanomaterials, plastics, polymers and petrochemicals,
industrial minerals, glass, catalysts, semiconductors, thin films and advanced
materials, pharmaceutical solids, recycled materials and environmental samples.
Visit our website at www.panalytical.com for more information about our
activities.
PANalytical is part of Spectris plc, the precision instrumentation and controls
company.
20
PANalytical B.V.
Lelyweg 1, 7602 EA Almelo
The Netherlands
T +31 (0) 546 534 444
F +31 (0) 546 534 598
[email protected]
www.panalytical.com
Regional sales offices
Americas
T +1 508 647 1100
F +1 508 647 1115
Europe, Middle East, Africa
T +31 (0) 546 834 444
F +31 (0) 546 834 499
Asia Pacific
T +65 6741 2868
F +65 6741 2166
Although diligent care has been used to ensure that the information herein is accurate, nothing contained herein can be construed
ed to imply any
representation or warrantee as to the accuracy, currency or completeness of this information. The content hereof is subject to change without
further notice.Please contact us for the latest version of this document or further information. © PANalytical B.V. [2009]
Printed in The Netherlands on 50% recycled, chlorine-free paper. 9498 702 17211 PN7193
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