X-ray testing of CMS BPIX Phase I modules
Transcription
X-ray testing of CMS BPIX Phase I modules
Introduction Module Testing Bump-Bond testing Vcal calibration High-rate Efficiency Read-out stability tests Summary X-ray testing of CMS BPIX Phase I modules Pirmin Berger 26.08.2015 Pirmin Berger PhD Seminar August 26, 2015 1 / 13 Introduction Module Testing Bump-Bond testing Vcal calibration High-rate Efficiency Read-out stability tests Summary TABLE OF C ONTENTS 1 Introduction 2 Module Testing 3 Bump-Bond testing 4 Vcal calibration 5 High-rate Efficiency 6 Read-out stability tests 7 Summary Pirmin Berger PhD Seminar August 26, 2015 2 / 13 Introduction Module Testing Bump-Bond testing Vcal calibration High-rate Efficiency Read-out stability tests Summary T HE CMS BARREL PIXEL DETECTOR CMS Barrel now Sensor Phase I upgrade Read-out chip (x16) Module Pirmin Berger PhD Seminar August 26, 2015 3 / 13 Introduction Module Testing Bump-Bond testing Vcal calibration High-rate Efficiency Read-out stability tests Summary M ODULE T ESTING each component is tested before assembly at manufacturer or PSI assembled module is tested at ETH E LECTRICAL TESTS test of electrical properties of read-out chip ⇒ see Vittorios talk S ENSOR TEST properties of sensor X- RAY TEST connection between sensor and read-out high-rate efficiency calibration readout stability Pirmin Berger PhD Seminar August 26, 2015 4 / 13 Introduction Module Testing Bump-Bond testing Vcal calibration High-rate Efficiency Read-out stability tests Summary B UMP -B ONDS B UMP B ONDS bump-bonds connect pixel cell on sensor and pixel unit cell on read-out chip can be missing or damaged use x-rays to test modules (easier to handle than particles like protons, electrons etc.) Pirmin Berger PhD Seminar August 26, 2015 5 / 13 Introduction Module Testing Bump-Bond testing Vcal calibration High-rate Efficiency Read-out stability tests Summary X- RAY - H ITMAP x-ray hit-map shows large differences in number of hits per pixel HDI (high density interconnect), cable and other electrical components on top of the module absorb X-rays Pirmin Berger PhD Seminar August 26, 2015 6 / 13 Introduction Module Testing Bump-Bond testing Vcal calibration High-rate Efficiency Read-out stability tests Summary B UMP -B OND TESTING - H ITMAP x-ray hit rate ≈ 100 MHz/cm2 for few minutes pixels with no hits have missing/broken bump bonds (if they are electrically good) few missing bumps like shown here are still tolerable Pirmin Berger PhD Seminar August 26, 2015 7 / 13 Introduction Module Testing Bump-Bond testing Vcal calibration High-rate Efficiency Read-out stability tests Summary B UMP -B OND AND TEST- PULSES read-out can also be tested with test pulses instead of real particles voltage of test-pulses can be controlled with VCal DAC setting want to calibrate: VCal ⇔ electrons how? via pulse height information calibration of VCal is important for electrical tests to convert results or set parameters (eg. threshold) to physical units! Pirmin Berger PhD Seminar August 26, 2015 8 / 13 Introduction Module Testing Bump-Bond testing Vcal calibration High-rate Efficiency Read-out stability tests Summary V CAL CALIBRATION need to know number of electrons ⇒ flourescence spectra 4 different metal targets with different fluorescence lines fit number of electrons vs pulse height Pirmin Berger PhD Seminar August 26, 2015 9 / 13 Introduction Module Testing Bump-Bond testing Vcal calibration High-rate Efficiency Read-out stability tests Summary V CAL CALIBRATION # ROCs Vcal calibration slope 102 10 1 30 35 40 45 50 55 60 e^-/Vcal[DAC] result ≈ 47 e− /VCal we now can use test-pulses to simulate particle hits! eg. particle that creates 10,000 e− ⇒ VCal 213 Pirmin Berger PhD Seminar August 26, 2015 10 / 13 Introduction Module Testing Bump-Bond testing Vcal calibration High-rate Efficiency Read-out stability tests Summary HR E FFICIENCY ANALYSIS fiducial efficiency M2020 ROC 0 illuminate modules with X-rays 1 0.998 send test-pulses, check how many are read out 0.996 0.994 0.992 Nreadout / Nsent ⇒ efficiency! 0.99 0.988 eff at 120Mhz/cm2: 0.990613 +/- 0.000429 0.986 cubic fit: 0.999248 - 4.996976e-09 *x^3 0.984 20 40 60 Pirmin Berger 80 100 120 140 target rate layer 2: 120 MHz/cm2 ⇒ ≈ 99.3% PhD Seminar August 26, 2015 11 / 13 Introduction Module Testing Bump-Bond testing Vcal calibration High-rate Efficiency Read-out stability tests Summary R EAD - OUT STABILITY TESTS Read. Unif. over Time 150: C7 30000 25000 Hits 20000 15000 10000 5000 0 0 ×103 2000 4000 6000 8000 10000 Event several more tests to detect problems with readout eg. ≈ 30 minutes readout stability test (number of hits per time unit) at hit rates comparable to Layer 2 expected rate Pirmin Berger PhD Seminar August 26, 2015 12 / 13 Introduction Module Testing Bump-Bond testing Vcal calibration High-rate Efficiency Read-out stability tests Summary S UMMARY Reasons why X-ray tests are done: connection of sensor to read-out chip can be verified (bump bonds) efficiency can be measured test-pulses can be calibrated (Vcal calibration) various read-out problems can be detected Pirmin Berger PhD Seminar August 26, 2015 13 / 13