IT Report

Transcription

IT Report

Test Report
Product Name ： Notebook P.C.
Model No.
： MS-163B, VR610
Applicant ： Micro-Star Int’L Co.,Ltd.
Address ： No.150, Li-Te Rd., Peitou, Taipei, Taiwan, R.O.C.
Date of Receipt ： 2007/08/17
Issued Date
： 2007/10/08
Report No.
： 068L111-IT-CE-P07V04-2
This appendix report was based on Quietek report No.068L111
The test results relate only to the samples tested.
The test results shown in the test report are traceable to the national/international standard through the calibration
of the equipment and evaluated measurement uncertainty herein.
This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government.
The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Report No： 068L111-IT-CE-P07V04-2
Test Report Certification
Issued Date
Report No.
: 2007/10/09
: 068L111-IT-CE-P07V04-2
Product Name
:
Notebook P.C.
Applicant
:
Micro-Star Int’L Co.,Ltd.
Address
:
No.69, Li-De St., Chung-Ho City, Taipei Hsien,Taiwan
Manufacturer
:
MSI ELECTRONICS (KUNSHAN)CO.,LTD.
Model No.
:
MS-163B, VR610
Rated Voltage
:
AC 230 V / 50 Hz
EUT Voltage
:
AC 100-240 V / 50-60 Hz
Trade Name
:
MSI
Applicable Standard
:
EN 55022: 1998+A1: 2000+A2: 2003 Class B
EN 61000-3-2: 2000+ A2: 2005
EN 61000-3-3: 1995+A1: 2001+A2: 2005
EN 55024: 1998+A1: 2001+A2: 2003
Test Result
:
Complied
Performed Location
:
Suzhou EMC laboratory
No.99 Hongye Rd., Suzhou Industrial Park Loufeng
Hi-Tech Development Zone.,Suzhou, China
TEL: +86-512-6251-5088 / FAX: +86-512-6251-5098
Documented By
Reviewed By
Approved By
:
(
Kayla Kan
)
(
Dream Cao
)
:
:
(
Murphy Wang
Page: 2 of 98
)
Laboratory Information
We , QuieTek Corporation, are an independent EMC and safety consultancy that was
established the whole facility in our laboratories. The test facility has been accredited by the
following accreditation Bodies in compliance with ISO 17025, EN 45001 and Guide 25:
Taiwan R.O.C.
:
BSMI, DGT, CNLA
Germany
:
TUV Rheinland
Norway
:
Nemko, DNV
USA
:
FCC, NVLAP
Japan
:
VCCI
The related certificate for our laboratories about the test site and management system can be downloaded
from QuieTek Corporation’s Web Site : http://tw.quietek.com/modules/myalbum/
The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site :
http://www.quietek.com/
If you have any comments, Please don’t hesitate to contact us. Our contact information is as below:
HsinChu Testing Laboratory :
No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307,
Taiwan, R.O.C.
TEL:+886-3-592-8858 / FAX:+886-3-592-8859
E-Mail : [email protected]
1313
LinKou Testing Laboratory :
No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C.
TEL : +886-2-8601-3788 / FAX : 886-2-8601-3789
0914
Suzhou Testing Laboratory :
No.99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., SuZhou, China
TEL : +86-512-6251-5088 / FAX : 86-512-6251-5098
1596
Page: 3 of 98
TABLE OF CONTENTS
Description
Page
1. General Information .......................................................................................................7
1.1.
EUT Description......................................................................................................7
1.2.
Mode of Operation ................................................................................................12
1.3.
Tested System Details ..........................................................................................13
1.4.
Configuration of Tested System ............................................................................17
1.5.
EUT Exercise Software.........................................................................................18
2. Technical Test ..............................................................................................................19
2.1.
Summary of Test Result........................................................................................19
2.2.
List of Test Equipment ..........................................................................................20
2.3.
Measurement Uncertainty.....................................................................................23
2.4.
Test Environment ..................................................................................................25
3. Conducted Emission (Main Terminals).........................................................................26
3.1.
Test Specification ..................................................................................................26
3.2.
Test Setup.............................................................................................................26
3.3.
Limit ......................................................................................................................26
3.4.
Test Procedure .....................................................................................................27
3.5.
Deviation from Test Standard................................................................................27
3.6.
Test Result............................................................................................................28
3.7.
Test Photograph ...................................................................................................34
4. Conducted Emissions (Telecommunication Ports).......................................................35
4.1.
4.2.
Test Setup.............................................................................................................35
4.3.
Limit ......................................................................................................................35
4.4.
Test Procedure .....................................................................................................36
4.5.
4.6.
Test Result............................................................................................................37
4.7.
Test Photograph ...................................................................................................46
5. Radiated Emission.......................................................................................................48
5.1.
5.2.
Test Setup.............................................................................................................48
5.3.
Limit ......................................................................................................................48
5.4.
Test Procedure .....................................................................................................49
5.5.
5.6.
Test Result............................................................................................................50
5.7.
Test Photograph ...................................................................................................52
6. Harmonic Current Emission .........................................................................................53
6.1.
Page: 4 of 98
6.2.
Test Setup.............................................................................................................53
6.3.
Limit ......................................................................................................................53
6.4.
Test Procedure .....................................................................................................55
6.5.
6.6.
Test Result............................................................................................................56
6.7.
Test Photograph ...................................................................................................58
7. Voltage Fluctuation and Flicker ....................................................................................59
7.1.
7.2.
Test Setup.............................................................................................................59
7.3.
Limit ......................................................................................................................59
7.4.
Test Procedure .....................................................................................................60
7.5.
7.6.
Test Result............................................................................................................61
7.7.
Test Photograph ...................................................................................................62
8. Electrostatic Discharge ................................................................................................63
8.1.
8.2.
Test Setup.............................................................................................................63
8.3.
Limit ......................................................................................................................63
8.4.
Test Procedure .....................................................................................................64
8.5.
8.6.
Test Result............................................................................................................65
8.7.
Test Photograph ...................................................................................................66
9. Radiated Susceptibility ................................................................................................67
9.1.
9.2.
Test Setup.............................................................................................................67
9.3.
Limit ......................................................................................................................67
9.4.
Test Procedure .....................................................................................................68
9.5.
9.6.
Test Result............................................................................................................69
9.7.
Test Photograph ...................................................................................................70
10. Electrical Fast Transient/Burst .....................................................................................71
10.1.
10.2.
Test Setup.............................................................................................................71
10.3.
Limit ......................................................................................................................71
10.4.
Test Procedure .....................................................................................................72
10.5.
10.6.
Test Result............................................................................................................73
10.7.
Test Photograph ...................................................................................................74
Page: 5 of 98
11. Surge…........................................................................................................................76
11.1.
11.2.
Test Setup.............................................................................................................76
11.3.
Limit ......................................................................................................................76
11.4.
Test Procedure .....................................................................................................77
11.5.
11.6.
Test Result............................................................................................................78
11.7.
Test Photograph ...................................................................................................79
12. Conducted Susceptibility..............................................................................................80
12.1.
12.2.
Test Setup.............................................................................................................80
12.3.
Limit ......................................................................................................................81
12.4.
Test Procedure .....................................................................................................81
12.5.
12.6.
Test Result............................................................................................................83
12.7.
Test Photograph ...................................................................................................84
13. Power Frequency Magnetic Field ................................................................................86
13.1.
13.2.
Test Setup.............................................................................................................86
13.3.
Limit ......................................................................................................................86
13.4.
Test Procedure .....................................................................................................86
13.5.
13.6.
Test Result............................................................................................................87
13.7.
Test Photograph ...................................................................................................88
14. Voltage Dips and Interruption.......................................................................................89
14.1.
14.2.
Test Setup.............................................................................................................89
14.3.
Limit ......................................................................................................................89
14.4.
Test Procedure .....................................................................................................90
14.5.
14.6.
Test Result............................................................................................................91
14.7.
Test Photograph ...................................................................................................92
15. Attachment...................................................................................................................93
EUT Photograph ...................................................................................................93
Page: 6 of 98
1. General Information
1.1. EUT Description
Product Name
Notebook P.C.
Trade Name
MSI
Model No.
MS-163B, VR610
Note:
The EUT includes two models as above; MS-163B is the model number while VR610 is the
marketing name.
Page: 7 of 98
Keypart list
Item
Vendor
Model
Discription
MSI P/N
CPU
AMD
TMDMK38HAX4CM
K9 TURION X2 MK38, 2200,AMD/
A10-K82G2A6-A08
TMDMK38HAX4CM, 2.2GHz,MPGA-638pin,
TURION64-35W-2200MHz (S1 SOCKET) MK38
512KB L2 CACHE,RoHS COMPLIANCE
AMDTK53HAX4DC
K8 ATHLON, TK53, AMD/AMDTK53HAX4DC,
A10-K81G706-A08
1.7GHz,MPGA-638pin, 512KB L2 CACHE S1
SOCKET,RoHS COMPLIANCE
TMDTL56HAX5DC
K9 TURION X2 TL56, 1800,AMD/
A10-K81G8Q6-A08
TMDTL56HAX5DC, 1.8GHz,MPGA-638pin,
TURION64-33W-1800MHz (S1 SOCKET) TL56
1MB L2 CACHE REV G1, RoHS COMPLIANCE
TMDTL60HAX5DC
A10-K82G0B6-A08
TMDTL64HAX5DC
A10-K82G2B6-A08
1MB L2 CACHE REV G1,RoHS COMPLIANCE
TMDTL66HAX5DC
A10-K82G306-A08
TMDTL58HAX5DM
TMDTL58HAX5DM, 1.9GHz,MPGA-638pin, S1
SOCKET TL58 REV G2, RoHS COMPLIANCE
TMDTL60HAX5DM
TMDTL60HAX5DM, 2.0GHz,MPGA-638pin,
TMDTL62HAX5DM
TMDTL62HAX5DM, 2.1GHz,MPGA-638pin,
Page: 8 of 98
A10-K81G916-A08
TMDTL64HAX5DM
K9 TURION X2 TL64,2200,AMD/
TMDTL64HAX5DM,2.2GHz,MPGA-638pin,TURI
ON64-35W-2200MHz(S1 SOCKET) TL64 1MB
L2 CACHE REV G2,RoHS COMPLIANCE
LCD
AU
SMS3600HAX3CM
SMS3600HAX3CM
SMS3600HAX3DN
SMS3600HAX3DN
SMD3800HAX3DN
SMD3800HAX3DN
SMD4000HAX4DN
SMD4000HAX3DN
B154EW01 V7
SYS DISPLAY MODULE,15.4 inch,WXGA,
A10-K82G0C6-A08
S78-2307043-A90
1280x800,GLARE,AU/B154EW01
V7,CCFL,,RoHS COMPLIANCE
Quanta
QD15TL0206
SYS DISPLAY MODULE,15.4inch,WXGA,
S1J-640G009-Q08
1280x800,GLARE,QDI/QD15TL0206,CCFL,FOR
MS-1636,RoHS COMPLIANCE
CHI MEI
N154I2-L02
SYS DISPLAY MODULE,15.4inch,WXGA,
S1J-640G008-CC1
1280x800,GLARE,CHI MEI/N154I2-L02,CCFL,
FOR MS-1636,RoHS COMPLIANCE
ODD
HLDS
GCC-T10N
SYS ODD,PATA,12.7mm,COMBO,HLDS
S7D-1220004-H44
/GCC-T10N,,8x/24x24x24x,RoHS
COMPLIANCE
GSA-T20N
SYS ODD,PATA,12.7mm,SUPER MULTI,HLDS/ S7D-1270007-H44
GSA-T20N,,8X8X8X/8X6X8X/5X8X/24X16X24X,
RoHS COMPLIANCE
QSI/Sony CRX-880A
SYS ODD,PATA,12.7mm,COMBO,SONY NEC
S7D-1220002-SI4
OPTIARC/CRX880A,,24X-CDR/8X-DVDROM,R
oHS COMPLIANCE
AD-7530B
SYS ODD,PATA,12.7mm,SUPER MULTI,SONY S7D-1270009-SI4
NEC OPTIARC/AD-7530B,,8x±DVDR/5x-DVD
RAM,RoHS COMPLIANCE
HDD
Toshiba
MK8037GSX
SYS HDD,SATA,2.5 inch,80GB,5400RPM,
S71-2408507-T14
TOSHIBA/MK8037GSX,FOR MS-163A,RoHS
COMPLIANCE
WD800BEVS-xxRST0 SYS HDD,SATA,2.5 inch,80GB,5400RPM,
WESTERN
DIGITAL/WD800BEVS-00RST0,,RoHS
COMPLIANCE
Page: 9 of 98
S71-2408505-W36
WD
WD1200BEVS-XXUST SYS HDD,SATA,2.5inch,120GB,5400RPM,
0
S71-2412511-W36
WESTERN
DIGITAL/WD1200BEVS-XXUST0,8M
BUFFER,RoHS COMPLIANCE
WD1600BEVS-xxRST0 SYS HDD,SATA,2.5 inch,160GB,5400RPM,
S71-2416501-W36
WESTERN DIGITAL/WD1600BEVS,8M
BUFFER/FOR MS-1633,RoHS COMPLIANCE
WLAN
Atheros
AR5BXB63
SYS MODULE/WIRELESS,TWINHAN/
S57-3800010-T46
AW-GE780,,WLAN,802.11b/g,MINI-PCI,,,RoHS
COMPLIANCE
Memory
Transcend JM467Q643A-6
SYS RAM MODULE,SODIMM,DDR2 SDRAM,
S7C-S336C01-T10
512MB,333(667)MHz,TRANSCEND/JM467Q64
3A-6,RJETRAM/,,RoHS COMPLIANCE
Transcend JM488Q643A-6
S7C-S346C01-T10
1GB,333(667)MHz,TRANSCEND/JM488Q643A6,RJETRAM/,,RoHS COMPLIANCE
A-DATA
ADOPE1A16332
(A-DATA)
S78-2408240-A97
1GB,333(667)MHz,A-DATA/ADOPE1A16332,,,R
oHS COMPLIANCE
Inverter
SAMPO
YIVNMS0018D11- -
SYS/MODULE/INVERTER/SAMPO/YIVNMS001 S78-3300350-SG3
8D11--/NOTEBOOK INVERTER FOR 15 INCH
TFT LCD,RoHS COMPLIANCE
Taiwan
TWS-400-9614
SUMIDA
SYS/MODULE/INVERTER/SAMPO/YIVNMS001 S78-3300450-SG3
8D11-A/NOTEBOOK INVERTER FOR 15inch
CCFL LCD/FOR MS-1034,RoHS COMPLIANCE
SYS/MODULE/INVERTER/SUMIDA/IV14080/T- S78-3300341-S49
LF/DC-AC INVERTER,RoHS(EU EXEMPTION) (340 MPS IC was
prohibitive in USA)
Battery
SIMPLO
SQU-528
SYS BATTERY PACK,LITHIUM-ION,SMP/
S9N-0364210-SB3
925C2550F,PANASONIC/3.6V/2400mAh,6CELL
S/3S2P,10.8V,4800mAH,18650,BLACK,,FOR
SQU-528,RoHS COMPLIANCE
SQU-524
SYS BATTERY PACK,LITHIUM-ION.SMP/
925C2480F/925T2480F,PANASONIC/3.6V/2200
mAh,6CELLS/3S2P,10.8V,4400mAH,18650,BLA
CK,FOR SQU-524,RoHS COMPLIANCE
Page: 10 of 98
S9N-0362220-SB3
Celxpert
BTY-M66
SYS BATTERY PACK,LITHIUM-ION,STL/
S9N-1564210-SJ3
TPI07MSI0003AS,LG/3.6V/2400mAh,6CELLS/3
S2P,10.8V,4800mAH,18650,BLACK,,FOR
BTY-M66,RoHS COMPLIANCE
MDC Modem Agere
D40
MDC1.5 FORM FACTOR V.92 DUAL MODE
S52-2801150-Q09
MODEM CARD
AC-adapter
DELTA
ADP-90SB BB
SYS ADAPTOR,90W,90-264Vin,4.74A,19Vout,
DELTA/ADP-90SB BBED,ALL,2.5/5.5/10.75mm,,
RoHS COMPLIANCE
M/B
MSI
MSI-163B1
MSI-163B1
Note:
The components shown above are new added.
Page: 11 of 98
S93-0406140-D04
1.2. Mode of Operation
QuieTek has verified the construction and function in typical operation. All the test modes were
carried out with the EUT in normal operation, which was shown in this test report and defined as:
Pre-Test Mode
Mode 1: LCD (1280x800@59Hz) + VGA (1280x800@59Hz)
Mode 4: TV (1024x768@60Hz) + VGA (1024x768@60Hz)
Mode 5: LCD (1280x800@59Hz) + TV (1280x800@59Hz)
Mode 7: VGA (1280x800@59Hz) + TV (1280x800@59Hz)
Final Test Mode
EMI
EMS
Page: 12 of 98
Mode 1
Mode 2
CPU
AMD/SMD3800HAX3DN
AMD/AMDTK53HAX4DC/1.7GHz
LCD
AU/B154EW01 V7
CHI MEI/N154I2-L02
HDD
Toshiba/ MK8037GSX
WD/ WD1200BEVS-XXUST0
Memory
Transcend/ JM488Q643A-6
Transcend/JM467Q643A-6
ODD
AU/B154EW01 V7
CHI MEI/N154I2-L02
Inverter
SAMPO/YIVNMS0018D11-A
Taiwan SUMIDA/TWS-400-9614
Battery
SIMPLO/SQU-524
SIMPLO/SQU-528
Power
DELTA/ ADP-90SB BB
DELTA/ ADP-90SB BB
Mode 3
Mode 4
CPU
AMD/TMDTL56HAX5DC/1.8GHz
LCD
Quanta/QD15TL0206
AU/B154EW01 V7
HDD
Memory
ODD
Quanta/QD15TL0206
AU/B154EW01 V7
Inverter
SAMPO/ YIVNMS0018D11--
Battery
SIMPLO/SQU-528
SIMPLO/SQU-528
Power
DELTA/ ADP-90SB BB
DELTA/ ADP-90SB BB
Mode 5
Mode 6
CPU
LCD
Quanta/QD15TL0206
Quanta/QD15TL0206
HDD
WD/ WD1600BEVS-xxRST0
Memory
A-DATA/ ADOPE1A16332
ODD
Quanta/QD15TL0206
Quanta/QD15TL0206
Inverter
Battery
SIMPLO/SQU-528
SIMPLO/SQU-528
Power
DELTA/ ADP-90SB BB
DELTA/ ADP-90SB BB
Mode7
Mode 8
CPU
AMD/TMDTL58HAX5DM/1.9GHz
AMD/TMDTL60HAX5DM
LCD
CHI MEI/N154I2-L02
Quanta/QD15TL0206
HDD
Supply
Supply
Supply
Page: 13 of 98
Memory
DDR2-667 ECC UNB 512MB
ODD
CHI MEI/N154I2-L02
Quanta/QD15TL0206
Inverter
Battery
SIMPLO/SQU-528
SIMPLO/SQU-528
Power
DELTA/ ADP-90SB BB
DELTA/ ADP-90SB BB
Mode 9
Mode 10
CPU
AMD/TMDTL62HAX5DM
AMD/TMDTL64HAX5DM
LCD
AU/B154EW01 V7
AU/B154EW01 V7
HDD
Toshiba/ MK8037GSX
Memory
ODD
AU/B154EW01 V7
AU/B154EW01 V7
Inverter
Battery
SIMPLO/SQU-528
SIMPLO/SQU-528
Power
DELTA/ ADP-90SB BB
DELTA/ ADP-90SB BB
Mode 11
Mode 12
CPU
AMD/SMS3600HAX3CM
AMD/SMS3600HAX3DN
LCD
Quanta/QD15TL0206
Quanta/QD15TL0206
HDD
Toshiba/ MK8037GSX
Memory
ODD
Quanta/QD15TL0206
Quanta/QD15TL0206
Inverter
Battery
SIMPLO/SQU-528
STL/BTY-M66
Power
DELTA/ ADP-90SB BB
DELTA/ ADP-90SB BB
Mode 13
Mode 14
CPU
AMD/TMDMK38HAX4CM
AMD/SMD4000HAX4DN
LCD
CHI MEI/N154I2-L02
Quanta/QD15TL0206
HDD
Memory
ODD
Quanta/QD15TL0206
Quanta/QD15TL0206
Inverter
Battery
SIMPLO/SQU-528
SIMPLO/SQU-524
Supply
Supply
Supply
Page: 14 of 98
Power
DELTA/ ADP-90SB BB
DELTA/ ADP-90SB BB
Supply
Page: 15 of 98
1.3. Tested System Details
The types for all equipments, plus descriptions of all cables used in the tested system (including
inserted cards) are:
Product
Manufacturer
Model No.
Serial No.
Power Cord
1
TV
TCL
1475S
01000481106AG1855
Non-Shielded, 1.8m
2
LCD Monitor
CHI MEI
A170E1-0F
FNC122F57CA1299
Power by adaptor
3
Printer
EPSON
B241A
7094256
Non-Shielded, 1.8m
SOMIC
CD-2688M.V
N/A
N/A
4
Microphone &
Earphone
5
Walkman
Jingba
JB-186
N/A
Battery
6
iPod
Apple
A1199
7J7106FDVQ5
Power by PC
7
iPod
Apple
A1199
7J7103ALVQ5
Power by PC
8
iPod
Apple
A1199
7J7107VOVQ5
Power by PC
9
SATA HDD
ESATA
STM10
A01926-F03-0013
Power by adaptor
10 SATA HDD
ESATA
STM10
A01926-F03-0014
Power by adaptor
Duolutong
TC-106H
1
Non-Shielded, 1.5m
12 Notebook
DELL
PP19L
JH097 A01
Power by adaptor
13 SD Card
Kingston
1GB
N/A
N/A
SUNIX
SEC
600000095
N/A
Program
11
Control
Telephone
Exchange
14
SATA II
Express Card
Page: 16 of 98
1.4. Configuration of Tested System
Connection Diagram
Signal Cable Type
Signal cable Description
A
B
C
D
E
F
G
H
I
J
K
L
Non-Shielded, 1.8m
Shielded, 1.8m
Shielded, 1.8m
Non-Shielded, >10m
Non-Shielded, 1.8m
Non-Shielded, 1.8m
Shielded, 1.0m
Shielded, 1.0m
Shielded, 1.0m
Shielded, 1.8m
Shielded, 1.8m
Non-Shielded, >10m
S-Video Cable
D-Sub Cable
USB Cable
Telecom Cable
Microphone & Earphone Cable
Audio Cable
iPod USB Cable
iPod USB Cable
iPod USB Cable
SATA Cable
SATA Cable
LAN Cable
Page: 17 of 98
1.5. EUT Exercise Software
1
Setup the EUT and simulators as shown on above.
2
Turn on the power of all equipment.
3
Reads and writes data from HDD, iPod, SATA HDD and SD Card.
4
Send “H” pattern on the LCD.
5
Send and receive data through LAN and Telecom
6
Turn on Camera and play DVD disk.
Page: 18 of 98
2. Technical Test
2.1. Summary of Test Result
No deviations from the test standards
Deviations from the test standards as below description:
Emission
Test
Performed Test Item
Normative References
Conducted Emission
EN 55022: 1998+A1: 2000+A2: 2003 Class B
Yes
No
Conducted Emissions
EN 55022: 1998+A1: 2000+A2: 2003 Class B
Yes
No
Radiated Emission
EN 55022: 1998+A1: 2000+A2: 2003 Class B
Yes
No
Power Harmonics
EN 61000-3-2: 2000+A2: 2005
Yes
No
Voltage Fluctuation and
EN 61000-3-3: 1995+A1: 2001+A2: 2005
Yes
No
Performed
Deviation
(Telecommunication Ports)
Flicker
Immunity
Test
Performed Test Item
Normative References
Electrostatic Discharge
IEC 61000-4-2: 2001
Yes
No
Radiated susceptibility
IEC 61000-4-3: 2006
Yes
No
Electrical fast transient/burst IEC 61000-4-4: 2004
Yes
No
Surge
IEC 61000-4-5: 2005
Yes
No
Conducted susceptibility
IEC 61000-4-6: 2006
Yes
No
Power frequency magnetic
IEC 61000-4-8: 2001
Yes
No
Yes
No
Performed
Deviation
field
Voltage dips and interruption IEC 61000-4-11: 2004
Page: 19 of 98
2.2. List of Test Equipment
Conducted Emission / SR-1
Instrument
EMI Test Receiver
Two-Line V-Network
Two-Line V-Network
V-Network
V-Network
ISN
Manufacturer
R&S
R&S
R&S
R&S
R&S
Schaffner
Balanced Telecom ISN
Fischer
Fischer
Fischer
Current Probe
50ohm Coaxial Switch
50ohm Termination
Coaxial Cable
Temperature/Humidity Meter
Radiated Emission / AC-1
Instrument
Spectrum Analyzer
Spectrum Analyzer
EMI Test Receiver
Preamplifier
Preamplifier
Preamplifier
Bilog Type Antenna
Bilog Type Antenna
*Broad-Band Horn Antenna
Coaxial Cable
Coaxial Cable
Coaxial Cable
Temperature/Humidity Meter
R&S
ANRITSU
SHX
Luthi
zhicheng
Type No.
ESCI
ENV216
ENV216
ESH3-Z6
ESH3-Z6
ISN T400
FCC-TLISN-T202
FCC-TLISN-T402
FCC-TLISN-T802
EZ-17
MP59B
50ohmI
RG214
ZC1-2
Manufacturer
Agilent
Agilent
R&S
Quietek
Quietek
Quietek
Schaffner
Schaffner
Schwarzbeck
ANRITSU
ANRITSU
ANRITSU
Huber+Suhner
Huber+Suhner
Huber+Suhner
zhicheng
Type No.
E4403B
E4403B
ESCI
AP-025C
AP-025C
AP-180C
CBL6112B
CBL6112B
BBHA9120D
MP59B
MP59B
MP59B
AC1-L
AC1-R
AC1-C
ZC1-2
Serial No
100176
100013
100014
100248
100249
21648
Cal. Date
2006/11/22
2006/11/20
2006/11/20
2006/11/20
2006/11/20
2006/11/20
20352
2007/03/02
20353
2007/03/02
20354
2007/03/02
100255
6200464462
QT-IM001
519358
QT-TH004
2007/04/18
2006/11/25
2007/03/20
2006/11/25
2007/03/31
Serial No
MY45102715
MY45102798
100175
QT-AP001
QT-AP002
CHM-0602012
2933
2931
496
6200447303
6200464461
6200447305
01
02
03
QT-TH001
Cal. Date
N/A
N/A
2006/11/20
2006/11/22
2006/11/22
2006/11/25
2006/11/22
2006/11/25
2005/11/25
2006/11/25
2006/11/25
2006/11/25
2006/11/25
2006/11/25
2006/11/25
2007/03/31
Serial No
MY45102679
100573
QT-AP003
CHM-0602013
2932
496
6200447304
04
QT-TH002
Cal. Date
2006/11/20
2007/05/23
2006/11/25
2006/11/25
2006/11/22
2005/11/25
2006/11/25
2006/11/25
2007/03/30
Note: “*” means the test device calibration period for two years.
Radiated Emission / AC-2
Instrument
Manufacturer
Spectrum Analyzer
Agilent
EMI Test Receiver
R&S
Preamplifier
Quietek
Preamplifier
Quietek
Bilog Type Antenna
Schaffner
*Broad-Band Horn Antenna Schwarzbeck
ANRITSU
Coaxial Cable
Huber+Suhner
Temperature/Humidity Meter zhicheng
Type No.
E4408B
ESCI
AP-025C
AP-180C
CBL6112B
BBHA9120D
MP59B
AC2-C
ZC1-2
Note: “*” means the test device calibration period for two years.
Page: 20 of 98
Power Harmonics / SR-1
Instrument
Manufacturer
AC Power Source
California
Power Analyzer
California
Type No.
5001iX-208
PACS-1
ZC1-2
Serial No
56741
72419
QT-TH004
Cal. Date
2006/11/22
2006/11/22
2007/03/31
Voltage Fluctuation and Flicker / SR-1
Instrument
Manufacturer
AC Power Source
California
Power Analyzer
California
Type No.
5001iX-208
PACS-1
ZC1-2
Serial No
56741
72419
QT-TH004
Cal. Date
2006/11/22
2006/11/22
2007/03/31
Electrostatic Discharge / SR-3
Instrument
Manufacturer
ESD Simulator
KeyTek
ESD Simulator
EM TEST
Barometer
Fengyun
Type No.
MZ-15/EC
dito
DYM3
ZC1-2
Serial No
0511209
V0616101367
0506048
QT-TH006
Cal. Date
2006/11/22
2007/06/14
2006/11/22
2007/03/21
Type No.
SML03
4231A
51011-EMC
RFS N100
CBA9428
CBA9413B
DC7144A
CHA 9652B
Serial No
102324
144502
33859
21799
43516
43526
312249
0121
Cal. Date
2006/11/20
2006/11/20
2006/11/20
N/A
N/A
N/A
2006/11/21
2006/11/21
2244/90.21
AZ-0030
2007/07/31
2244/70
AW-0074
2007/07/30
CBL6141A
AT4002A
ZC1-2
4278
312312
QT-TH003
N/A
N/A
2007/03/31
Type No.
EMCpro
CCL
ZC1-2
Serial No
508273
0510181
QT-TH005
Cal. Date
2007/05/23
2007/05/23
2007/03/31
Type No.
EMCpro
Serial No
508273
Cal. Date
2007/05/23
CM-TELCD
0506277
N/A
CM-I/OCD
0508206
N/A
ZC1-2
QT-TH005
2007/03/31
Radiated susceptibility / AC-3
Instrument
Manufacturer
Signal Generator
R&S
Power Meter
Boonton
Power Sensor
Boonton
RF Switch Network
Schaffner
Power Amplifier
Schaffner
Power Amplifier
Schaffner
Directional Coupler
A&R
Directional Coupler
Schaffner
Electric Field Probe Type
narda
8.3
Electromagnetic Radiation
narda
Meter
Bilog Type Antenna
Schaffner
Horn Antenna
A&R
Electrical fast transient/burst / SR-2
Instrument
Manufacturer
Immunity Test System
KeyTek
CCL
KeyTek
Surge / SR-2
Instrument
Manufacturer
KeyTek
Coupler/Decoupler Telecom
KeyTek
line
Coupler/Decoupler Signal
KeyTek
line
Page: 21 of 98
Conducted susceptibility / SR-2
Instrument
Manufacturer
RF-Generator
Schaffner
Attenuator
Schaffner
CDN
Schaffner
CDN
Schaffner
EM Clamp
Schaffner
50ohm Termination
SHX
Type No.
NSG2070
INA2070-1
CDN T400
CDN M016
KEMZ 801
50ohmI
ZC1-2
Serial No
1120
2120
19083
21249
21041
QT-IM002
QT-TH005
Cal. Date
2006/11/23
2006/11/23
2006/11/23
2006/11/23
2006/11/23
2007/03/20
2007/03/31
Serial No
508273
Cal. Date
2007/05/23
05016
2007/05/23
Clamp Meter
Fluke
Type No.
EMCpro
F-1000-4-8/9/10
-L-1M
312
ZC1-2
89390047
QT-TH005
2007/03/09
2007/03/30
Voltage dips and interruption / SR-2
Instrument
Manufacturer
KeyTek
Type No.
EMCpro
ZC1-2
Serial No
508273
QT-TH005
Cal. Date
2007/05/23
2007/03/31
Power frequency magnetic field / SR-2
Instrument
Manufacturer
KeyTek
CM-HCOIL H-Field Loop
KeyTek
Page: 22 of 98
2.3. Measurement Uncertainty
Conducted Emission
The measurement uncertainty is evaluated as ± 2.26 dB.
Conducted Emissions (Telecommunication Ports)
Radiated Emission
Harmonic Current Emission
The measurement uncertainty is evaluated as ± 1.2 %.
Voltage Fluctuations and Flicker
The measurement uncertainty is evaluated as ± 1.5 %.
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
2005[E], the requirements for measurement uncertainty in ESD testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant ESD standards. The
immunity test signal from the ESD system meet the required specifications in IEC 61000-4-2
through the calibration report with the calibrated uncertainty for the waveform of voltage and
timing as being 1.63 % and 2.76%.
Radiated susceptibility
2005[E], the requirements for measurement uncertainty in RS testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant RS standards. The
immunity test signal from the RS system meet the required specifications in IEC 61000-4-3
through the calibration for the uniform field strength and monitoring for the test level with the
uncertainty evaluation report for the electrical filed strength as being 2.72 dB.
Electrical fast transient/burst
1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to
have been satisfied, and the testing is reported in accordance with the relevant FT/Burst
standards. The immunity test signal from the FT/Burst system meet the required
specifications in IEC 61000-4-4 through the calibration report with the calibrated uncertainty
for the waveform of voltage. Frequency and timing as being 1.63%, 2.8
10-10 and 2.76%.
Surge
2005[E], the requirements for measurement uncertainty in Surge testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant Surge standards.
The immunity test signal from the Surge system meet the required specifications in IEC
61000-4-5 through the calibration report with the calibrated uncertainty for the waveform of
Page: 23 of 98
voltage and timing as being 1.63 % and 2.76%.
2005[E], the requirements for measurement uncertainty in CS testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant CS standards. The
immunity test signal from the CS system meet the required specifications in IEC 61000-4-6
through the calibration for unmodulated signal and monitoring for the test level with the
uncertainty evaluation report for the injected modulated signal level through CDN and EM
Clamp/Direct Injection as being 3.72 dB and 2.78 dB.
Power frequency magnetic field
2005[E], the requirements for measurement uncertainty in PFM testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant PFM standards.
The immunity test signal from the PFM system meet the required specifications in IEC
61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter to
verify the output level of magnetic field strength as being 2 %.
Voltage dips and interruption
2005[E], the requirements for measurement uncertainty in DIP testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant DIP standards. The
immunity test signal from the DIP system meet the required specifications in IEC 61000-4-11
through the calibration report with the calibrated uncertainty for the waveform of voltage and
timing as being 1.63 % and 2.76%.
Page: 24 of 98
2.4. Test Environment
Performed Item
Items
Required
Actual
Temperature (°C)
Conducted Emission Humidity (%RH)
Barometric pressure (mbar)
Temperature (°C)
Conducted
Emissions
Humidity (%RH)
(Telecommunication
Ports)
Temperature (°C)
Radiated Emission Humidity (%RH)
Temperature (°C)
Electrostatic
Humidity (%RH)
Discharge
Temperature (°C)
Radiated
Humidity (%RH)
susceptibility
Temperature (°C)
Electrical fast
Humidity (%RH)
transient/burst
Temperature (°C)
Surge
Humidity (%RH)
Temperature (°C)
Conducted
Humidity (%RH)
susceptibility
Temperature (°C)
Power frequency
Humidity (%RH)
magnetic field
Temperature (°C)
Voltage dips and
Humidity (%RH)
interruption
15-35
25-75
860-1060
15-35
25
52
950-1000
24
25-75
52
860-1060
15-35
25-75
860-1060
15-35
950-1000
28
48
950-1000
22
30-60
45
860-1060
15-35
950-1000
24
25-75
48
860-1060
15-35
950-1000
24
25-75
51
860-1060
15-35
10-75
860-1060
15-35
950-1000
24
51
950-1000
24
25-75
51
860-1060
15-35
950-1000
24
25-75
51
860-1060
15-35
950-1000
24
25-75
51
860-1060
950-1000
Page: 25 of 98
3. Conducted Emission (Main Terminals)
3.1. Test Specification
According to EMC Standard: EN 55022 Class B
3.2. Test Setup
3.3. Limit
Limits
Frequency
(MHz)
QP
(dBuV)
AV
(dBuV)
0.15 - 0.50
66 - 56
56 - 46
0.50 - 5.0
56
46
5.0 - 30
60
50
Note: The lower limit shall apply at the transition frequency.
Page: 26 of 98
3.4. Test Procedure
The EUT and simulators are connected to the main power through a line impedance
stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the
measuring equipment. The peripheral devices are also connected to the main power through
a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination.
(Please refers to the block diagram of the test setup and photographs.)
Both sides of A.C. line are checked for maximum conducted interference. In order to find the
maximum emission, the relative positions of equipment and all of the interface cables must
be changed on conducted measurement.
Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using
a receiver bandwidth of 9kHz.
3.5. Deviation from Test Standard
No deviation.
Page: 27 of 98
3.6. Test Result
Engineer : Robin
Site : SR-1 (Conducted Emission)
Time : 2007/09/14 - 04:22
Limit : EN55022_B_00M_QP
Margin : 10
EUT : Notebook P.C.
Probe : ENV216 - Line1
Power : AC 230V/50Hz
Note : Mode 1: LCD (1280x800@59Hz) + VGA (1280x800@59Hz)
Page: 28 of 98
Engineer : Robin
Time : 2007/09/14 - 04:25
Margin : 0
EUT : Notebook P.C.
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.151
10.267
42.100
52.367
-13.604
65.971
QUASIPEAK
2
0.166
10.136
29.500
39.636
-25.907
65.543
QUASIPEAK
3
0.198
9.539
34.500
44.038
-20.591
64.629
QUASIPEAK
4
7.502
9.824
27.900
37.724
-22.276
60.000
QUASIPEAK
5
11.486
9.914
28.300
38.214
-21.786
60.000
QUASIPEAK
6
19.474
10.144
29.700
39.844
-20.156
60.000
QUASIPEAK
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 29 of 98
Engineer : Robin
Time : 2007/09/14 - 04:25
Limit : EN55022_B_00M_AV
Margin : 0
EUT : Notebook P.C.
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.151
10.267
23.800
34.067
-21.904
55.971
AVERAGE
2
0.166
10.136
15.300
25.436
-30.107
55.543
AVERAGE
0.198
9.539
28.600
38.138
-16.491
54.629
AVERAGE
4
7.502
9.824
18.900
28.724
-21.276
50.000
AVERAGE
5
11.486
9.914
17.700
27.614
-22.386
50.000
AVERAGE
6
19.474
10.144
19.600
29.744
-20.256
50.000
AVERAGE
3
*
Note:
Page: 30 of 98
Engineer : Robin
Time : 2007/09/14 - 04:26
Margin : 6
EUT : Notebook P.C.
Page: 31 of 98
Engineer : Robin
Time : 2007/09/14 - 04:29
Margin : 0
EUT : Notebook P.C.
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.151
9.765
41.800
51.565
-14.406
65.971
QUASIPEAK
2
0.202
9.536
32.900
42.436
-22.078
64.514
QUASIPEAK
3
2.778
9.767
25.800
35.567
-20.433
56.000
QUASIPEAK
4
8.790
9.847
29.900
39.747
-20.253
60.000
QUASIPEAK
5
11.362
9.998
27.100
37.098
-22.902
60.000
QUASIPEAK
6
19.270
10.052
28.300
38.352
-21.648
60.000
QUASIPEAK
Note:
Page: 32 of 98
Engineer : Robin
Time : 2007/09/14 - 04:29
Limit : EN55022_B_00M_AV
Margin : 0
EUT : Notebook P.C.
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.151
9.765
24.100
33.865
-22.106
55.971
AVERAGE
0.202
9.536
29.400
38.936
-15.578
54.514
AVERAGE
3
2.778
9.767
10.400
20.167
-25.833
46.000
AVERAGE
4
8.790
9.847
19.200
29.047
-20.953
50.000
AVERAGE
5
11.362
9.998
17.900
27.898
-22.102
50.000
AVERAGE
6
19.270
10.052
19.100
29.152
-20.848
50.000
AVERAGE
2
*
Note:
Page: 33 of 98
3.7. Test Photograph
Test Mode
Description
Test Mode
Description
: Mode 1: LCD (1280x800@59Hz) + VGA (1280x800@59Hz)
: Front View of Conducted Test
: Back View of Conducted Test
Page: 34 of 98
4. Conducted Emissions (Telecommunication Ports)
4.2. Test Setup
4.3. Limit
Limits
Frequency
(MHz)
Voltage
Current
QP
(dBuV)
AV
(dBuV)
QP
(dBuA)
AV
(dBuA)
0.15 - 0.50
84 - 74
74 - 64
40 - 30
30 - 20
0.50 - 30
74
64
30
20
Remarks:
The limit decreases linearly with the logarithm of the frequency in the range
0.15 MHz~0.50 MHz.
Page: 35 of 98
4.4. Test Procedure
Telecommunication Port:
The mains voltage shall be supplied to the EUT via the LISN when the measurement of
telecommunication port is performed. The common mode disturbances at the
telecommunication port shall be connected to the ISN, which is 150 ohm impedance.
Both alternative cables are tested related to the LCL requested. The measurement range is
from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz.
The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is
used for alternative one.
No deviation.
Page: 36 of 98
4.6. Test Result
Engineer : Robin
Time : 2007/09/20 - 11:11
Limit : ISN_VOLTAGE_<10DB_B_00M_QP
Margin : 6
EUT : Notebook P.C.
Probe : ISN - Line1
for LAN (10Mbps)
Page: 37 of 98
Engineer : Robin
Time : 2007/09/20 - 11:11
Limit : ISN_VOLTAGE_<10DB_B_00M_QP
Margin : 0
EUT : Notebook P.C.
Probe : ISN - Line1
for LAN (10Mbps)
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.238
9.477
52.500
61.977
-19.509
81.486
QUASIPEAK
2
0.450
9.463
56.300
65.763
-9.666
75.429
QUASIPEAK
3
0.594
9.460
56.400
65.860
-8.140
74.000
QUASIPEAK
4
0.738
9.447
52.700
62.147
-11.853
74.000
QUASIPEAK
5
*
1.050
9.421
56.800
66.221
-7.779
74.000
QUASIPEAK
6
*
10.000
9.529
66.000
75.529
-8.471
84.000
QUASIPEAK
Note:
Page: 38 of 98
Engineer : Robin
Time : 2007/09/20 - 11:12
Limit : ISN_VOLTAGE_<10DB_B_00M_AV
Margin : 0
EUT : Notebook P.C.
Probe : ISN - Line1
for LAN (10Mbps)
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.238
9.477
38.400
47.877
-23.609
71.486
AVERAGE
2
0.450
9.463
39.000
48.463
-16.966
65.429
AVERAGE
0.594
9.460
47.100
56.560
-7.440
64.000
AVERAGE
4
0.738
9.447
37.000
46.447
-17.553
64.000
AVERAGE
5
1.050
9.421
40.400
49.821
-14.179
64.000
AVERAGE
10.000
9.529
47.800
57.329
-16.671
74.000
AVERAGE
3
6
*
*
Note:
Page: 39 of 98
Engineer : Robin
Time : 2007/09/19 - 18:51
Limit : ISN_Voltage_B_00M_QP
Margin : 6
EUT : Notebook P.C.
Probe : ISN - Line1
for LAN (100Mbps)
Page: 40 of 98
Engineer : Robin
Time : 2007/09/19 - 18:54
Margin : 0
EUT : Notebook P.C.
Probe : ISN - Line1
for LAN (100Mbps)
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.238
9.477
52.000
61.477
-20.009
81.486
QUASIPEAK
2
0.298
9.476
52.300
61.776
-17.995
79.771
QUASIPEAK
3
0.454
9.463
56.500
65.963
-9.351
75.314
QUASIPEAK
0.598
9.460
56.500
65.960
-8.040
74.000
QUASIPEAK
5
0.722
9.447
53.800
63.247
-10.753
74.000
QUASIPEAK
6
1.050
9.421
56.500
65.921
-8.079
74.000
QUASIPEAK
4
*
Note:
Page: 41 of 98
Engineer : Robin
Time : 2007/09/19 - 18:54
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook P.C.
Probe : ISN - Line1
for LAN (100Mbps)
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.238
9.477
37.700
47.177
-24.309
71.486
AVERAGE
2
0.298
9.476
36.600
46.076
-23.695
69.771
AVERAGE
3
0.454
9.463
40.200
49.663
-15.651
65.314
AVERAGE
0.598
9.460
45.800
55.260
-8.740
64.000
AVERAGE
5
0.722
9.447
42.000
51.447
-12.553
64.000
AVERAGE
6
1.050
9.421
41.600
51.021
-12.979
64.000
AVERAGE
4
*
Note:
Page: 42 of 98
Engineer : Robin
Time : 2007/09/20 - 09:33
Margin : 6
EUT : Notebook P.C.
Probe : ISN - Line1
for Telecom
Page: 43 of 98
Engineer : Robin
Time : 2007/09/20 - 09:36
Margin : 0
EUT : Notebook P.C.
Probe : ISN - Line1
for Telecom
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.314
9.476
39.600
49.076
-30.238
79.314
QUASIPEAK
2.122
9.410
53.600
63.010
-10.990
74.000
QUASIPEAK
3
5.166
9.460
41.600
51.060
-22.940
74.000
QUASIPEAK
4
8.486
9.504
34.100
43.604
-30.396
74.000
QUASIPEAK
5
13.446
9.584
36.700
46.284
-27.716
74.000
QUASIPEAK
6
17.420
9.643
40.000
49.643
-24.357
74.000
QUASIPEAK
2
*
Note:
Page: 44 of 98
Engineer : Robin
Time : 2007/09/20 - 09:36
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook P.C.
Probe : ISN - Line1
for Telecom
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.314
9.476
25.500
34.976
-34.338
69.314
AVERAGE
2.122
9.410
41.400
50.810
-13.190
64.000
AVERAGE
3
5.166
9.460
35.500
44.960
-19.040
64.000
AVERAGE
4
8.486
9.504
27.500
37.004
-26.996
64.000
AVERAGE
5
13.446
9.584
30.000
39.584
-24.416
64.000
AVERAGE
6
17.420
9.643
32.400
42.043
-21.957
64.000
AVERAGE
2
*
Note:
Page: 45 of 98
Test Mode: Mode 1: LCD (1280x800@59Hz) + VGA (1280x800@59Hz)
Description: Front View of Conducted Test for LAN (10&100Mbps)
Description: Back View of Conducted Test for LAN (10&100Mbps)
Page: 46 of 98
Description: Front View of Conducted Test for Telecom
Description: Back View of Conducted Test for Telecom
Page: 47 of 98
5. Radiated Emission
5.2. Test Setup
5.3. Limit
Limits
Frequency
(MHz)
Distance (m)
dBuV/m
30 - 230
10
30
230 - 1000
10
37
Remark:
1. The tighter limit shall apply at the edge between two frequency bands.
2. Distance refers to the distance in meters between the measuring instrument antenna
and the closed point of any part of the device or system.
Page: 48 of 98
5.4. Test Procedure
The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The
turn table can rotate 360 degrees to determine the position of the maximum emission level.
The EUT was positioned such that the distance from antenna to the EUT was 10 meters.
The antenna can move up and down between 1 meter and 4 meters to find out the maximum
emission level.
Both horizontal and vertical polarization of the antenna are set on measurement. In order to
find the maximum emission, all of the interface cables must be manipulated on radiated
measurement.
Radiated emissions were invested over the frequency range from 30MHz to1GHz using a
receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10
meters.
No deviation.
Page: 49 of 98
5.6. Test Result
Engineer : Robin
Site : AC-1(10m Radiated Emission)
Time : 2007/09/17 - 09:14
Margin : 0
EUT : Notebook P.C.
Probe : CBL6112B_2931(30-2000MHz) - HORIZONTAL
Frequency
(MHz)
Correct Factor Reading Level Measure Level
(dB)
(dBuV)
(dBuV/m)
Margin
Limit
(dB)
(dBuV/m)
Detector Type
Ant Pos
Table Pos
(cm)
(deg)
1
104.775
-11.697
28.600
16.903 -13.097
30.000 QUASIPEAK
301.000
69.200
2
137.250
-11.290
25.400
14.111 -15.889
30.000 QUASIPEAK
400.000
118.300
3
206.550
-13.222
37.800
24.578
-5.422
30.000 QUASIPEAK
400.000
358.200
4
313.625
-7.782
28.600
20.818 -16.182
37.000 QUASIPEAK
400.000
337.400
5
482.075
-3.087
33.200
30.112
-6.888
37.000 QUASIPEAK
226.500
92.000
662.525
-0.923
35.200
34.277
-2.723
37.000 QUASIPEAK
400.000
151.600
6
*
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or
average measurements as necessary.
Page: 50 of 98
Engineer : Robin
Site : AC-1(10m Radiated Emission)
Time : 2007/09/17 - 09:14
Margin : 0
EUT : Notebook P.C.
Probe : CBL6112B_2933(30-2000MHz) - VERTICAL
Frequency
(MHz)
1
*
Correct Factor Reading Level Measure Level
(dB)
(dBuV)
(dBuV/m)
Margin
Limit
(dB)
(dBuV/m)
Detector Type
Ant Pos
Table Pos
(cm)
(deg)
39.475
-9.298
34.200
24.903
-5.097
30.000 QUASIPEAK
100.000
208.000
2
206.625
-11.802
33.600
21.798
-8.202
30.000 QUASIPEAK
100.000
149.400
3
240.887
-9.433
35.600
26.167 -10.833
37.000 QUASIPEAK
100.000
264.700
4
480.050
-1.777
31.900
30.123
-6.877
37.000 QUASIPEAK
100.000
337.300
5
662.525
0.739
26.000
26.739 -10.261
37.000 QUASIPEAK
221.100
179.500
6
720.850
1.473
25.600
27.073
37.000 QUASIPEAK
100.000
87.200
-9.927
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or
average measurements as necessary.
Page: 51 of 98
Test Mode
Description
Test Mode
Description
: Front View of Radiated Emission Test
: Back View of Radiated Emission Test
Page: 52 of 98
6. Harmonic Current Emission
According to EMC Standard: EN 61000-3-2
6.2. Test Setup
6.3. Limit
(a) Limits of Class A Harmonics Currents
Harmonics
Maximum Permissible
Harmonics
Maximum Permissible
Order
harmonic current
Order
harmonic current
n
A
n
A
Odd harmonics
Even harmonics
3
2.30
2
1.08
5
1.14
4
0.43
7
0.77
6
0.30
9
0.40
8 ≤ n ≤ 40
0.23 * 8/n
11
0.33
13
0.21
15 ≤ n ≤ 39
0.15 * 15/n
Page: 53 of 98
(b) Limits of Class B Harmonics Currents
For Class B equipment, the harmonic of the input current shall not exceed the maximum
permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.
(c) Limits of Class C Harmonics Currents
Harmonics Order
Maximum Permissible harmonic current
Expressed as a percentage of the input
current at the fundamental frequency
n
％
2
2
3
30．λ
5
10
7
7
9
5
11 ≤ n ≤ 39
＊
3
(odd harmonics only)
＊λ is the circuit power factor
(d) Limits of Class D Harmonics Currents
Harmonics Order
Maximum Permissible
Maximum Permissible
harmonic current per watt
harmonic current
n
mA/W
A
3
3.4
2.30
5
1.9
1.14
7
1.0
0.77
9
0.5
0.40
11
0.35
0.33
3.85/n
See limit of Class A
11 ≤ n ≤ 39
(odd harmonics only)
Page: 54 of 98
6.4. Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
No deviation.
Page: 55 of 98
6.6. Test Result
Product
Notebook P.C.
Test Item
Power Harmonics
Test Mode
Date of Test
2007/09/21
Test Site
Test Result: Pass
SR-1
Source qualification: Normal
0.9
300
0.6
200
0.3
100
0.0
0
-0.3
-100
-0.6
-200
-0.9
-300
European Limits
Current RMS(Amps)
Harmonics and Class D limit line
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
4
Test result: Pass
8
12
16 20 24
Harmonic #
28
32
Worst harmonic was #0 with 0.00% of the limit.
Page: 56 of 98
36
40
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
Test Result: Pass
Source qualification: Normal
THC(A): 0.00
I-THD(%): 0.00
POHC(A): 0.000
POHC Limit(A): 0.000
Highest parameter values during test:
V_RMS (Volts): 231.28
Frequency(Hz): 50.00
I_Peak (Amps): 0.911
I_RMS (Amps): 0.364
I_Fund (Amps): 0.333
Crest Factor:
2.507
Power (Watts): 73.0
Power Factor: 0.869
Harm# Harms(avg) 100%Limit %of Limit
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
0.004
0.140
0.002
0.016
0.001
0.009
0.001
0.004
0.001
0.002
0.001
0.002
0.001
0.002
0.001
0.002
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
Harms(max) 150%Limit %of Limit
Status
0.248
0.0
0.143
0.372
0.00
Pass
0.139
0.0
0.017
0.208
0.00
Pass
0.073
0.0
0.010
0.110
0.00
Pass
0.037
0.0
0.005
0.055
0.00
Pass
0.026
0.0
0.003
0.038
0.00
Pass
0.022
0.0
0.002
0.032
0.00
Pass
0.019
0.0
0.002
0.028
0.00
Pass
0.017
0.0
0.003
0.025
0.00
Pass
0.015
0.0
0.001
0.022
0.00
Pass
0.013
0.0
0.001
0.020
0.00
Pass
0.012
0.0
0.002
0.018
0.00
Pass
0.011
0.0
0.001
0.017
0.00
Pass
0.010
0.0
0.001
0.016
0.00
Pass
0.010
0.0
0.001
0.015
0.00
Pass
0.009
0.0
0.001
0.014
0.00
Pass
0.008
0.0
0.001
0.013
0.00
Pass
0.008
0.0
0.001
0.012
0.00
Pass
0.008
0.0
0.001
0.011
0.00
Pass
0.007
0.0
0.001
0.011
0.00
Pass
1. Dynamic limits were applied for this test. The highest harmonics values in the above table may
not occur at the same window as the maximum harmonics/limit ratio.
2. According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an
active input power >75W. Others the result should be pass.
Page: 57 of 98
Description: Power Harmonics Test Setup
Page: 58 of 98
7. Voltage Fluctuation and Flicker
According to EMC Standard: EN 61000-3-3
7.2. Test Setup
7.3. Limit
The following limits apply:
－ the value of Pst shall not be greater than 1.0;
－ the value of Plt shall not be greater than 0.65;
－ the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500
ms;
－ the relative steady-state voltage change, dc, shall not exceed 3.3 ％;
－ the maximum relative voltage change, dmax, shall not exceed;
a) 4 ％ without additional conditions;
b)
6 ％ for equipment which is:
－ switched manually, or
－ switched automatically more frequently than twice per day, and also has either a
delayed restart (the delay being not less than a few tens of seconds), or manual restart,
after a power supply interruption.
Note: The cycling frequency will be further limited by the Pst and P1t limit.
For example: a dmax of 6％producing a rectangular voltage change characteristic twice per
hour will give a P1t of about 0.65.
Page: 59 of 98
c)
7 ％ for equipment which is:
－ attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment
such as mixers, garden equipment such as lawn mowers, portable tools such as
electric drills), or
－ switched on automatically, or is intended to be switched on manually, no more than
twice per day, and also has either a delayed restart (the delay being not less than a
few tens of seconds) or manual restart, after a power supply interruption.
Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.
7.4. Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
No deviation.
Page: 60 of 98
7.6. Test Result
Product
Notebook P.C.
Test Item
Voltage Fluctuation and Flicker
Test Mode
Date of Test
2007/09/20
Test Result: Pass
Test Site
SR-1
Status: Test Completed
Psti and limit line
European Limits
1.00
Pst
0.75
0.50
0.25
19:22:32
Plt
Plt and limit line
0.6
0.5
0.4
0.3
0.2
0.1
19:22:32
Parameter values recorded during the test:
Vrms at the end of test (Volt):
231.24
Highest dt (%):
0.00
Time(mS) > dt:
0.0
Highest dc (%):
0.17
Highest dmax (%):
0.00
Highest Pst (10 min. period):
0.160
Highest Plt (2 hr. period):
0.070
Test limit (%):
Test limit (mS):
Test limit (%):
Test limit (%):
Test limit:
Test limit:
Page: 61 of 98
3.30
500.0
3.30
4.00
1.000
0.650
Pass
Pass
Pass
Pass
Pass
Pass
Test Mode
Description
: Flicker Test Setup
Page: 62 of 98
8. Electrostatic Discharge
According to Standard: IEC 61000-4-2
8.2. Test Setup
8.3. Limit
Item Environmental
Units
Test Specification
Phenomena
Performance
Criteria
Enclosure Port
Electrostatic Discharge kV(Charge Voltage)
±8 Air Discharge
±4 Contact Discharge
Page: 63 of 98
B
8.4. Test Procedure
Direct application of discharges to the EUT:
Contact discharge was applied only to conductive surfaces of the EUT.
Air discharges were applied only to non-conductive surfaces of the EUT.
During the test, it was performed with single discharges. For the single discharge
time between successive single discharges will be keep longer 1 second. It was at
least ten single discharges with positive and negative at the same selected point.
The selected point, which was performed with electrostatic discharge, was marked
on the red label of the EUT.
Indirect application of discharges to the EUT:
Vertical Coupling Plane (VCP):
The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned
at a distance 0.1m from, the EUT, with the Discharge Electrode touching the
coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
Horizontal Coupling Plane (HCP):
The coupling plane is placed under to the EUT. The generator shall be positioned
vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching
the coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
No deviation.
Page: 64 of 98
8.6. Test Result
Product
Notebook P.C.
Test Item
Test Mode
Date of Test
2007/09/01
Test Site
kV
Required
Criteria
Complied To
Criteria
(A,B,C)
Results
500
±8kV
B
A
Pass
500
±4kV
B
A
Pass
200
±4kV
B
A
Pass
50
±4kV
B
A
Pass
50
±4kV
B
A
Pass
50
±4kV
B
A
Pass
50
±4kV
B
A
Pass
Item
Amount of
Discharge
Voltage
Air Discharge
Contact Discharge
Indirect Discharge
(HCP)
Indirect Discharge
(VCP Front)
Indirect Discharge
(VCP Left)
Indirect Discharge
(VCP Back)
Indirect Discharge
(VCP Right)
SR-3
Note:
The testing performed is from lowest level up to the highest level as required by standard,
but only highest level is shown on the report.
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
kV.
No false alarms or other malfunctions were observed during or after the test.
Remark:
The Contact discharges were applied at least total 200 discharges at a minimum of four
test points.
Page: 65 of 98
Description: ESD Test Setup
Page: 66 of 98
9. Radiated Susceptibility
9.2. Test Setup
9.3. Limit
Item Environmental
Units
Phenomena
Test
Performance
Specification
Criteria
Enclosure Port
80-1000
Radio-Frequency
MHz
Electromagnetic Field
V/m(Un-modulated, rms) 3
Amplitude Modulated
% AM (1kHz)
Page: 67 of 98
80
A
9.4. Test Procedure
The EUT and load, which are placed on a table that is 0.8 meter above ground, are
placed with one coincident with the calibration plane such that the distance from
antenna to the EUT was 3 meters.
Both horizontal and vertical polarization of the antenna and four sides of the EUT are set
on measurement.
In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.
All the scanning conditions are as follows:
Condition of Test
Remarks
1.
Field Strength
3 V/m Level 2
2.
Radiated Signal
AM 80% Modulated with 1kHz
3.
Scanning Frequency
80MHz - 1000MHz
4
Dwell Time
3 Seconds
5.
Frequency step size
6.
The rate of Swept of Frequency
∆ f :
1%
1.5 x 10-3 decades/s
No deviation.
Page: 68 of 98
9.6. Test Result
Product
Notebook P.C.
Test Item
RF Electromagnetic Field
Test Mode
Date of Test
2007/09/14
Test Site
AC-3
Frequency
(MHz)
Position
(Angle)
Polarity
(H or V)
Field
Strength
(V/m)
Required
Criteria
Complied
To Criteria
(A,B,C)
Results
80-1000
Front
H
3
A
A
Pass
80-1000
Front
V
3
A
A
Pass
80-1000
Back
H
3
A
A
Pass
80-1000
Back
V
3
A
A
Pass
80-1000
Right
H
3
A
A
Pass
80-1000
Right
V
3
A
A
Pass
80-1000
Left
H
3
A
A
Pass
80-1000
Left
V
3
A
A
Pass
80-1000
Top
H
3
A
A
Pass
80-1000
Top
V
3
A
A
Pass
80-1000
Bottom
H
3
A
A
Pass
80-1000
Bottom
V
3
A
A
Pass
Note:
The testing performed is from lowest level up to the highest level as required by
standard, but only highest level is shown on the report.
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
There was no observable degradation in performance.
V/m
MHz.
at frequency
Page: 69 of 98
Description: RF Electromagnetic Field Test Setup
Page: 70 of 98
10. Electrical Fast Transient/Burst
10.2. Test Setup
10.3. Limit
Item Environmental
Units
Phenomena
I/O and communication ports
Fast Transients Common kV (Peak)
Mode
Tr/Th ns
Rep. Frequency kHz
Input DC Power Ports
Mode
Tr/Th ns
Rep. Frequency kHz
Input AC Power Ports
Mode
Tr/Th ns
Rep. Frequency kHz
Page: 71 of 98
Test Specification Performance
Criteria
+0.5
5/50
5
B
+0.5
5/50
5
B
+1
5/50
5
B
10.4. Test Procedure
The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on
the table, and uses a 0.1m insulation between the EUT and ground reference plane.
The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and
projected beyond the EUT by at least 0.1m on all sides.
Test on I/O and communication ports:
The EFT interference signal is through a coupling clamp device couples to the signal and
control lines of the EUT with burst noise for 1minute.
Test on power supply ports:
The EUT is connected to the power mains through a coupling device that directly couples the
EFT/B interference signal.
Each of the Line and Neutral conductors is impressed with burst noise for 1 minute.
The length of the signal and power lines between the coupling device and the EUT is 0.5m.
No deviation.
Page: 72 of 98
10.6. Test Result
Product
Notebook P.C.
Test Item
Electrical fast transient/burst
Test Mode
Date of Test
2007/09/17
Inject
Line
Polarity
Voltage
(kV)
Test Site
Inject
Time
(Second)
Inject
SR-2
Required Complied to
Method
Criteria
Criteria
Result
L
±
1kV
120
Direct
B
A
Pass
N
±
1kV
120
Direct
B
A
Pass
PE
±
1kV
120
Direct
B
A
Pass
L+N
±
1kV
120
Direct
B
A
Pass
L+PE
±
1kV
120
Direct
B
A
Pass
N+PE
±
1kV
120
Direct
B
A
Pass
L+N+PE
±
1kV
120
Direct
B
A
Pass
LAN
±
0.5kV
120
Clamp
B
A
Pass
Telecom
±
0.5kV
120
Clamp
B
A
Pass
Note:
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
kV of
.
Line
Page: 73 of 98
Description: EFT/B Test Setup for Main
Description: EFT/B Test Setup for LAN
Page: 74 of 98
Description: EFT/B Test Setup for Telecom
Page: 75 of 98
11. Surge
11.2. Test Setup
11.3. Limit
Item Environmental Phenomena Units
Criteria
Signal Ports and Telecommunication Ports(See 1) and 2) )
Surges
Tr/Th us
1.2/50 (8/20)
B
Line to Ground
kV
±1
Surges
Tr/Th us
1.2/50 (8/20)
B
Line to Ground
kV
± 0.5
AC Input and AC Output Power Ports
Surges
Tr/Th us
1.2/50 (8/20)
Line to Line
kV
±1
B
Line to Ground
kV
±2
Notes:
1) Applicable only to ports which according to the manufacturer’s may directly to outdoor
cables.
2) Where normal functioning cannot be achieved because of the impact of the CDN on the
EUT, no immunity test shall be required.
Page: 76 of 98
The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane
measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides. The length of power cord between the coupling device and the EUT shall
be 2m or less.
For Input and Output AC Power or DC Input and DC Output Power Ports:
The EUT is connected to the power mains through a coupling device that directly couples the
Surge interference signal.
The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and
the peak value of the a.c. voltage wave. (Positive and negative)
Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with
interval of 1 min.
No deviation.
Page: 77 of 98
11.6. Test Result
Product
Notebook P.C.
Test Item
Surge
Test Mode
Date of Test
2007/09/17
Inject
Polarity
Line
Angle
Test Site
Voltage
kV
Time
Interval
(Second)
SR-2
Inject
Required
Method
Criteria
Complied
to
Result
Criteria
L-N
±
0
1kV
60
Direct
B
A
Pass
L-N
±
90
1kV
60
Direct
B
A
Pass
L-N
±
180
1kV
60
Direct
B
A
Pass
L-N
±
270
1kV
60
Direct
B
A
Pass
N-PE
±
0
2kV
60
Direct
B
A
Pass
N-PE
±
90
2kV
60
Direct
B
A
Pass
N-PE
±
180
2kV
60
Direct
B
A
Pass
N-PE
±
270
2kV
60
Direct
B
A
Pass
L-PE
±
0
2kV
60
Direct
B
A
Pass
L-PE
±
90
2kV
60
Direct
B
A
Pass
L-PE
±
180
2kV
60
Direct
B
A
Pass
L-PE
±
270
2kV
60
Direct
B
A
Pass
Telecom
±
N/A
1kV
60
Direct
B
B
Pass
Note:
Line
.
kV of
Page: 78 of 98
Description: Surge Test Setup for Main
Description: Surge Test Setup for Telecom
Page: 79 of 98
12. Conducted Susceptibility
12.2. Test Setup
CDN Test
EM Clamp Test
Page: 80 of 98
12.3. Limit
Item Environmental Phenomena Units
Test
Specification
Signal Ports and Telecommunication Ports
Radio-Frequency
MHz
Continuous Conducted
V (rms,
Un-modulated)
% AM (1kHz)
Radio-Frequency
MHz
V (rms,
Un-modulated)
% AM (1kHz)
Radio-Frequency
MHz
V (rms,
Un-modulated)
% AM (1kHz)
Performance
Criteria
0.15-80
3
80
0.15-80
3
80
0.15-80
3
80
A
A
A
The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the
table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground
reference plane.
For Signal Ports and Telecommunication Ports
The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp
device couples to the signal and Telecommunication lines of the EUT.
For Input DC and AC Power Ports
The EUT is connected to the power mains through a coupling and decoupling networks for
power supply lines. And directly couples the disturbances signal into EUT.
Used CDN-M2 for two wires or CDN-M3 for three wires.
All the scanning conditions are as follows:
Condition of Test
Remarks
1.
Field Strength
130dBuV(3V) Level 2
2.
Radiated Signal
AM 80% Modulated with 1kHz
3.
Scanning Frequency
0.15MHz – 80MHz
4
Dwell Time
3 Seconds
5.
∆ f :
Frequency step size
The rate of Swept of Frequency
1%
6.
1.5 x 10-3 decades/s
Page: 81 of 98
No deviation.
Page: 82 of 98
12.6. Test Result
Product
Notebook P.C.
Test Item
Test Mode
Date of Test
2007/09/17
Test Site
Frequency
Range
Voltage
Applied
Inject
Tested Port
Method
of
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
0.15~80
130 (3V)
0.15~80
130 (3V)
SR-2
Required
Criteria
Performance
Criteria
Complied To
Result
AC IN
A
A
Pass
CDN
LAN
A
A
Pass
CDN
Telecom
A
A
Pass
EUT
Note:
dBuV(V) at
frequency
MHz.
The acceptance criteria were met, and the EUT passed the test.
Page: 83 of 98
Description: Conducted Susceptibility Test Setup for Main
Description: Conducted Susceptibility Test Setup for LAN
Page: 84 of 98
Description: Conducted Susceptibility Test Setup for Telecom
Page: 85 of 98
13. Power Frequency Magnetic Field
13.2. Test Setup
13.3. Limit
Item
Environmental
Phenomena
Enclosure Port
Power-Frequency
Magnetic Field
Units
Criteria
Hz
A/m (r.m.s.)
50
1
A
The EUT and its load are placed on a table which is 0.8 meter above a metal ground
plane measured at least 1m*1m min. The test magnetic field shall be placed at central of
the induction coil.
The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.
And the induction coil shall be rotated by 90° in order to expose the EUT to the test field with
different orientation (X, Y, Z Orientations).
No deviation.
Page: 86 of 98
13.6. Test Result
Product
Notebook P.C.
Test Item
Power frequency magnetic field
Test Mode
Date of Test
2007/09/17
Polarization
Test Site
SR-2
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
Pass
Y Orientation
50
1
A
A
Pass
Z Orientation
50
1
A
A
Pass
Note:
MHz.
frequency
dBuV(V) at
Page: 87 of 98
Test Mode
Description
: Power Frequency Magnetic Field Test Setup
Page: 88 of 98
14. Voltage Dips and Interruption
14.2. Test Setup
14.3. Limit
Item Environmental
Units
Phenomena
Voltage Dips
Voltage Interruptions
Criteria
% Reduction
30
ms
500
% Reduction
>95
ms
10
% Reduction
>95
ms
5000
Page: 89 of 98
C
B
C
The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane
measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides. The power cord shall be used the shortest power cord as specified by the
manufacturer.
For Voltage Dips/ Interruptions test:
The selection of test voltage is based on the rated power range. If the operation range is
large than 20% of lower power range, both end of specified voltage shall be tested.
Otherwise, the typical voltage specification is selected as test voltage.
The EUT is connected to the power mains through a coupling device that directly couples to
the Voltage Dips and Interruption Generator.
The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods,
for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three
voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage
and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10
seconds.
Voltage phase shifting are shall occur at 00, 450, 900, 1350, 1800, 2250, 2700, 3150 of the
voltage.
No deviation.
Page: 90 of 98
14.6. Test Result
Product
Notebook P.C.
Test Item
Voltage dips and interruption
Test Mode
Date of Test
2007/09/17
Voltage Dips and
Interruption
Reduction(%)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
Note:
Angle
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
Test Site
Test
Duration
(ms)
10
10
10
10
10
10
10
10
500
500
500
500
500
500
500
500
5000
5000
5000
5000
5000
5000
5000
5000
SR-2
Required Performance Test Result
Performance
Criteria
Criteria
Complied To
B
A
Pass
B
A
Pass
B
A
Pass
B
A
Pass
B
A
Pass
B
A
Pass
B
A
Pass
B
A
Pass
C
A
Pass
C
A
Pass
C
A
Pass
C
A
Pass
C
A
Pass
C
A
Pass
C
A
Pass
C
A
Pass
C
B
Pass
C
B
Pass
C
B
Pass
C
B
Pass
C
B
Pass
C
B
Pass
C
B
Pass
C
B
Pass
dBuV(V) at
frequency
MHz.
Page: 91 of 98
Test Mode
Description
: Voltage Dips Test Setup
Page: 92 of 98
15. Attachment
EUT Photograph
(1) EUT Photo
(2) EUT Photo
Page: 93 of 98
(3) EUT Photo
(4) EUT Photo
Page: 94 of 98
(5) EUT Photo
(6) EUT Photo
Page: 95 of 98
(7) EUT Photo
(8) EUT Photo
Page: 96 of 98
(9) EUT Photo
(10) EUT Photo
Page: 97 of 98
(11) EUT Photo
Page: 98 of 98

IT Report

Transcription

Similar documents

IT Report---960719

IT report

test report

ce emc test report

MS-7231(6410) CE IT report 950214

Chapter 2 Conducted Emission Test