MU-TEST

ATE for
The ATE game
changer
Up to 1.6Gb/s
Design Debug
Unique Performance / COT
Characterization
Hardware, Firmware,
Software: customizable!
Production
Hardware: FPGA Based.. Fully re-programmable
M-D864
M-D1632
M-5S
M-DPS10
M-10S
M-WR48
Software: MuTool
Ease
of use
M-21S
M-MiXW
From TP development, DUT debug to
production
Advanced
debug
functionalities
Standard
language
(3 days training,
few hours TP
development)
Application: Digital ICs & SoC, Imagers, memories (DDx, Flash..)
 High End Digital
 Up to 1.6Gb/s
 Processors
Image sensors
 Standalone or Embedded
 Emerging memories
 Memory controllers




System on
Chip (SOC)
Ultrafast & Powerful (Gbits memories, source synchronous, full speed APG)
All features of high end digital & SOC / mixed signal tester
FPGA based, customizable instruments to integrate specific functionalities
CAPEX cut by +2X versus competition & reduced OPEX (air cooled, footprint)